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Article Citation - WoS: 7Citation - Scopus: 7Design of the Zns/Ge pn Interfaces as Plasmonic, Photovoltaic and Microwave Band Stop Filters(Elsevier Science Bv, 2017) Alharbi, S. R.; Qasrawi, A. F.In the current work, we report and discuss the features of the design of a ZnS (300 nm)/Ge (300 nm)/GaSe (300 nm) thin film device. The device is characterized by the X-ray diffraction, electron microscopy, energy dispersive X-ray spectroscopy (EDS), optical spectroscopy, microwave power spectroscopy and light power dependent photoconductivity. While the X-ray diffraction technique revealed a polycrystalline ZnS coated with two amorphous layers of Ge and GaSe, the hot probe tests revealed the formation of pn interface. The optical spectra which were employed to reveal the conduction and valence band offsets at the ZnS/Ge and Ge/GaSe interface indicated information about the dielectric dispersion at the interface. The dielectric spectra of the ZnS/Ge/GaSe heterojunction which was modeled assuming the domination of surface plasmon interactions through the films revealed a pronounced increase in the drift mobility of free carriers in the three layers compared to the single and double layers. In the scope of the fitting parameters, a wave trap that exhibit filtering properties at notch frequency of 2.30 GHz was designed and tested. The ac signals power spectrum absorption reached similar to 99%. In addition, the photocurrent analysis on the ZnS/Ge/GaSe interface has shown it is suitability for photovoltaic and photosensing applications. (C) 2017 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND licenseConference Object Citation - WoS: 10Citation - Scopus: 11Improving the Laser Damage Resistance of Oxide Thin Films and Multilayers Via Tailoring Ion Beam Sputtering Parameters(Elsevier Science Bv, 2015) Cosar, M. B.; Coşar, Batuhan Mustafa; Ozhan, A. E. S.; Aydogdu, G. H.; Coşar, Batuhan Mustafa; Computer Engineering; Computer EngineeringIon beam sputtering is one of the widely used methods for manufacturing laser optical components due to its advantages such as uniformity, reproducibility, suitability for multilayer coatings and growth of dielectric materials with high packing densities. In this study, single Ta2O5 layers and Ta2O5/SiO2 heterostructures were deposited on optical quality glass substrates by dual ion beam sputtering. We focused on the effect of deposition conditions like substrate cleaning, assistance by 12 cm diameter ion beam source and oxygen partial pressure on the laser-induced damage threshold of Ta2O5 single layers. After-wards, the obtained information is employed to a sample design and produces a Ta2O5/SiO2 multilayer structure demonstrating low laser-induced damage without a post treatment procedure. (C) 2014 Elsevier B.V. All rights reserved.Article Citation - WoS: 21Citation - Scopus: 21Design and Applications of Yb/Ga2< Schottky Barriers(Ieee-inst Electrical Electronics Engineers inc, 2017) Khanfar, Hazem K.; Qasrawı, Atef Fayez Hasan; Qasrawi, Atef F.; Zakarneh, Yasmeen A.; Gasanly, N. M.; Qasrawı, Atef Fayez Hasan; Department of Electrical & Electronics Engineering; Department of Electrical & Electronics EngineeringIn this paper, the Ga2Se3 crystals are used to design a Yb/Ga2Se3/C Schottky barrier. The device structure is investigated by the X-ray diffraction technique, which reveals a monoclinic-face-centered cubic interfacing type of structure. The barrier is studied by means of current (I)-voltage (V) characteristics in the dark and under light through photoexcitation from tungsten lamp and from the He-Ne laser. In addition, the impedance spectroscopy of these devices is studied in the frequency range of 10-1400 MHz. The photoexcited I-V curve analysis allowed investigating the biasing voltage, illumination power, and energy effects on the diode physical parameters, which are presented by the rectification ratio, the Schottky barrier height, the ideality factor, the series resistance, the photosensitivity, the responsivity, and the external quantum