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Citation - WoS: 10
Citation - Scopus: 11
Improving the Laser Damage Resistance of Oxide Thin Films and Multilayers Via Tailoring Ion Beam Sputtering Parameters
(Elsevier Science Bv, 2015) Cosar, M. B.; Coşar, Batuhan Mustafa; Ozhan, A. E. S.; Aydogdu, G. H.; Coşar, Batuhan Mustafa; Computer Engineering; Computer Engineering
Ion beam sputtering is one of the widely used methods for manufacturing laser optical components due to its advantages such as uniformity, reproducibility, suitability for multilayer coatings and growth of dielectric materials with high packing densities. In this study, single Ta2O5 layers and Ta2O5/SiO2 heterostructures were deposited on optical quality glass substrates by dual ion beam sputtering. We focused on the effect of deposition conditions like substrate cleaning, assistance by 12 cm diameter ion beam source and oxygen partial pressure on the laser-induced damage threshold of Ta2O5 single layers. After-wards, the obtained information is employed to a sample design and produces a Ta2O5/SiO2 multilayer structure demonstrating low laser-induced damage without a post treatment procedure. (C) 2014 Elsevier B.V. All rights reserved.
Citation - WoS: 9
Citation - Scopus: 8
Dielectric dispersion in InSe/CdS bilayers
(Elsevier Science Bv, 2018) Qasrawi, A. F.; Shehada, Sufyan R.
In the current study, the effect of the amorphous InSe thin film substrate on the structural, optical and dielectric properties of CdS are investigated. The structural analysis of the bilayers indicated a strained growth of CdS onto InSe leading to decrease in grain size and increase in the dislocation density. The optical measurements have shown that the InSe/CdS exhibits two direct allowed transitions energy band gap values of 2.04 and 1.38 eV, in the high and low absorption regions, respectively. On the other hand, the detailed analysis of the dielectric spectra for the InSe, CdS and InSe/CdS layers has shown that the presence of the InSe substrate significantly improves the optical conduction parameters. Particularly, the Drude-Lorentz modeling for these dielectric systems revealed a drift mobility value of 329 cm(2)/V for the InSe/CdS bilayer. The deposition of the CdS onto InSe is also observed to shift the plasmon frequency of CdS from 2.49 to 0.77 GHz. The general features of the InSe/ CdS as plasmon cavities are promising as it shows its usability for production of optoelectronic devices that exhibit high performance at very high frequencies.
Citation - WoS: 11
Citation - Scopus: 11
Optical and Electrical Performance of Yb/Inse Interface
(Elsevier Sci Ltd, 2016) Alharbi, S. R.; Qasrawi, A. F.
In this study a 300 nm ytterbium transparent thin film is used as substrate to a 300 nm thick InSe thin film. The optical transmittance, reflectance and absorbance of the glass/InSe and Yb/InSe films are measured and analyzed. The optical data allowed determining the effects of the Yb layer on the energy band gap, on the dielectric and on optical conductivity spectra. The band gap of the InSe films shrunk from 2.38/139 to 1.90/1.12 eV upon Yb layer interfacing leading to a band offset of 0.48/0.27 eV. On the other hand, the modeling of the optical conductivity in accordance with the Lorentz theory revealed a free carrier scattering time, carrier density and mobility of 0.225 (fs), 3.0 x 10(19)(cm(-3)) and 2.53 cm(2)/Vs for the Yb/InSe interface, respectively. As these values seem to be promising for employing the Yb/InSe interface in thin film transistor technology, the current voltage characteristics of Yb/InSe/C Schottky diode were recorded and analyzed. The electrical analysis revealed the removal of the tunneling channels by using Yb in place of Al. In addition, the "on/off' current ratios, the Schottky barrier height and the switching voltage of the Yb/InSe/C device are found to be 18.8, 0.76/0.60 eV and 0.53 V, respectively. (C) 2015 Elsevier Ltd. All rights reserved.
