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Article Citation - WoS: 13Citation - Scopus: 14Linear and Nonlinear Optical Properties of Bi12geo20 Single Crystal for Optoelectronic Applications(Elsevier Sci Ltd, 2023) Isik, M.; Gasanly, N. M.The present paper aims at presenting linear and nonlinear optical properties of Bi12GeO20 single crystals grown by Czochralski method. Transmission and reflection measurements were performed in the 400-1000 nm region. The recorded spectra were analyzed considering well-known optical models. Spectral dependencies of absorption coefficient, skin depth, refractive index, real and imaginary components of dielectric function were presented. The analyses performed on absorption coefficient showed direct bandgap and Urbach energies as 2.56 and 0.22 eV, respectively. The first-and third-order nonlinear susceptibilities and nonlinear refractive index of the crystal were also reported in the present work. The results of the present paper would provide valuable information for optoelectronic device applications of Bi12GeO20.Article Citation - WoS: 6Citation - Scopus: 6Sns2 and Ho-Doped Sns2 Thin Films: Synergistic, Dft, Photocatalytic, and Antibacterial Studies(Elsevier Sci Ltd, 2024) Radja, Imane; Khane, Yasmina; Oliveira, Marisa C.; Longo, Elson; Ribeiro, Renan A. P.; Isik, Mehmit; Khan, Mohammad MansoobThis study investigates Ho-doped tin disulfide (Ho-SnS2) thin films prepared via spray coating, focusing on varying Ho doping levels (0 at. %, 2 at. %, and 4 at. %). Structural analysis through XRD and SEM showcased enhanced crystallinity and morphology in Ho-SnS2 films. Raman and XPS studies provided insight into the film's composition and chemical states. The antibacterial properties of the films were investigated using a bacterial growth inhibition assay. The results showed significant antibacterial activity against Gram-positive and Gram-negative bacteria, highlighting the potential applications of Ho-SnS2 thin films in antibacterial coatings. Ho-SnS2 films exhibited superior photocatalytic activity and antibacterial properties compared to SnS2 films, attributed to efficient charge separation. DFT analysis proposed a mechanism for the antibacterial activity. These findings highlight the efficacy of the spray coating technique in producing Ho-SnS2 films and the potential of Ho-SnS2 films for diverse applications like photocatalysis and antibacterial coatings.Article Citation - WoS: 3Citation - Scopus: 4Optical Properties of Cu3in5< Single Crystals by Spectroscopic Ellipsometry(Elsevier Gmbh, 2018) Isik, M.; Nasser, H.; Ahmedova, F.; Guseinov, A.; Gasanly, N. M.Cu3In5S9 single crystals were investigated by structural methods of x-ray diffraction and energy dispersive spectroscopy and optical techniques of ellipsometry and reflection carried out at room temperature. The spectral dependencies of optical constants; dielectric function, refractive index and extinction coefficient, were plotted in the range of 1.2-6.2 eV from ellipsometric data. The spectra of optical constants obtained from ellipsometry analyses and reflectance spectra presented a sharp change around 1.55 and 1.50 eV, respectively, which are associated with band gap energy of the crystal. The critical point (interband transition) energies were also found from the analyses of second-energy derivative of real and imaginary components of dielectric function. The analyses indicated the presence of four critical points at 2.73, 135, 4.04 and 4.98 eV.Article Citation - WoS: 4Citation - Scopus: 4Growth and Optical Characterization of Sn0.6sb0.4< Layer Single Crystals for Optoelectronic Applications(Elsevier Sci Ltd, 2022) Bektas, T.; Terlemezoglu, M.; Surucu, O.; Isik, M.; Parlak, M.SnSe compound is an attractive semiconductor material due to its usage in photovoltaic applications. The sub-stitution of Sb in the SnSe compound presents a remarkable advantage especially in point of tuning optical characteristics. The present paper reports the structural and optical properties of Sn1-xSbxSe (x = 0.4) layered single crystals grown by the vertical Bridgman method. To the best of our knowledge, this work is the first investigation of the Sn0.6Sb0.4Se crystal grown with the vertical Bridgman technique. X-ray diffraction (XRD) pattern of the grown crystal indicated the well crystalline structure of the grown crystals. Lattice