efficiency (EQE). While a maximum photosensitivity of 42 was observed for laser excitation with a wavelength of 632 nm at a reverse bias of 4.4 V, the EQE reached value of 1652% at 19.0 V. On the other hand, the ac current conduction analysis of the electrical conductivity, which was determined from the impedance spectral analysis, indicated that the ac signal processing through the Yb/Ga2Se3/C samples is due to the correlated hopping conduction through localized states of Fermi density of 3.98 x 10(19) eV(-1) cm(-3). The high-and biasing-dependent EQE% nominates the Yb/Ga2Se3/C as a tunable optoelectronic device.Article Citation - WoS: 10Citation - Scopus: 10Post Annealing Effects on the Structural, Compositional, Optical and Dielectric Properties of Cd Doped Gase Thin Films(Elsevier Science Sa, 2015) Al Garni, S. E.; Qasrawi, A. F.In this work, the heat treatment effects at temperatures (T-a) of 200, 300 and 400 degrees C on the compositional, structural, optical and dielectric properties of Cd doped GaSe are explored by means of energy dispersive X-ray spectroscopy, X-ray diffraction and UV-VIS spectrophotometry. The annealing process of the Cd doped GaSe thin films revealed a highly oriented orthorhombic structure type that exhibit a systematic increase in the grain size. While the strain, degree of orientation and dislocation density of the annealed films are weakly affected by the annealing process. The optical energy band gap of the doped films decreased from 1.23 to 0.90 eV and the exponential energy band tails rose from 0.16 to 0.23 eV when the annealing temperature is raised from 300 to 400 degrees C. In addition, the analysis of the dielectric spectral curves which were studied in the frequency range of 270-1500 THz, allowed to investigate the oscillator and dispersion energies and the static (epsilon(s)) and lattice (epsilon(l)) dielectric constants. The annealing process on the doped samples decreased the dispersion and oscillator energies as well as es. Oppositely, el values increased from 12.52 to 24.45 as a result of larger grain size and less defect density associated with annealing process when T-a is raised from 200 to 400 degrees C, respectively. (C) 2015 Elsevier B.V. All rights reserved.Article Citation - WoS: 2Citation - Scopus: 2Mgo/Gase0.5< Heterojunction as Photodiodes and Microwave Resonators(Ieee-inst Electrical Electronics Engineers inc, 2016) Qasrawi, Atef F.; Khanfar, Hazem K.; Gasanly, N. M.In this paper, a multifunctional operating optoelectronic device that suits visible light (VLC) and microwave communication systems is designed and characterized. The device which is composed of p-type MgO and n-type GaSe0.5S0.5 heterojunction is characterized by means of optical absorbance in the incident light energy (E) region of 3.5-1.1 eV, dark and illuminated current (I)-voltage (V) characteristics, and impedance spectra in the frequency range of 1M-1.8 GHz. Four types of lasers which generate light of wavelengths 406, 632, 850, and 1550 nm are used to excite the active region of the device. The device was also illuminated by non-monochromatic light. The incident light power was varied in the range of 1.12-10.17 mu W. It was observed that the heterojunction exhibits an optical energy bandgap (E-g) of 1.85 eV. For laser excitation with E > Eg, the photosensitivity (S) exceeds 67 while it is less than unity for excitations with E < Eg. These behaviors are assigned to the intrinsic and extrinsic nature of absorption, respectively. In addition, S increases as a result of energy barrier height lowering with increasing light power. On the other hand, when the device was excited with ac signal, the capacitance and impedance of the device displayed a resonance-antiresonance property associated with negative differential resistance and very high signal quality factor (10(3)) above 1.37 GHz. The bandwidth of the two resonance-antiresonance peaks is 319 and 12.6 MHz at 1.475 and 1.649 GHz, respectively. These results are attractive for using the heterojunction in VLC and microwave communication technologies.