Citation - WoS: 1
Citation - Scopus: 1
Characterization of the Nanosandwiched Ga₂s_{3< Interfaces as Microwave Filters and Thermally Controlled Electric Switches}
(Elsevier Gmbh, 2018) Alharbi, S. R.; Nazzal, Eman O.; Qasrawi, A. F.
In this work, an indium layer of 50 nm thicknesses is sandwiched between two 500 nm thick Ga2S3 layers. The effect of indium nansandwiching on the composition, structure, morphology, light absorbability, capacitance and reactance spectra, and temperature dependent electrical conductivity of the Ga2S3 films are investigated by means of X-ray diffraction, scanning electron microscopy, energy dispersion X-ray spectroscopy, Raman spectroscopy, visible light spectrophotometry, impedance spectroscopy and current voltage characteristics. While the nansandwiched films are observed to exhibit an amorphous nature of structure with indium content of Owing to the nucleation mechanisms that take place during the film growth, the accumulation of some unit cells in groups to form grains should be a significant reason for the existence of many different sizes of grains in the nanosand-wiched films (Alharbi and Qasrawi, 2016). 0, the Raman spectra displayed three vibrational modes at 127.7,145.0 and 274.3 cm(-1). It was also observed that the indium insertion in the structure of the Ga2S3 shrinks the energy band gap by 0.18 eV. The nanosandwiched films are observed to exhibit a semiconductor metal (SM) transition at 310 K. The SM transition is associated with thermal hysteresis that exhibited a maximum value of 16% at 352 K. This behavior of the nanosandwiched films nominate it for use as thermally controlled electric switches. In addition, the impedance spectral analysis in the range of 10-1800 MHz has shown a capacitance tunability of more than 70%. The measurements of the wave trapping property displayed a bandpass/reject filter characteristics above 1.0 GHz which allow using the Ga2S3/In/Ga2S3 thin films as microwave resonator. (C) 2017 Elsevier GmbH. All rights reserved.
Citation - WoS: 3
Citation - Scopus: 3
Optical Analysis of Ge/Mgo and Ge/Bn Thin Layers Designed for Terahertz Applications
(Elsevier Sci Ltd, 2015) Al Garni, S. E.; Qasrawi, A. F.
In this work, a 200 nm Ge thin film is used as a substrate to design Ge/MgO and Ge/BN layers. The optical dynamics in these devices are investigated by means of the reflectivity and the transmissivity measurements. Particularly, the details of the dielectric spectra and the values of the energy band gaps (E-g) are investigated. Below 350 THz, the construction of Ge/MgO and Ge/BN interfaces decreased the effective dielectric constant of Ge by 39% and by 76%, respectively. It also increased the quality factor of the Ge optical device from 150 to 1400 and to 940 at 300 THz. All the dispersive optical parameters are also evaluated. In addition, the direct/indirect E-g value of Ge which was determined as 1.15/0.72 eV is observed to shift down by a 0.13/0.42 and by a 023/0.54 eV for the Ge/MgO and Ge/BN devices, respectively. The sharp increase in the dielectric constant with decreasing frequency in the range of 353 273 THz, the dispersive optical parameters and the energy band gap attenuations of the optical structures are promising as they indicate the applicability of the Ge, Ge/MgO and Gel BN layers in terahertz sensing. The latter technology has a wide range of applications like medical and telecommunication devices. (C) 2014 Elsevier Ltd. All rights reserved.
Citation - WoS: 2
Citation - Scopus: 2
Enhancement of Photoconductive Performance of Cdse Via Yb Nanosandwiching
(Elsevier Gmbh, Urban & Fischer verlag, 2018) Qasrawi, A. F.
