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Article Citation - WoS: 17Citation - Scopus: 17Trap Distribution in Tlins2 Layered Crystals From Thermally Stimulated Current Measurements(Korean Physical Soc, 2008) Isik, M.; Goksen, K.; Gasanly, N. M.; Ozkan, H.We have carried out thermally stimulated current (TSC) measurements with the current flowing along the layer on as-grown TlInS2 layered single crystals in the low temperature range 10 - 110 K with different heating rates of 0.1 - 1.5 K/s. Experimental evidence was found for the presence of two shallow electron trapping centers with activation energies of 12 and 14 meV. Their capture cross sections have been determined as 2.2 x 10(-23) and 7.1 x 10(-25) cm(2), respectively. It was concluded that retrapping in these centers is negligible, which was confirmed by the good agreement between the experimental results and the theoretical predictions of the model that assumed slow retrapping. An exponential distribution of electron traps was revealed from the analysis of the TSC data obtained at different light excitation temperatures. This experimental technique provided a value of 27 meV/decade for the trap distribution. The parameters of the monoclinic unit cell were determined by studying the X-ray powder diffraction.Article Citation - WoS: 2Citation - Scopus: 2Thermoluminescence Characteristics of Tl4gain3< Layered Single Crystals(Taylor & Francis Ltd, 2014) Delice, S.; Isik, M.; Gasanly, N. M.The properties of trapping centres in - as grown - Tl4GaIn3S8 layered single crystals were investigated in the temperature range of 10-300K using thermoluminescence (TL) measurements. TL curve was analysed to characterize the defects responsible for the observed peaks. Thermal activation energies of the trapping centres were determined using various methods: curve fitting, initial rise and peak shape methods. The results indicated that the peak observed in the low-temperature region composed of many overlapped peaks corresponding to distributed trapping centres in the crystal structure. The apparent thermal energies of the distributed traps were observed to be shifted from similar to 12 to similar to 125meV by increasing the illumination temperature from 10 to 36K. The analysis revealed that the first-order kinetics (slow retrapping) obeys for deeper level located at 292meV.Article Defect Characterization of Ga4se3< Layered Single Crystals by Thermoluminescence(indian Acad Sciences, 2016) Isik, M.; Delice, S.; Gasanly, N.Trapping centres in undoped Ga4Se3S single crystals grown by Bridgman method were characterized for the first time by thermoluminescence (TL) measurements carried out in the low-temperature range of 15-300 K. After illuminating the sample with blue light (similar to 470 nm) at 15 K, TL glow curve exhibited one peak around 74 K when measured with a heating rate of 0.4 K/s. The results of the various analysis methods were in good agreement about the presence of one trapping centre with an activation energy of 27 meV. Analysis of curve fitting method indicated that mixed order of kinetics dominates the trapping process. Heating rate dependence and distribution of the traps associated with the observed TL peak were also studied. The shift of peak maximum temperature from 74 to 113 K with increasing rate from 0.4 to 1.2 K/s was revealed. Distribution of traps was investigated using an experimental technique based on cleaning the centres giving emission at lower temperatures. Activation energies of the levels were observed to be increasing from 27 to 40 meV by rising the stopping temperature from 15 to 36 K.Article Citation - WoS: 5Citation - Scopus: 5Optical Properties of Tlgaxin1-x< Mixed Crystals (0.5 ≤ x ≤ 1) by Spectroscopic Ellipsometry, Transmission, and Reflection(Taylor & Francis Ltd, 2014) Isik, M.; Delice, S.; Gasanly, N. M.The layered semiconducting TlGaxIn1-xSe2-mixed crystals (0.5 <= x <= 1) were studied for the first time by spectroscopic ellipsometry measurements in the 1.2-6.2 eV spectral range at room temperature. The spectral dependence of the components of the complex dielectric function, refractive index, and extinction coefficient were revealed using an optical model. The interband transition energies in the studied samples were found from the analysis of the second-energy derivative spectra of the complex dielectric function. The effect of the isomorphic cation substitution (indium for gallium) on critical point energies in TlGaxIn1-xSe2 crystals was established. Moreover, the absorption edge of TlGaxIn1-xSe2 crystals have been studied through the transmission and reflection measurements in the wavelength range of 500-1100 nm. The analysis of absorption data revealed the presence of both optical indirect and direct transitions. It was found that the energy band gaps decrease with the increase of indium content in the studied crystals.Article Citation - WoS: 9Citation - Scopus: 9Determination of optical parameters of Ga0.75In0.25Se layered crystals(Wiley-v C H verlag Gmbh, 2012) Isik, M.; Gasanly, N. M.The optical properties of the Ga0.75In0.25Se crystals have been investigated by means of transmission and reflection measurements in the wavelength range of 380-1100 nm. The analysis of the results performed at room temperature revealed the presence of optical indirect transtions with band gap energy of 1.89 eV. The variation of the band gap energy as a function of temperature was also studied in the temperature range of 10-300 K. The rate of change of band gap energy (? = 6.2 x 10(4) eV/K) and absolute zero value of the band gap (Egi(0) = 2.01 eV) were reported. The wavelength dependence of the refractive index was analyzed using Wemple and DiDomenico, Sellmeier and Cauchy models to find the oscillator energy, dispersion energy, oscillator strength and zero-frequency refractive index values. (C) 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
