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Now showing 1 - 9 of 9
  • Article
    Citation - WoS: 10
    Citation - Scopus: 11
    Dispersive Optical Constants of Thermally Deposited Agin5s8< Thin Films
    (Elsevier Science Sa, 2008) Qasrawi, A. F.
    Agln(5)S(8) thin films were obtained by the thermal evaporation of Agln(5)S(8) crystals onto ultrasonically cleaned glass substrates. The films are found to exhibit polycrystalline cubic structure. The calculated lattice parameter of the unit cell (a) is 10.78 angstrom. The transmittance data of the as grown films which was recorded at 300 K in the incidence wavelength (lambda) range of 320-1000 nm are used to calculate the refractive, n(lambda). The transmittance and reflectance data are also used to calculate the absorption coefficient of the as grown Agln5S8 thin films. The fundamental absorption edge is found to be corresponding to a direct allowed transitions energy band gap. This band-to-band transition energy is found to be 1.78 eV and it is consistent with that reported for Agln(5)S(8) single crystals. (c) 2007 Elsevier B.V. All rights reserved.
  • Article
    Citation - WoS: 5
    Citation - Scopus: 6
    Photoelectronic and Electrical Properties of Tl2ingas4< Layered Crystals
    (Pergamon-elsevier Science Ltd, 2007) Qasrawi, A. F.; Gasanly, N. M.
    Tl2InGaS4 layered crystals are studied through the dark electrical conductivity, space charge limited current and illumination- and temperature-dependent photoconductivity measurements in the temperature regions of 220-350 K, 300-400 K and 200-350 K, respectively. The space charge limited current measurements revealed the existence of a single discrete trapping level located at 0.44 eV. The dark electrical conductivity showed the existence of two energy levels of 0.32 eV and 0.60 eV being dominant above and below 300 K, respectively. The photoconductivity measurements reflected the existence of two other energy levels located at 0.28 eV and 0.19 eV at high and low temperatures, respectively. The photocurrent is observed to increase with increasing temperature up to a maximum temperature of 330 K. The illumination dependence of photoconductivity is found to exhibit supralinear recombination in all the studied temperature ranges. The change in recombination mechanism is attributed to exchange in the behavior of sensitizing and recombination centers. (C) 2006 Elsevier Ltd. All rights reserved.
  • Article
    Citation - WoS: 5
    Citation - Scopus: 5
    Optical Properties of Tlgaxin1-x< Mixed Crystals (0.5 ≤ x ≤ 1) by Spectroscopic Ellipsometry, Transmission, and Reflection
    (Taylor & Francis Ltd, 2014) Isik, M.; Delice, S.; Gasanly, N. M.
    The layered semiconducting TlGaxIn1-xSe2-mixed crystals (0.5 <= x <= 1) were studied for the first time by spectroscopic ellipsometry measurements in the 1.2-6.2 eV spectral range at room temperature. The spectral dependence of the components of the complex dielectric function, refractive index, and extinction coefficient were revealed using an optical model. The interband transition energies in the studied samples were found from the analysis of the second-energy derivative spectra of the complex dielectric function. The effect of the isomorphic cation substitution (indium for gallium) on critical point energies in TlGaxIn1-xSe2 crystals was established. Moreover, the absorption edge of TlGaxIn1-xSe2 crystals have been studied through the transmission and reflection measurements in the wavelength range of 500-1100 nm. The analysis of absorption data revealed the presence of both optical indirect and direct transitions. It was found that the energy band gaps decrease with the increase of indium content in the studied crystals.
  • Article
    Influence of Photonic Excitations on the Electrical Parameters of Tlins2 Crystals
    (Wiley-v C H verlag Gmbh, 2010) Qasrawi, A. F.; Gasanly, N. M.
    The photo-excitation effect on the current transport mechanism in TlInS2 crystals has been studied by means of dark and illuminated conductivity measurements. The temperature-dependent electrical conductivity analysis in the temperature region of 110-340 K revealed the domination of the thermionic emission and the thermally assisted variable range hopping (VRH) of charge carriers above and below 160 K, respectively. Above 160 K, the conductivity activation energies in the dark are found to be 0.28 and 0.15 eV in the temperature regions of 340-240 K and 230-160 K, respectively. In the temperature region of 110-150 K, the dark variable range hopping analysis revealed a density of localized states of 1.99x 10(22) cm(-3)eV(-1), an average hopping distance of 0.53 nm and an average hopping energy of 79.65 meV. When the sample was photo-excited, the values of the conductivity activation energies, the density of localized states near the Fermi level and the average hopping energy were observed to decrease sharply with increasing illumination intensity. On the other hand, the average hopping distance increased with rising illumination intensity. Such behaviours were attributed to the Fermi level shift and/or trap density reduction by electron-hole recombination. (C) 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
  • Article
    Citation - WoS: 2
    Citation - Scopus: 1
    Hydrogen Implantation Effects on the Electrical and Optical Properties of Inse Thin Films
    (Tubitak Scientific & Technological Research Council Turkey, 2012) Qasrawi, Atef Fayez; Ilaiwi, Khaled Faysal; Polimeni, Antonio
    The effects of hydrogen ion implantation on the structural, electrical and optical properties of amorphous InSe thin films have been investigated. X-ray diffraction analysis revealed no change in the structure of the films. An implantation of 7.3 x 10(18) ions/cm(2) decreased the electrical conductivity by three orders of magnitude at 300 K. Similarly, the conductivity activation energy, which was calculated in the temperature range of 300-420 K, decreased from 210 to 78 meV by H-ion implantation. The optical measurements showed that the direct allowed transitions energy band gap of amorphous InSe films has decreased from 1.50 to 0.97 eV by implantation. Furthermore, significant decreases in the dispersion and oscillator energy, static refractive index and static dielectric constants are also observed by hydrogen implantation.
