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  • Article
    Citation - WoS: 5
    Citation - Scopus: 5
    Structural and Optical Properties of Thermally Evaporated (gase)0.75-(gas)0.25 Thin Films
    (Elsevier Gmbh, 2021) Isik, M.; Işık, Mehmet; Emir, C.; Gasanly, N. M.; Işık, Mehmet; Department of Electrical & Electronics Engineering; Department of Electrical & Electronics Engineering
    GaSe and GaS binary semiconducting compounds are layered structured and have been an attractive research interest in two-dimensional material research area. The present paper aims at growing (GaSe)0.75 - (GaS)0.25 (or simply GaSe0.75S0.25) thin film and investigating its structural and optical properties. Thin films were prepared by thermal evaporation technique using evaporation source of its single crystal grown by Bridgman method. The structural properties were revealed using x-ray diffraction (XRD), energy dispersive spectroscopy (EDS), scanning electron microscopy (SEM) and atomic force microscopy (AFM) techniques. XRD pattern and EDS analyses indicated that thin films annealed at 300 ?C were successfully deposited and its structural characteristics are well-consistent with its single crystal form. Surface morphology was studied by means of SEM and AFM measurements. Optical properties were investigated by transmission and Raman spectroscopy techniques. Raman spectrum exhibited three peaks around 172, 242 and 342 cm-1. Analyses of transmission spectrum revealed the direct band gap energy as 2.34 eV. The mixed compounds of GaSe0.75S0.25 were prepared for the first time in a thin film form and the results of the present paper would provide valuable information to research area in which layered compounds have been studied in detail.
  • Article
    Citation - WoS: 7
    Citation - Scopus: 7
    Optical Properties of Gas Crystals: Combined Study of Temperature-Dependent Band Gap Energy and Oscillator Parameters
    (Natl inst Science Communication-niscair, 2017) Isik, Mehmet; Tugay, Evrin; Gasanly, Nizami; Department of Electrical & Electronics Engineering
    Optical parameters of gallium sulfide (GaS) layered single crystals have been found through temperature-dependent transmission and room temperature reflection experiments in the wavelength range of 400-1100 nm. Experimental data demonstrates the coexistence of both optical indirect and direct transitions and the shift of the absorption edges toward lower energies by increasing temperature in the range of 10-300 K. Band gap at zero temperature, average phonon energy and electron phonon coupling parameter for indirect and direct band gap energies have been obtained from the analyses of temperature dependences of band gap energies. At high temperatures kT>> (E-ph), rates of band gap energy change have been found as 0.56 and 0.67 me V/K for E-gi and E-gd, respectively. Furthermore, the dispersion of refractive index has been discussed in terms of the Wemple-DiDomenico single effective oscillator model. The refractive index dispersion parameters, namely oscillator and dispersion energies, oscillator strength and zero-frequency refractive index, have been found to be 4.48 eV, 24.8 eV, 6.99x10(13) m(-2) and 2.56, respectively. The results of the present work will provide an important contribution to the research areas related to the characterization and optoelectronic device fabrication using GaS layered crystals.
  • Article
    Citation - WoS: 4
    Citation - Scopus: 3
    Investigation of Traps Distribution in Gas Single Crystals by Thermally Stimulated Current Measurements
    (Elsevier Sci Ltd, 2021) Delice, S.; Isik, M.; Gasanly, N. M.
    Thermally stimulated current (TSC) investigations of p-GaS (gallium sulfide) single crystals grown by Bridgman method were achieved by virtue of consecutive experiments carried out at various heating rates in between 0.4 and 1.0 K/s in the temperature range of 10-280 K. One single TSC peak around 148 K and overlapped, incomplete peaks in the end limit temperature of the experiments were observed in the spectrum recorded at constant heating rate of 1.0 K/s. Individual peak was analyzed utilizing curve fitting method. Existence of one trapping level centered at 0.11 eV was revealed by the analyses. Heating rate dependency of obtained TSC curve was also studied and it was shown that TSC intensity decreased besides increase of peak maximum temperature with heating rate. Characteristics feature of trapping mechanism was investigated in detail by employing different stopping temperature between 50 and 110 K. Analyses on T-m-T-stop dependency resulted in a presence of quasi-continuously distributed traps with activation energies ranging from 0.11 to 0.55 eV. The revealed trap was thought to be arising from intrinsic defect possibly created by V-Ga or antisite S-Ga.
  • Article
    Citation - WoS: 1
    Citation - Scopus: 1
    Temperature-Dependent Current-Voltage Characteristics of p-gase0.75< Heterojunction
    (Springer Heidelberg, 2023) Isik, M.; Surucu, O.; Gasanly, N. M.
    GaSe0.75S0.25 having layered structure is a potential semiconductor compound for optoelectronics and two-dimensional materials technologies. Optical and structural measurements of the GaSe0.75S0.25 thin film grown on the glass substrate showed that the compound has hexagonal structure and band energy of 2.34 eV. GaSe0.75S0.25 thin film was also grown on the silicon wafer and p-GaSe0.75S0.25/n-Si heterojunction was obtained. To make the electrical characterization of this diode, temperature-dependent current-voltage (I-V) measurements were carried out between 240 and 360 K. Room temperature ideality factor and barrier height of the device were determined from the analyses of I-V plot as 1.90 and 0.87 eV, respectively. Temperature-dependent plots of these electrical parameters showed that the ideality factor decreases from 2.19 to 1.77, while barrier height increases to 0.94 from 0.71 eV when the temperature was increased from 240 to 360 K. The conduction mechanism in the heterojunction was studied considering the Gaussian distribution due to presence of inhomogeneity in barrier height. The analyses presented the mean zero-bias barrier height, zero-bias standard deviation, and Richardson constant.