Interband Critical Points in Tlga<i><sub>x</Sub>< Layered Mixed Crystals (0 ≤ <i>x</I> ≤ 1)

dc.authoridGasanly, Nizami/0000-0002-3199-6686
dc.authoridGasanly, Nizami/0000-0002-3199-6686
dc.authorscopusid23766993100
dc.authorscopusid35580905900
dc.authorwosidGasanly, Nizami/ABA-2249-2020
dc.authorwosidIsik, Mehmet/KMY-5305-2024
dc.authorwosidGasanly, Nizami/HRE-1447-2023
dc.contributor.authorIsik, M.
dc.contributor.authorIşık, Mehmet
dc.contributor.authorGasanly, N. M.
dc.contributor.authorIşık, Mehmet
dc.contributor.otherDepartment of Electrical & Electronics Engineering
dc.contributor.otherDepartment of Electrical & Electronics Engineering
dc.date.accessioned2024-07-05T14:26:07Z
dc.date.available2024-07-05T14:26:07Z
dc.date.issued2013
dc.departmentAtılım Universityen_US
dc.department-temp[Isik, M.] Atilim Univ, Dept Elect & Elect Engn, TR-06836 Ankara, Turkey; [Gasanly, N. M.] Middle E Tech Univ, Dept Phys, TR-06800 Ankara, Turkeyen_US
dc.descriptionGasanly, Nizami/0000-0002-3199-6686; Gasanly, Nizami/0000-0002-3199-6686en_US
dc.description.abstractThe layered semiconducting TlGaxIn1-xS2 mixed crystals (0 <= x <= 1) were studied by spectroscopic ellipsometry measurements in the 1.2-6.2 eV spectral range at room temperature. The spectral dependence of the components of the complex dielectric function, refractive index and extinction coefficient were revealed using an optical model. The interband transition energies in the studied samples were found from the analysis of the second-energy derivative spectra of the complex dielectric function. The variation of the obtained energies with composition were plotted to see the effect of the substitution of indium with gallium. Moreover, a simple diagram showing the revealed transitions in the available electronic band structure was given for TlGaS2 single crystals. (C) 2013 Elsevier B.V. All rightsen_US
dc.identifier.citationcount7
dc.identifier.doi10.1016/j.jallcom.2013.07.134
dc.identifier.endpage546en_US
dc.identifier.issn0925-8388
dc.identifier.issn1873-4669
dc.identifier.scopus2-s2.0-84881507131
dc.identifier.startpage542en_US
dc.identifier.urihttps://doi.org/10.1016/j.jallcom.2013.07.134
dc.identifier.urihttps://hdl.handle.net/20.500.14411/104
dc.identifier.volume581en_US
dc.identifier.wosWOS:000324823000091
dc.identifier.wosqualityQ1
dc.institutionauthorIşık, Mehmet
dc.language.isoenen_US
dc.publisherElsevier Science Saen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.scopus.citedbyCount7
dc.subjectSemiconductorsen_US
dc.subjectEllipsometryen_US
dc.subjectOptical propertiesen_US
dc.titleInterband Critical Points in Tlga<i><sub>x</Sub>< Layered Mixed Crystals (0 ≤ <i>x</I> ≤ 1)en_US
dc.typeArticleen_US
dc.wos.citedbyCount7
dspace.entity.typePublication
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