  • Article
    Citation - WoS: 17
    Citation - Scopus: 17
    Trap Distribution in Tlins2 Layered Crystals From Thermally Stimulated Current Measurements
    (Korean Physical Soc, 2008) Isik, M.; Goksen, K.; Gasanly, N. M.; Ozkan, H.
    We have carried out thermally stimulated current (TSC) measurements with the current flowing along the layer on as-grown TlInS2 layered single crystals in the low temperature range 10 - 110 K with different heating rates of 0.1 - 1.5 K/s. Experimental evidence was found for the presence of two shallow electron trapping centers with activation energies of 12 and 14 meV. Their capture cross sections have been determined as 2.2 x 10(-23) and 7.1 x 10(-25) cm(2), respectively. It was concluded that retrapping in these centers is negligible, which was confirmed by the good agreement between the experimental results and the theoretical predictions of the model that assumed slow retrapping. An exponential distribution of electron traps was revealed from the analysis of the TSC data obtained at different light excitation temperatures. This experimental technique provided a value of 27 meV/decade for the trap distribution. The parameters of the monoclinic unit cell were determined by studying the X-ray powder diffraction.
  • Article
    Citation - WoS: 2
    Citation - Scopus: 2
    Thermoluminescence Characteristics of Tl4gain3< Layered Single Crystals
    (Taylor & Francis Ltd, 2014) Delice, S.; Isik, M.; Gasanly, N. M.
    The properties of trapping centres in - as grown - Tl4GaIn3S8 layered single crystals were investigated in the temperature range of 10-300K using thermoluminescence (TL) measurements. TL curve was analysed to characterize the defects responsible for the observed peaks. Thermal activation energies of the trapping centres were determined using various methods: curve fitting, initial rise and peak shape methods. The results indicated that the peak observed in the low-temperature region composed of many overlapped peaks corresponding to distributed trapping centres in the crystal structure. The apparent thermal energies of the distributed traps were observed to be shifted from similar to 12 to similar to 125meV by increasing the illumination temperature from 10 to 36K. The analysis revealed that the first-order kinetics (slow retrapping) obeys for deeper level located at 292meV.
  • Article
    Citation - WoS: 9
    Citation - Scopus: 9
    Determination of optical parameters of Ga0.75In0.25Se layered crystals
    (Wiley-v C H verlag Gmbh, 2012) Isik, M.; Gasanly, N. M.
    The optical properties of the Ga0.75In0.25Se crystals have been investigated by means of transmission and reflection measurements in the wavelength range of 380-1100 nm. The analysis of the results performed at room temperature revealed the presence of optical indirect transtions with band gap energy of 1.89 eV. The variation of the band gap energy as a function of temperature was also studied in the temperature range of 10-300 K. The rate of change of band gap energy (? = 6.2 x 10(4) eV/K) and absolute zero value of the band gap (Egi(0) = 2.01 eV) were reported. The wavelength dependence of the refractive index was analyzed using Wemple and DiDomenico, Sellmeier and Cauchy models to find the oscillator energy, dispersion energy, oscillator strength and zero-frequency refractive index values. (C) 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
  • Article
    Citation - WoS: 10
    Citation - Scopus: 10
    Energy Band Gap and Oscillator Parameters of Ga4se3< Single Crystals
    (Pergamon-elsevier Science Ltd, 2007) Qasrawi, A. F.; Gasanly, N. M.
    The optical properties of the Bridgman method grown Ga4Se3S crystals have been investigated by means of room temperature, transmittance and reflectance spectral analysis. The optical data have revealed an indirect allowed transition band gap of 2.08 eV. The room temperature refractive index, which was calculated from the reflectance and transmittance data, allowed the identification of the dispersion and oscillator energies, static dielectric constant and static refractive index as 21.08 and 3.85 eV, 6.48 and 2.55, respectively. (C) 2007 Elsevier Ltd. All rights reserved.