strain and interplanar spacing of the crystal structure were determined using the XRD pattern. Scanning electron micro-scope images allowed to the observation of the layer crystal structure. The layer crystalline structure shows 2D material properties and provides 2D applications. Optical properties were revealed by carrying out Raman, ellipsometry and transmission measurements. Raman modes, refractive index, extinction coefficient, and dielectric spectra, band gap energy of the crystal were presented throughout the paper. The obtained results indicated that Sn1-xSbxSe (x = 0.4) layer single crystals may be an alternative potential for photovoltaic and optoelectronic applications.Article Citation - WoS: 19Citation - Scopus: 20Optical characteristics of Bi12SiO20 single crystals by spectroscopic ellipsometry(Elsevier Sci Ltd, 2020) Isik, M.; Delice, S.; Nasser, H.; Gasanly, N. M.; Darvishov, N. H.; Bagiev, V. E.Structural and optical characteristics of Bi12SiO20 single crystal grown by the Czochralski method were investigated by virtue of X-ray diffraction (XRD) and spectroscopic ellipsometry measurements. XRD analysis indicated that the studied crystal possesses cubic structure with lattice parameters of a = 1.0107 nm. Spectral dependencies of several optical parameters like complex dielectric constant, refractive index, extinction and absorption coefficients were determined using ellipsometry experiments performed in the energy region of 1.2-6.2 eV. The energy band gap of Bi12SiO20 crystals was found to be 3.25 eV by utilizing absorption coefficient analysis. Moreover, critical point energies were calculated as 3.54, 4.02, 4.82 and 5.58 eV from analyses of the second energy derivative spectra of the complex dielectric constant.Article Citation - WoS: 1Citation - Scopus: 1Temperature -Dependent Optical and Electrical Characterization of Cu-Ga Thin Films and Their Diode Characteristics on N-Si(Elsevier Gmbh, 2020) Gullu, H. H.; Isik, M.; Gasanly, N. M.; Parlak, M.In this paper, optical and electrical properties of thermally deposited Cu-Ga-S thin films were investigated using temperature-dependent optical transmission and electrical conductivity measurements. The analysis of the transmission spectra resulted in formation of three direct optical transitions due to the possible valence band splitting in the structure. The band gap values were calculated by means of absorption coefficient and incident photon energy was found in decreasing behavior as the temperature rises. The measured current-voltage values were used to extract the conductivity values which stand in the range of 1.73-2.62 (x104 O-1 cm-1) depending on the ambient temperature. These dark conductivity values were modeled by thermionic emission mechanism. The conductivity activation energies in the structures were calculated as 6.4, 14.5 and 40.7 meV according to the effects of grain boundary potentials. In addition, the films deposited on n-Si wafer showed a diode characteristic under the applied bias voltage between indium (In) front and silver (Ag) back contacts. From current-voltage measurements across the Si-based diode, about four orders of magnitude rectification was observed and the results were analyzed to determine the main diode parameters at dark and room temperature conditions.Article Citation - WoS: 5Citation - Scopus: 5Structural and Optical Properties of Thermally Evaporated (gase)0.75-(gas)0.25 Thin Films(Elsevier Gmbh, 2021) Isik, M.; Işık, Mehmet; Emir, C.; Gasanly, N. M.; Işık, Mehmet; Department of Electrical & Electronics Engineering; Department of Electrical & Electronics EngineeringGaSe and GaS binary semiconducting compounds are layered structured and have been an attractive research interest in two-dimensional material research area. The present paper aims at growing (GaSe)0.75 - (GaS)0.25 (or simply GaSe0.75S0.25) thin film and investigating its structural and optical properties. Thin films were prepared by thermal evaporation technique using evaporation source of its single crystal grown by Bridgman method. The structural properties were revealed using x-ray diffraction (XRD), energy dispersive spectroscopy (EDS), scanning electron microscopy (SEM) and atomic force microscopy (AFM) techniques. XRD pattern and EDS analyses indicated that thin films annealed at 300 ?C were successfully deposited and its structural