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Citation - WoS: 23
Citation - Scopus: 25
Investigation of Optical Properties of Bi₁₂geo_{20< Sillenite Crystals by Spectroscopic Ellipsometry and Raman Spectroscopy}
(Elsevier Sci Ltd, 2020) Isik, M.; Delice, S.; Gasanly, N. M.; Darvishov, N. H.; Bagiev, V. E.
Bi12GeO20 (BGO) compound is one of the fascinating members of sillenites group due to its outstanding photorefractive and photocatalytic characteristics. The present paper aims at investigating optical properties of BGO crystals by means of spectroscopic ellipsometry and Raman spectroscopy measurements. Bi12GeO20 single crystals grown by Czochralski method were structurally characterized by X-ray diffraction (XRD) experiments and the analyses showed that studied crystals have cubic crystalline structure. Raman spectrum exhibited 15 peaks associated with A, E and F modes. Spectroscopic ellipsometry measurement data achieved in the energy region between 1.2 and 6.2 eV were used in the air/sample optical model to get knowledge about complex pseudodielectric constant, pseudorefractive index, pseudoextinction and absorption coefficients of the crystals. Spectral change of real and imaginary part of complex pseudodielectric constant were discussed in detail. Band gap energy of Bi12GeO20 single crystals was calculated to be 3.18 eV using absorption coefficient dependency on photon energy. Critical point energies at which photons are strongly absorbed were determined by utilizing the second energy derivative spectra of components of complex pseudodielectric function. Fitting of both spectra resulted in the presence of four interband transitions with energies of 3.49, 4.11, 4.67 and 5.51 eV.
Citation - WoS: 8
Citation - Scopus: 8
Thermoluminescence Properties of Zno Nanoparticles in the Temperature Range 10-300 K
(Springer, 2016) Isik, M.; Yildirim, T.; Gasanly, N. M.
Low-temperature thermoluminescence (TL) properties of ZnO nanoparticles grown by sol-gel method were investigated in the 10-300 K temperature range. TL glow curve obtained at 0.2 K/s constant heating rate exhibited one broad peak around 83 K. The observed peak was analyzed using curve fitting method to determine the activation energies of trapping center(s) responsible for glow curve. Analyses resulted in the presence of three peaks at 55, 85 and 118 K temperatures with activation energies of 12, 30 and 45 meV, respectively. Thermal cleaning process was applied to separate overlapped peaks and get an opportunity to increase the reliability of results obtained from curve fitting method. Heating rate dependence of glow curve was also studied for rates between 0.2 and 0.7 K/s. The shift of the peak maximum temperatures to higher values and decrease in peak height with heating rate were observed. Moreover, X-ray diffraction and scanning electron microscopy were used for structural characterization.
Citation - WoS: 4
Citation - Scopus: 4
Trapping Centers in Bi₁₂tio_{20< Single Crystals by Thermally Stimulated Current}
(Elsevier, 2021) Isik, M.; Delice, S.; Gasanly, N. M.; Darvishov, N. H.; Bagiev, V. E.
Sillenite group compounds have been widely utilized in photocatalytic applications. One of the member of this group, Bi12TiO20 single crystal, was grown by Czochralski method. The structural properties were investigated by x-ray diffraction (XRD) and scanning electron microscope (SEM) techniques. XRD pattern presented well-defined intensive peaks associated with cubic crystalline structure. SEM images indicated the crystal surface as almost uniform and smooth. Thermally stimulated current (TSC) experiments were performed in the 10-280 K temperature range to reveal shallow trapping centers in the Bi12TiO20 single crystal. Two peaks around 112 and 179 K were observed in the TSC glow curve. The analyses of these curves considering the curve fitting and peak shape techniques resulted in presence of two hole centers at 0.09 and 0.14 eV. Heating rate dependencies of peak maximum temperature and current were also investigated throughout the paper.
Citation - WoS: 3
Citation - Scopus: 3
Temperature and Excitation Intensity Tuned Photoluminescence in Ga_0.75in_{0.25< Crystals}
(Elsevier Science Bv, 2013) Isik, M.; Guler, I.; Gasanly, N. M.