In this work, we have explored the effects of the ytterbium nanosandwiching on the structural and optoelectronic properties of CdSe thin films. A ytterbium layer of thickness of 200 nm was sandwiched between two layers of CdSe (1.0 mu m). The structural investigations have shown that the hexagonal structure of CdSe is deformed by 1.9% and 0.8% along the a and c - axes, respectively, by the inclusion of the Yb in the structure of CdSe. In addition, a systematic redshifts in the interference patterns of the optical transmittance and reflectance were observed. Accordingly, the optical absorption coefficient spectra of CdSe which displayed two energy gap values of 1.62 and 1.36 eV, are also redshifted. On the other hand, when exposed to blue light irradiation, the steady state and time dependent photocurrent analysis revealed a remarkable enhancement presented by a three orders of magnitude increase in the responsivity of CdSe upon Yb sandwiching. The photocurrent was observed to be limited by the saturation of the surface states and traps that causes longer relaxation constant compared to that of pure CdSe. (C) 2017 Elsevier GmbH. All rights reserved.
Citation - WoS: 21
Citation - Scopus: 21
Design and Applications of Yb/Ga_{2< Schottky Barriers}
(Ieee-inst Electrical Electronics Engineers inc, 2017) Khanfar, Hazem K.; Qasrawı, Atef Fayez Hasan; Qasrawi, Atef F.; Zakarneh, Yasmeen A.; Gasanly, N. M.; Qasrawı, Atef Fayez Hasan; Department of Electrical & Electronics Engineering; Department of Electrical & Electronics Engineering
In this paper, the Ga2Se3 crystals are used to design a Yb/Ga2Se3/C Schottky barrier. The device structure is investigated by the X-ray diffraction technique, which reveals a monoclinic-face-centered cubic interfacing type of structure. The barrier is studied by means of current (I)-voltage (V) characteristics in the dark and under light through photoexcitation from tungsten lamp and from the He-Ne laser. In addition, the impedance spectroscopy of these devices is studied in the frequency range of 10-1400 MHz. The photoexcited I-V curve analysis allowed investigating the biasing voltage, illumination power, and energy effects on the diode physical parameters, which are presented by the rectification ratio, the Schottky barrier height, the ideality factor, the series resistance, the photosensitivity, the responsivity, and the external quantum efficiency (EQE). While a maximum photosensitivity of 42 was observed for laser excitation with a wavelength of 632 nm at a reverse bias of 4.4 V, the EQE reached value of 1652% at 19.0 V. On the other hand, the ac current conduction analysis of the electrical conductivity, which was determined from the impedance spectral analysis, indicated that the ac signal processing through the Yb/Ga2Se3/C samples is due to the correlated hopping conduction through localized states of Fermi density of 3.98 x 10(19) eV(-1) cm(-3). The high-and biasing-dependent EQE% nominates the Yb/Ga2Se3/C as a tunable optoelectronic device.
Citation - WoS: 18
Citation - Scopus: 21
Engineering the Optical and Dielectric Properties of the Ga₂s_{3< Nanosandwiches Via Indium Layer Thickness}
(Springer, 2018) Nazzal, Eman O.; Qasrawi, A. F.; Alharbi, S. R.
In this study, the effect of the nanosandwiched indium slab thickness (20-200 nm) on the performance of the Ga2S3/In/Ga2S3 interfaces is explored by means of X-ray diffraction, Raman spectroscopy, and optical spectroscopy techniques. The indium slab thickness which was varied in the range of 20-200 nm is observed to enhance the visible light absorbability of the Ga2S3 by 54.6 times, engineered the energy band gap in the range of 3.7-1.4 eV and increases the dielectric constant without, significantly, altering the structure of the Ga2S3. The broad range of the band gap tunability and the increased absorbability nominate the Ga2S3 thin films for photovoltaic applications. In addition, the dielectric spectral analysis and modeling have shown that a wide variety in the plasmon resonant frequency could be established within the Ga2S3/In/Ga2S3 trilayers. The plasmon frequency engineering in the range of 0.56-2.08 GHz which is associated with drift mobility of 12.58-5.76 cm(2)/Vs and electron scattering time at femtosecond level are promising for the production of broad band high frequency microwave filters.
