Optical Properties of Tlga<sub>x</Sub>in<sub>1-x< Mixed Crystals (0.5 ≤ <i>x</I> ≤ 1) by Spectroscopic Ellipsometry, Transmission, and Reflection
No Thumbnail Available
Date
2014
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Taylor & Francis Ltd
Open Access Color
OpenAIRE Downloads
OpenAIRE Views
Abstract
The layered semiconducting TlGaxIn1-xSe2-mixed crystals (0.5 <= x <= 1) were studied for the first time by spectroscopic ellipsometry measurements in the 1.2-6.2 eV spectral range at room temperature. The spectral dependence of the components of the complex dielectric function, refractive index, and extinction coefficient were revealed using an optical model. The interband transition energies in the studied samples were found from the analysis of the second-energy derivative spectra of the complex dielectric function. The effect of the isomorphic cation substitution (indium for gallium) on critical point energies in TlGaxIn1-xSe2 crystals was established. Moreover, the absorption edge of TlGaxIn1-xSe2 crystals have been studied through the transmission and reflection measurements in the wavelength range of 500-1100 nm. The analysis of absorption data revealed the presence of both optical indirect and direct transitions. It was found that the energy band gaps decrease with the increase of indium content in the studied crystals.
Description
Gasanly, Nizami/0000-0002-3199-6686; Delice, Serdar/0000-0001-5409-6528; Gasanly, Nizami/0000-0002-3199-6686
Keywords
semiconductors, optical properties, ellipsometry
Turkish CoHE Thesis Center URL
Fields of Science
Citation
WoS Q
Q3
Scopus Q
Q3
Source
Volume
94
Issue
23
Start Page
2623
End Page
2632