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Citation - WoS: 5
Citation - Scopus: 5
Optical Properties of Tlga_xin_{1-x< Mixed Crystals (0.5 ≤ x ≤ 1) by Spectroscopic Ellipsometry, Transmission, and Reflection}
(Taylor & Francis Ltd, 2014) Isik, M.; Delice, S.; Gasanly, N. M.
The layered semiconducting TlGaxIn1-xSe2-mixed crystals (0.5 <= x <= 1) were studied for the first time by spectroscopic ellipsometry measurements in the 1.2-6.2 eV spectral range at room temperature. The spectral dependence of the components of the complex dielectric function, refractive index, and extinction coefficient were revealed using an optical model. The interband transition energies in the studied samples were found from the analysis of the second-energy derivative spectra of the complex dielectric function. The effect of the isomorphic cation substitution (indium for gallium) on critical point energies in TlGaxIn1-xSe2 crystals was established. Moreover, the absorption edge of TlGaxIn1-xSe2 crystals have been studied through the transmission and reflection measurements in the wavelength range of 500-1100 nm. The analysis of absorption data revealed the presence of both optical indirect and direct transitions. It was found that the energy band gaps decrease with the increase of indium content in the studied crystals.
Citation - WoS: 14
Citation - Scopus: 15
Structural and Optical Properties of Ga₂se_{3< Crystals by Spectroscopic Ellipsometry}
(Springer, 2019) Guler, I.; Isik, M.; Gasanly, N. M.; Gasanova, L. G.; Babayeva, R. F.
Optical and crystalline structure properties of Ga2Se3 crystals were analyzed utilizing ellipsometry and x-ray diffraction (XRD) experiments, respectively. Components of the complex dielectric function (epsilon=epsilon(1)+i epsilon(2)) and refractive index (N=n+ik) of Ga2Se3 crystals were spectrally plotted from ellipsometric measurements conducted from 1.2eV to 6.2eV at 300K. From the analyses of second-energy derivatives of epsilon(1) and epsilon(2), interband transition energies (critical points) were determined. Absorption coefficient-photon energy dependency allowed us to achieve a band gap energy of 2.02eV. Wemple and DiDomenico single effective oscillator and Spitzer-Fan models were accomplished and various optical parameters of the crystal were reported in the present work.
Citation - WoS: 1
Citation - Scopus: 1
Structural and Optical Properties of Thermally Evaporated Ga-In Thin Films
(World Scientific Publ Co Pte Ltd, 2014) Isik, Mehmet; Gullu, Hasan Huseyin
In this paper, structural and optical properties of Ga-In-Se (GIS) thin films deposited by thermal evaporation technique have been investigated. The effect of annealing was also studied for samples annealed at temperatures between 300 degrees C and 500 degrees C. X-ray diffraction, energy dispersive X-ray analysis and scanning electron microscopy have been used for structural characterization. It was reported that increase of annealing temperature results with better crystallization and chemical composition of the films were almost same. Optical properties of the films were studied by transmission measurements in the wavelength range of 320-1100 nm. The direct bandgap transitions with energies in the range of 1.52 eV and 1.65 eV were revealed for the investigated GIS films. Photon energy dependence of absorption coefficient showed that there exist three distinct transition regions for films annealed at 400 degrees C and 500 degrees C. The quasicubic model was applied for these transitions to calculate crystal-field splitting and spin-orbit splitting energy values.
Citation - WoS: 10
Citation - Scopus: 11
Dispersive Optical Constants of Thermally Deposited Agin₅s_{8< Thin Films}
(Elsevier Science Sa, 2008) Qasrawi, A. F.
Agln(5)S(8) thin films were obtained by the thermal evaporation of Agln(5)S(8) crystals onto ultrasonically cleaned glass substrates. The films are found to exhibit polycrystalline cubic structure. The calculated lattice parameter of the unit cell (a) is 10.78 angstrom. The transmittance data of the as grown films which was recorded at 300 K in the incidence wavelength (lambda) range of 320-1000 nm are used to calculate the refractive, n(lambda). The transmittance and reflectance data are also used to calculate the absorption coefficient of the as grown Agln5S8 thin films. The fundamental absorption edge is found to be corresponding to a direct allowed transitions energy band gap. This band-to-band transition energy is found to be 1.78 eV and it is consistent with that reported for Agln(5)S(8) single crystals. (c) 2007 Elsevier B.V. All rights reserved.