Photoluminescence (PL) spectra of Ga0.75In0.25Se layered single crystals have been studied in the wavelength range of 580-670 nm and temperature range of 7-59 K. Two PL emission bands centered at 613 nm (2.02 eV, A-band) and 623 nm (1.99 eV, B-band) were revealed at T = 7K. The excitation laser intensity dependence of the emission bands have been studied in the 0.06-1.40 W cm(-2) range. Radiative transitions from shallow donor levels located at E-A = 0.11 and E-B = 0.15 eV below the bottom of conduction band to single shallow acceptor level located at 0.01 eV above the valence band are suggested to be responsible for the observed A- and B-bands. A simple model was proposed to interpret the recombination processes in Ga0.75In0.25Se single crystals. (c) 2012 Elsevier B.V. All rights reserved.
Citation - WoS: 2
Citation - Scopus: 2
Optical constants and interband transitions of anisotropic layered structured Tl₂GaInS₄ crystals by spectroscopic ellipsometry
(Elsevier Science Sa, 2013) Isik, M.; Gasanly, N. M.; Turan, R.
Spectroscopic ellipsometry measurements were carried out on Tl2GaInS4 layered crystals for orientations of electric field vector, parallel (E//c*) and perpendicular (E perpendicular to c*) to optical axis c*. The measurements were performed in the 1.2-6.2 eV spectral range at room temperature. The real and imaginary components of the pseudodielectric function, pseudorefractive index and pseudoextinction coefficient were calculated from the analysis of ellipsometric data. The energies of interband transitions (critical points) have been found from the least-square fitting of the second derivative spectra of the pseudodielectric function. The results indicated five each interband transition structures for E//c* and E perpendicular to c* configurations. The obtained critical point energies were assigned tentatively to interband transitions using the available electronic energy band structure given in literature. (C) 2012 Elsevier B.V. All rights reserved.
Citation - WoS: 1
Citation - Scopus: 1
Growth and Optical Properties of (na_0.5bi_{0.5< (x=0.25) Single Crystal: a Potential Candidate for Optoelectronic Devices}
(Springer, 2024) Guler, I.; Isik, M.; Gasanly, N.
Double tungstates (DT) and double molybdates (DM) have significant importance because of their optoelectronic applications. Regarding the importance of DT and DM, we investigated experimentally structural and optical properties of (Na0.5Bi0.5)(Mo1-xWx)O-4 (x = 0.25) crystal that belongs to the NaBi-DT and DM crystals group. Czochralski method was used to grow the single crystals. The structure of the crystal was identified using X-ray diffraction (XRD) measurements. Two sharp peaks associated with tetragonal crystal structure appeared in the pattern. Vibrational modes of the studied crystal were obtained from the Raman experiments. By the help of the Fourier transform infrared spectrophotometer (FTIR) measurements, infrared transmittance spectrum of the studied compound was recorded. Band gap energy wase found around 3.04 eV using two methods, Tauc and derivative analysis, based on transmission spectrum. Based on the analysis of absorption coefficient, Urbach energy was obtained as 0.22 eV. The revealed structural and optical properties of the crystal indicated that the material may be a candidate for optoelectronic devices in which NaBi(MoO4)(2) and NaBi(WO4)(2) materials are utilized.
Citation - WoS: 5
Citation - Scopus: 5
Low-Temperature Thermoluminescence in Layered Structured Ga_0.75in_{0.25< Single Crystals}
(Elsevier Science Sa, 2012) Isik, M.; Bulur, E.; Gasanly, N. M.
Defect centers in Ga0.75In0.25Se single crystals have been studied performing the thermoluminescence measurements in the temperature range of 10-300 K. The observed glow curves were analyzed using curve fitting, initial rise, and different heating rate methods to determine the activation energies of the defect centers. Thermal cleaning process has been applied to decompose the overlapped curves. Four defect centers with activation energies of 9, 45,54 and 60 meV have been found as a result of the analysis. The capture cross sections and attempt-to-escape frequencies of the defect centers were also found using the curve fitting method under the light of theoretical predictions. The first order kinetics for the observed glow curve was revealed from the consistency between the theoretical predictions for slow retrapping and experimental results. Another indication of negligible retrapping was the independency of peak position from concentration of carriers trapped in defect levels. (C) 2012 Elsevier B.V. All rights reserved.
