Interband Critical Points in Tlga<i><sub>x</Sub>< Layered Mixed Crystals (0 ≤ <i>x</I> ≤ 1)
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Date
2013
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier Science Sa
Open Access Color
Green Open Access
No
OpenAIRE Downloads
OpenAIRE Views
Publicly Funded
No
Abstract
The layered semiconducting TlGaxIn1-xS2 mixed crystals (0 <= x <= 1) were studied by spectroscopic ellipsometry measurements in the 1.2-6.2 eV spectral range at room temperature. The spectral dependence of the components of the complex dielectric function, refractive index and extinction coefficient were revealed using an optical model. The interband transition energies in the studied samples were found from the analysis of the second-energy derivative spectra of the complex dielectric function. The variation of the obtained energies with composition were plotted to see the effect of the substitution of indium with gallium. Moreover, a simple diagram showing the revealed transitions in the available electronic band structure was given for TlGaS2 single crystals. (C) 2013 Elsevier B.V. All rights
Description
Gasanly, Nizami/0000-0002-3199-6686; Gasanly, Nizami/0000-0002-3199-6686
Keywords
Semiconductors, Ellipsometry, Optical properties
Fields of Science
0103 physical sciences, 02 engineering and technology, 0210 nano-technology, 01 natural sciences
Citation
WoS Q
Q1
Scopus Q

OpenCitations Citation Count
6
Source
Journal of Alloys and Compounds
Volume
581
Issue
Start Page
542
End Page
546
PlumX Metrics
Citations
CrossRef : 6
Scopus : 7
Captures
Mendeley Readers : 6
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