Citation - WoS: 5
Citation - Scopus: 5
Growth and Temperature Tuned Band Gap Characteristics of Nabi(moo₄)_{2< Single Crystal}
(Iop Publishing Ltd, 2023) Isik, M.; Guler, I; Gasanly, N. M.
Structural and optical properties of double sodium-bismuth molybdate NaBi(MoO4)(2) semiconductor compound was investigated by x-ray diffraction, Raman and transmission experiments. From the x-ray diffraction experiments, the crystal that has tetragonal structure was obtained. Vibrational modes of the crystal were found from the Raman experiments. Transmission experiments were performed in the temperature range of 10-300 K. Derivative spectroscopy analysis and absorption spectrum analysis were performed to get information about the change in band gap energy of the crystal with temperature. It was observed that the band gap energies of the crystal at different temperatures obtained from these techniques are well consisted with each other. By the help of absorption spectrum which was obtained from transmission measurements performed at varying temperatures, absolute zero value of the band gap and average phonon energy as 3.03 +/- 0.02 eV and Eph = 24 +/- 0.2 meV, respectively. Moreover, based on absorption spectrum analysis the Urbach energy of the crystal was obtained as 0.10 eV.
Citation - WoS: 5
Citation - Scopus: 4
Properties of Se/Inse Thin-Film Interface
(Springer, 2016) Qasrawi, A. F.; Qasrawı, Atef Fayez Hasan; Kayed, T. S.; Elsayed, Khaled A.; Kayed, Tarek Said; Qasrawı, Atef Fayez Hasan; Kayed, Tarek Said; Department of Electrical & Electronics Engineering; Department of Electrical & Electronics Engineering
Se, InSe, and Se/InSe thin films have been prepared by the physical vapor deposition technique at pressure of similar to 10(-5) torr. The structural, optical, and electrical properties of the films and Se/InSe interface were investigated by means of x-ray diffraction (XRD) analysis, ultraviolet-visible spectroscopy, and current-voltage (I-V) characteristics. XRD analysis indicated that the prepared InSe films were amorphous while the Se films were polycrystalline having hexagonal structure with unit cell parameters of a = 4.3544 and c = 4.9494 . Spectral reflectance and transmittance analysis showed that both Se and InSe films exhibited indirect allowed transitions with energy bandgaps of 1.92 eV and 1.34 eV, respectively. The Se/InSe interface exhibited two energy bandgaps of 0.98 eV and 1.73 eV above and below 2.2 eV, respectively. Dielectric constant values were also calculated from reflectance spectra for the three layers in the frequency range of 500 THz to 272 THz. The dielectric constant exhibited a promising feature suggesting use of the Se/InSe interface as an optical resonator. Moreover, the Au/Se/InSe/Ag heterojunction showed some rectifying properties that could be used in standard optoelectronic devices. The ideality factor and height of the energy barrier to charge carrier motion in this device were found to be 1.72 and 0.66 eV, respectively.
Citation - WoS: 3
Citation - Scopus: 4
In Situ Observation of Heat-Assisted Hexagonal-Orthorhombic Phase Transitions in Se/Ag Sandwiched Structures and Their Effects on Optical Properties
(Springer, 2019) Qasrawi, A. F.; Aloushi, Hadil D.
In this work, two selenium layers of 500-nm thickness, nano-sandwiched with Ag nanosheets of 100-nm thickness (Se/Ag/Se), are subjected to in situ monitoring of the structural and optical transitions during heating over a temperature range of 303-473 K by x-ray diffraction and ultraviolet-visible light spectrophotometry, respectively. The Se/Ag/Se thin films are observed to exhibit a transformation from an amorphous to a polycrystalline phase at 343 K. Increasing the temperature above 363 K enhances the crystallinity of the hexagonal phase, reduces the microstrain, increases the crystallite size and reduces the defect density. Accordingly, the optical absorption spectra are redshifted upon heating. The redshift is accompanied by a transition in the energy band gap from 2.03 eV to 1.85 eV as the material structural phase is transformed from amorphous to polycrystalline. Increasing the temperature causes the energy band gap to shrink. Another permanent phase transformation from hexagonal to orthorhombic is detected when the Se/Ag/Se system is allowed to cool. Scanning electron microscopy images show that the phase transformation converts the grains of Se/Ag/Se films from wire-shaped to nanotubes. The second phase transformation causes a blueshift in the absorption coefficient spectra and increases the energy band gap. The structural and optical parameter enhancements achieved via heating render the Se thin films more suitable for optoelectronic applications.