Citation - WoS: 5
Citation - Scopus: 5
Identification of Shallow Trap Centers in Inse Single Crystals and Investigation of Their Distribution: a Thermally Stimulated Current Spectroscopy
(Elsevier, 2024) Isik, M.; Gasanly, N. M.
Identification of trap centers in semiconductors takes great importance for improving the performance of electronic and optoelectronic devices. In the present study, we employed the thermally stimulated current (TSC) method within a temperature range of 10-280 K to explore trap centers in InSe crystal-a material with promising applications in next-generation devices. Our findings revealed the existence of two distinct hole trap centers within the InSe crystal lattice located at 0.06 and 0.14 eV. Through the leveraging the T-stop method, we offered trap distribution parameters of revealed centers. The results obtained from the experimental methodology employed to investigate the distribution of trap centers indicated that one of the peaks extended between 0.06 and 0.13 eV, while the other spanned from 0.14 to 0.31 eV. Notably, our research uncovers a remarkable variation in trap density, spanning one order of magnitude, for every 10 and 88 meV of energy variation. The results of our research present the characteristics of shallow trap centers in InSe, providing important information for the design and optimization of InSe-based optoelectronic devices.
Citation - WoS: 7
Citation - Scopus: 6
Spectroscopic Ellipsometry Characterization of Pbwo₄ Single Crystals
(Elsevier, 2022) Delice, S.; Isik, M.; Gasanly, N. M.; Darvishov, N. H.; Bagiev, V. E.
Optical characterization of PbWO4 single crystals grown by Czochralski method was achieved in virtue of spectroscopic ellipsometry experiments carried out in the energy region of 1.0-5.6 eV at room temperature. Tetragonal scheelite structure with lattice parameters of a = b = 5.4619 & Aring; and c = 12.0490 & Aring; was determined for the bulk crystal utilizing from XRD analysis. Analyses of the ellipsometry data presented the photon energy dependencies of complex dielectric function of the crystal. The real part of the dielectric function exhibited increasing behavior with energy in the below 4.1 eV and then decreased immediately. Zero frequency refractive index and dielectric constant were determined to be 2.02 and 4.08, respectively, using Wemple and DiDomenico oscillator model. High frequency dielectric constant was calculated as 4.30 by Spitzer-Fan model. Optical band gap of PbWO4 was found to be 3.24 eV from the dielectric relaxation time spectrum. Moreover, existence of two critical points with energies of 3.70 and 4.58 eV was revealed from the analyses of extinction coefficient and second derivative of the dielectric function. These levels were considered to be due to creation of cation exciton (Pb2+ 6s(2) - Pb2+ 6s6p) and transitions in the [WO4](2-) group.
Citation - WoS: 11
Citation - Scopus: 11
Structural and Temperature-Tuned Optical Characteristics of Bi₁₂geo_{20< Sillenite Crystals}
(Elsevier, 2020) Delice, S.; Isik, M.; Gasanly, N. M.; Darvishov, N. H.; Bagiev, V. E.
Sillenite compounds exhibit unique photorefractive and electro-optic characteristics providing attractiveness to these materials in various optoelectronic applications. The present paper aims at investigating one of the members of this family. Structural and optical characteristics of Bi12GeO20 (BGO) were studied by means of x-ray diffraction, Raman spectroscopy and temperature-dependent transmittance measurements. Obtained transmission curves in the wavelength range of 350-1100 nm and at different applied temperatures between 10 and 300 K were employed to find out the absorption coefficient dependence on the photon energy. Tauc relation revealed the presence of an energy gap of 2.49 eV at room temperature. Extension of energy gap up to 2.57 eV due to decreased temperature down to 10 K was deduced by the analysis. In order to have reliable results, the energy gap value was corroborated by utilizing derivative spectral method and well consistency between both methods was indicated. Energy gap change with temperature was also discussed in the study using an empirical formula developed by Varshni. Energy gap at absolute zero and rate of band gap alteration with temperature were determined as 2.57 eV and -2.4 x 10(-4) eV K (- 1), respectively. Taking into account the previously reported studies on investigation of band gap characteristics of BGO, intrinsic Bi-Ge(3+) + V-O(+) defect could be responsible for the revealed energy value of 2.49 eV which is much lower than reported band gap energy of similar to 3.2 eV.

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