characteristics are well-consistent with its single crystal form. Surface morphology was studied by means of SEM and AFM measurements. Optical properties were investigated by transmission and Raman spectroscopy techniques. Raman spectrum exhibited three peaks around 172, 242 and 342 cm-1. Analyses of transmission spectrum revealed the direct band gap energy as 2.34 eV. The mixed compounds of GaSe0.75S0.25 were prepared for the first time in a thin film form and the results of the present paper would provide valuable information to research area in which layered compounds have been studied in detail.Article Citation - WoS: 7Citation - Scopus: 7Effect of Thallium (tl) Substitution for Indium (in) on Ellipsometric Characteristics of Tlinse2 Single Crystals(Elsevier Sci Ltd, 2021) Isik, M.; Gasanly, N. M.TlMeSe2 (Me: Tl, In) semiconducting compounds exhibiting chain structure have been attractive ternary materials in various technological devices. In the TlMeSe2 structure, Tl1+ is monovalent while Me3+ is trivalent ions. The present paper reports the results of spectroscopic ellipsometry measurements performed on Tl1+(Tl0.2In0.8)3+Se2 (abbreviated as Tl1.2In0.8Se2) single crystals which were grown by substituting thallium for indium. The measurements were performed for orientations of E//c and Etc (E: electric field and c: optical axis). The analyses of ellipsometry data considering air-sample optical model presented the spectral dependencies of dielectric function, refractive index and extinction coefficient in the 1.2-5.0 eV range. Critical point energies of studied single crystal were obtained by fitting second-energy derivative spectra of dielectric function. The determined energies were compared with those of TlInSe2 to understand the effect of thalliumindium substitution in the compound. The crystal structure and atomic compositions of the constituent elements were also reported throughout the paper.Article Citation - WoS: 8Citation - Scopus: 10Temperature Effects on Optical Characteristics of Cdse Thin Films(Elsevier Sci Ltd, 2021) Gullu, H. H.; Isik, M.; Surucu, O.; Gasanly, N. M.; Parlak, M.CdSe is one of the significant members of II-VI type semiconducting family and it has a wide range of technological applications in which optoelectronic devices take a special position. The present paper reports the structural and optical characteristics of thermally evaporated CdSe thin films. XRD pattern exhibited preferential orientation along (111) plane while atomic composition analyses resulted in the ratio of Cd/Se as closer to 1.0. Temperature-dependent band gap characteristics of CdSe thin films were investigated for the first time by carrying out transmission experiments in the 10-300 K range. The analyses showed that direct band gap energy of the compound decreases from 1.750 (at 10 K) to 1.705 eV (at 300 K). Varshni model was successfully applied to the temperature-band gap energy dependency and various optical constants were determined. Raman spectrum of CdSe thin films was also presented to understand the vibrational characteristics of the compound. The present paper would provide worthwhile data to researchers especially studying on optoelectronic device applications of CdSe thin films.Article Citation - WoS: 20Citation - Scopus: 21Temperature-Tuned Band Gap Characteristics of Inse Layered Semiconductor Single Crystals(Elsevier Sci Ltd, 2020) Isik, M.; Gasanly, N. M.Layered structured InSe has attracted remarkable attention due to its effective characteristics utilized especially in optoelectronic device technology. This point directs researchers to investigate optical properties of InSe in great detail. The temperature dependent band gap characteristics of InSe and analyses performed on this dependency have been rarely studied in literature. Here, temperature-dependent transmission and room temperature reflection experiments were performed on InSe layered single crystals. The band gap energy was found around 1.22 eV at room temperature and 1.32 eV at 10 K. The temperature-gap energy dependency was analyzed using Varshni and O'Donnell-Chen models to reveal various optical parameters of the crystal. The structural characteristics; crystalline parameters like lattice constants, lattice strain, dislocation density and atomic compositions of InSe were also determined from the analyses of XRD and EDS measurements.
