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Citation - WoS: 5
Citation - Scopus: 5
Low-Temperature Thermoluminescence in Layered Structured Ga_0.75in_{0.25< Single Crystals}
(Elsevier Science Sa, 2012) Isik, M.; Bulur, E.; Gasanly, N. M.
Defect centers in Ga0.75In0.25Se single crystals have been studied performing the thermoluminescence measurements in the temperature range of 10-300 K. The observed glow curves were analyzed using curve fitting, initial rise, and different heating rate methods to determine the activation energies of the defect centers. Thermal cleaning process has been applied to decompose the overlapped curves. Four defect centers with activation energies of 9, 45,54 and 60 meV have been found as a result of the analysis. The capture cross sections and attempt-to-escape frequencies of the defect centers were also found using the curve fitting method under the light of theoretical predictions. The first order kinetics for the observed glow curve was revealed from the consistency between the theoretical predictions for slow retrapping and experimental results. Another indication of negligible retrapping was the independency of peak position from concentration of carriers trapped in defect levels. (C) 2012 Elsevier B.V. All rights reserved.
Citation - WoS: 7
Citation - Scopus: 7
Trapping Centers and Their Distribution in Tl₂ga_{2< Layered Single Crystals}
(Pergamon-elsevier Science Ltd, 2009) Isik, M.; Gasanly, N. M.
Thermally stimulated current (TSC) measurements with current flowing perpendicular to the layers were carried out on Tl2Ga2Se3S layered single crystals in the temperature range of 10-260K. The experimental data were analyzed by using different methods, such as curve fitting, initial rise and isothermal decay methods. The analysis revealed that there were three trapping centers with activation energies of 12, 76 and 177 meV. It was concluded that retrapping in these centers was negligible, which was confirmed by the good agreement between the experimental results and the theoretical predictions of the model that assumes slow retrapping. The capture cross section and the concentration of the traps have been also determined. An exponential distribution of electron traps was revealed from the analysis of the TSC data obtained at different light illumination temperatures. This experimental technique provided values of 10 and 88 meV/decade for the traps distribution related to two different trapping centers. (C) 2009 Elsevier Ltd. All rights reserved.
Citation - WoS: 14
Citation - Scopus: 14
Low Temperature Thermoluminescence Behaviour of Y₂o_{3< Nanoparticles}
(Elsevier, 2019) Delice, S.; Isik, M.; Gasanly, N. M.
Y2O3 nanoparticles were investigated using low temperature thermoluminescence (TL) experiments. TL glow curve recorded at constant heating rate of 0.4 K/s exhibits seven peaks around 19, 62, 91, 115, 162, 196 and 215 K. Activation energies and characteristics of traps responsible for observed curves were revealed under the light of results of initial rise analyses and T-max-T-stop experimental methods. Analyses of TL curves obtained at different stopping temperatures resulted in presence of one quasi-continuously distributed trap with activation energies increasing from 18 to 24 meV and six single trapping centers at 49, 117, 315, 409, 651 and 740 meV. Activation energies of all revealed centers were reported in the present paper. Structural characterization of Y2O3 nanoparticles was accomplished using X-ray diffraction and scanning electron microscopy measurements. (C) 2019 Chinese Society of Rare Earths. Published by Elsevier B.V. All rights reserved.
Citation - WoS: 5
Citation - Scopus: 5
Identification of Shallow Trap Centers in Inse Single Crystals and Investigation of Their Distribution: a Thermally Stimulated Current Spectroscopy
(Elsevier, 2024) Isik, M.; Gasanly, N. M.
Identification of trap centers in semiconductors takes great importance for improving the performance of electronic and optoelectronic devices. In the present study, we employed the thermally stimulated current (TSC) method within a temperature range of 10-280 K to explore trap centers in InSe crystal-a material with promising applications in next-generation devices. Our findings revealed the existence of two distinct hole trap centers within the InSe crystal lattice located at 0.06 and 0.14 eV. Through the leveraging the T-stop method, we offered trap distribution parameters of revealed centers. The results obtained from the experimental methodology employed to investigate the distribution of trap centers indicated that one of the peaks extended between 0.06 and 0.13 eV, while the other spanned from 0.14 to 0.31 eV. Notably, our research uncovers a remarkable variation in trap density, spanning one order of magnitude, for every 10 and 88 meV of energy variation. The results of our research present the characteristics of shallow trap centers in InSe, providing important information for the design and optimization of InSe-based optoelectronic devices.
Citation - WoS: 5
Citation - Scopus: 5
Thermoluminescence Properties of Al Doped Zno Nanoparticles
(Elsevier Sci Ltd, 2018) Isik, M.; Gasanly, N. M.
ZnO nanoparticles doped with aluminum (AZO nanoparticles) were investigated using low temperature thermoluminescence (TL) and structural characterization experiments. TL experiments were performed on AZO nanoparticles in the temperature range of 10-300 K. TL curve presented one intensive peak around 123 K and two overlapped peaks to intensive peak around 85 and 150 K for heating rate of 0.1 K/s. Curve fitting and initial rise methods were used to find the activation energies of associated trapping centers. Analyses resulted in the presence of three centers at 0.05, 0.08 and 0.17 eV with peak maximum temperatures (T-m) of 86.2, 121.5 and 147.1 K, respectively. TL experiments were expanded using different heating rates between 0.1 K/s and 0.5 K/s. Behavior of revealed traps was investigated using an experimental technique called as T-m - T-stop method. It was seen that traps are quasi-continuously distributed within the band gap. Structural properties were studied using x-ray diffraction, energy dispersive spectroscopy and scanning electron microscopy experiments.