Citation - WoS: 7
Citation - Scopus: 7
Physical Design and Dynamical Analysis of Resonant-Antiresonant Ag/MgO/GaSe/Al Optoelectronic Microwave Devices
(Springer, 2015) Kmail, Renal R. N.; Qasrawi, A. F.
In this work, the design and optical and electrical properties of MgO/GaSe heterojunction devices are reported and discussed. The device was designed using 0.4-mu m-thick n-type GaSe as substrate for a 1.6-mu m-thick p-type MgO optoelectronic window. The device was characterized by means of ultraviolet-visible optical spectrophotometry in the wavelength region from 200 nm to 1100 nm, current-voltage (I-V) characteristics, impedance spectroscopy in the range from 1.0 MHz to 1.8 GHz, and microwave amplitude spectroscopy in the frequency range from 1.0 MHz to 3.0 GHz. Optical analysis of the MgO/GaSe heterojunction revealed enhanced absorbing ability of the GaSe below 2.90 eV with an energy bandgap shift from 2.10 eV for the GaSe substrate to 1.90 eV for the heterojunction design. On the other hand, analysis of I-V characteristics revealed a tunneling-type device conducting current by electric field-assisted tunneling of charged particles through a barrier with height of 0.81 eV and depletion region width of 670 nm and 116 nm when forward and reverse biased, respectively. Very interesting features of the device are observed when subjected to alternating current (ac) signal analysis. In particular, the device exhibited resonance-antiresonance behavior and negative capacitance characteristics near 1.0 GHz. The device quality factor was similar to 10(2). In addition, when a small ac signal of Bluetooth amplitude (0.0 dBm) was imposed between the device terminals, the power spectra of the device displayed tunable band-stop filter characteristics with maximum notch frequency of 1.6 GHz. The energy bandgap discontinuity, the resonance-antiresonance behavior, the negative capacitance features, and the tunability of the electromagnetic power spectra at microwave frequencies nominate the Ag/MgO/GaSe/Al device as a promising optoelectronic device for use in multipurpose operations at microwave frequencies.
Citation - WoS: 2
Citation - Scopus: 2
Characterization of the Mgo/Gase_{0.5< Heterojunction Designed for Visible Light Communications}
(Elsevier Sci Ltd, 2015) Qasrawi, A. F.; AlGarni, S. E.; Gasanly, N. M.
In this study an optoelectronic design is reported and characterized. The device is made of p-type MgO solved in sodium silicate binder and n-type GaSe0.5S0.5 heterojunction. It is described by means of X-ray diffraction, optical absorption and reflection in the incident light wavelength range of 190-1100 nm and by means of dark and 406 nm laser excited current (I)-voltage (V) characteristics. The optical reflectance was also measured as a function of angle of incidence of light in the range of 35-80. The structural analysis revealed no change in the existing phases of the device composers. In addition, it was observed that for pure sodium silicate and for a 67% content of MgO solved in sodium silicate binder (33%), the heterojunction exhibits a valence band shift of 0.40 and 0.70 eV, respectively. The painting of MgO improved the light absorbability significantly. On the other hand, the angle-dependent reflectance measurements on the crystal displayed a Brewster condition at 70. The MgO/ GaSe0.5S0.5 heterojunction exhibited no Brewster condition when irradiated from the MgO side. Moreover, for the crystal and the MgO/ GaSe0.5S0.5 heterojunction, the dielectric spectral analysis revealed a pronounced increase in the quality factor of the device. The I-V characteristics of the device revealed typical optoelectronic properties with high photo-response that could amplify the dark current 24 times when irradiated with 5 mW power laser light. The structural, optical, dielectric and electrical features of the MgO/GaSe0.5S0.5 heterojunction nominate it for use in visible light communication technology. (C) 2015 Elsevier Ltd. All rights reserved.

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