Citation - WoS: 28
Citation - Scopus: 29
Annealing Effects on the Structural and Optical Properties of Agin₅s_{8< Thin Films}
(Elsevier Science Sa, 2008) Qasrawi, A. F.; Qasrawı, Atef Fayez Hasan; Qasrawı, Atef Fayez Hasan; Department of Electrical & Electronics Engineering; Department of Electrical & Electronics Engineering
Due to its importance as a perspective material for application in optoelectronic semiconductor devices, the thermal annealing effects on the structural and optical properties of the as-grown vacuum evaporated AgIn5S8 thin films have been investigated. The X-ray data analysis have shown that these films are polycrystalline in nature and exhibit better crystallization with increasing crystallite size and slightly, decreasing unit cell lattice parameter as annealing temperature is raised from 450 to 600 K. The optical energy band gap for the as-grown and thermally annealed films is found to be of direct allowed transitions type. The energy band gap exhibited values of 1.78, 1.74 and 1.62 eV as the samples were annealed at, 450 and 600 K, respectively. This indicates the ability of altering the band gap values of this material by the thermal annealing process. The structural and optical features seem to be suitable for semiconductor device production such as solar cell converters, which has successfully been fabricated by others, metal-insulator-semiconductor (MIS) and metal - oxide - semiconductor (MOS) devices, as well. (c) 2007 Elsevier B.V. All rights reserved.
Citation - WoS: 7
Citation - Scopus: 8
Optical Properties of Tl₂ingas_{4< Layered Single Crystal}
(Elsevier Science Bv, 2007) Qasrawi, A. F.; Gasanly, N. M.
The temperature dependence of the optical band gap of Tl2InGaS4 single crystal in the temperature region of 300-500 K and the room temperature refractive index, n(lambda), have been investigated. The absorption coefficient, which was calculated from the transmittance and reflectance spectra in the incident photon energy range of 2.28-2.48 eV, increased with increasing temperature. Consistently, the absorption edge shifts to lower energy values as temperature increases. The fundamental absorption edge corresponds to an indirect allowed transitions energy gap (2.35 eV) that exhibits a temperature coefficient of -4.03 x 10(-4) eV/K. The room temperature n(lambda), calculated from the reflectance and transmittance data, allowed the identification of the oscillator strength and energy, static and lattice dielectric constants, and static refractive index as 16.78 eV and 3.38 eV, 5.96 and 11.77, and 2.43, respectively. (c) 2006 Elsevier B.V. All rights reserved.
Citation - WoS: 50
Citation - Scopus: 52
Elemental Sulfur-Based Polymeric Materials: Synthesis and Characterization
(Wiley-blackwell, 2016) Salman, Mohamed Khalifa; Karabay, Baris; Karabay, Lutfiye Canan; Cihaner, Atilla
New elemental sulfur-based polymeric materials called poly(sulfur-random-divinylbenzene) [poly(S-r-DVB)] were synthesized by ring opening polymerization via inverse vulcanization technique in the presence of a mixture of o-, m-, and p-diviniylbenzene (DVB) as a cross-linker. A clear yellow/orange colored liquid was obtained from the elemental sulfur melted at 160 degrees C and then by adding various amounts of DVB to this liquid directly via a syringe at 200 degrees C viscous reddish brown polymeric materials were obtained. The copolymers are soluble in common solvents like tetrahydrofuran, dichloromethane, and chloroform, and they can be coated on any surface as a thin film by a spray coating technique. The characterization of the materials was performed by using nuclear magnetic resonance, fourier transform infrared, and Raman spectroscopies. The morphological properties were monitored via scanning electron microscope technique. Thermal analysis showed that an increase in the amount of DVB in the copolymers resulted in an increase in the thermal decomposition temperature. On the other hand, poly(S-r-DVB) copolymers exhibited good percent transmittance as 50% T between 1500 and 13,000 nm in electromagnetic radiation spectrum, which makes them good candidates to be amenable use in military and surveillance cameras. (c) 2016 Wiley Periodicals, Inc. J. Appl. Polym. Sci. 2016, 133, 43655.

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