Citation - WoS: 8
Citation - Scopus: 8
Thermoluminescence Properties of Zno Nanoparticles in the Temperature Range 10-300 K
(Springer, 2016) Isik, M.; Yildirim, T.; Gasanly, N. M.
Low-temperature thermoluminescence (TL) properties of ZnO nanoparticles grown by sol-gel method were investigated in the 10-300 K temperature range. TL glow curve obtained at 0.2 K/s constant heating rate exhibited one broad peak around 83 K. The observed peak was analyzed using curve fitting method to determine the activation energies of trapping center(s) responsible for glow curve. Analyses resulted in the presence of three peaks at 55, 85 and 118 K temperatures with activation energies of 12, 30 and 45 meV, respectively. Thermal cleaning process was applied to separate overlapped peaks and get an opportunity to increase the reliability of results obtained from curve fitting method. Heating rate dependence of glow curve was also studied for rates between 0.2 and 0.7 K/s. The shift of the peak maximum temperatures to higher values and decrease in peak height with heating rate were observed. Moreover, X-ray diffraction and scanning electron microscopy were used for structural characterization.
Low Temperature Thermoluminescence of Quaternary Thallium Sulfide Tl₄inga_3<
(indian Assoc Cultivation Science, 2015) Delice, S.; Isik, M.; Bulur, E.; Gasanly, N. M.
Thermoluminescence measurements have been carried out on Tl4InGa3S8 single crystals in the temperature range of 10-300 K at various heating rates. The observed thermoluminescence spectra have been analyzed applying many methods like curve fitting, initial rise, peak shape and heating rate methods. Thermal cleaning method has been performed on the observed thermoluminescence glow curve to separate the overlapped peaks. Three distinctive trapping centers with activation energies of 13, 44 and 208 meV have been revealed from the results of the analysis. Heating rate dependence and traps distribution investigations have been also undertaken on the most intensive peak. The thermoluminescence mechanisms in the observed traps have been attributed to first order kinetics (slow retrapping) on the strength of the consistency between theoretical assumptions for slow retrapping process and experimental outcomes.
Citation - WoS: 2
Citation - Scopus: 2
Trap Distribution in Agin₅s_{8< Single Crystals: Thermoluminescence Study}
(Pergamon-elsevier Science Ltd, 2018) Delice, S.; Işık, Mehmet; Isik, M.; Gasanly, N. M.; Işık, Mehmet; Department of Electrical & Electronics Engineering; Department of Electrical & Electronics Engineering
Distribution of shallow trap levels in AgIn5S8 crystals has been investigated by thermoluminescence (TL) measurements performed below room temperature (10-300 K). One broad TL peak centered at 33 K was observed as constant heating rate of 0.2 K/s was employed for measurement. The peak shape analysis showed that the TL curve could consist of several individual overlapping TL peaks or existence of quasi-continuous distributed traps. Therefore, TL experiments were repeated for different stopping temperatures (T-stop) between 10 and 34 K with constant heating rate of 0.2 K/s to separate the overlapping TL peaks. The E-t vs T-stop indicated that crystal has quasi-continuously distributed traps having activation energies increasing from 13 to 41 meV. Heating rate effect on trapped charge carriers was also investigated by carrying out the TL. experiments with various heating rates between 0.2 and 0.6 K/s for better comprehension of characteristics of existed trap levels. Analyses indicated that the trap levels exhibited the properties of anomalous heating rate behavior which means the TL intensity and area under the TL peak increase with increasing heating rate.
Citation - WoS: 14
Citation - Scopus: 18
Traps distribution in sol-gel synthesized ZnO nanoparticles
(Elsevier, 2019) Delice, S.; Isik, M.; Gasanly, N. M.
The distribution of shallow traps within the sol-gel synthesized ZnO nanoparticles was investigated using thermoluminescence (TL) experiments in the 10-300 K temperature range. TL measurements presented two overlapped peaks around 110 and 155 K. The experimental technique based on radiating the nanoparticles at different temperatures (T-exc.) between 60 and 125 K was carried out to understand the trap distribution characteristics of peaks. It was observed that peak maximum temperature shifted to higher values and activation energy (E-t) increased as irradiating temperature was increased. The E-t vs. T-exc. presented that ZnO nanoparticles have quasi-continuously distributed traps possessing activation energies increasing from 80 to 171 meV. (C) 2019 Elsevier B.V. All rights reserved.
Citation - WoS: 8
Citation - Scopus: 8
Defect Characterization in Bi₁₂geo_{20< Single Crystals by Thermoluminescence}
(Elsevier, 2021) Delice, S.; Isik, M.; Sarigul, N.; Gasanly, N. M.
Bi12GeO20 single crystal grown by Czochralski method was investigated in terms of thermoluminescence (TL) properties. TL experiments were performed for various heating rates between 1 and 6 K/s in the temperature region of 300-675 K. One TL peak with peak maximum temperature of 557 K was observed in the TL spectrum as constant heating rate of 1 K/s was employed. Curve fitting, initial rise and variable heating rate methods were applied to calculate the activation energy of trap level corresponding to this TL peak. Analyses resulted in a presence of one trap center having mean activation energy of 0.78 eV. Heating rate characteristics of revealed trap center was also explored and theoretically well-known behavior that TL intensity decreases and peak maximum temperature increases with heating rates was observed for the trap level. Distribution of trapping levels was studied by thermally cleaning process for different T-stop between 425 and 525 K. Quasi-continuously distributed trapping levels were revealed with mean activation energies ranging from 0.78 to 1.26 eV. Moreover, absorption analysis revealed an optical transition taking place between a defect level and conduction band with an energy difference of 2.51 eV. These results are in good agreement for the presence of intrinsic defects above valence band in Bi12GeO20 crystals.

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