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Citation - WoS: 5
Citation - Scopus: 5
Low-Temperature Thermoluminescence in Layered Structured Ga_0.75in_{0.25< Single Crystals}
(Elsevier Science Sa, 2012) Isik, M.; Bulur, E.; Gasanly, N. M.
Defect centers in Ga0.75In0.25Se single crystals have been studied performing the thermoluminescence measurements in the temperature range of 10-300 K. The observed glow curves were analyzed using curve fitting, initial rise, and different heating rate methods to determine the activation energies of the defect centers. Thermal cleaning process has been applied to decompose the overlapped curves. Four defect centers with activation energies of 9, 45,54 and 60 meV have been found as a result of the analysis. The capture cross sections and attempt-to-escape frequencies of the defect centers were also found using the curve fitting method under the light of theoretical predictions. The first order kinetics for the observed glow curve was revealed from the consistency between the theoretical predictions for slow retrapping and experimental results. Another indication of negligible retrapping was the independency of peak position from concentration of carriers trapped in defect levels. (C) 2012 Elsevier B.V. All rights reserved.
Citation - WoS: 5
Citation - Scopus: 5
Determination of Trapping Parameters of Thermoluminescent Glow Peaks of Semiconducting Tl₂ga_{2< Crystals}
(Pergamon-elsevier Science Ltd, 2015) Isik, M.; Yildirim, T.; Gasanly, N. M.
Thermoluminescence (TL) properties of Tl2Ga2S3Se layered single crystals were researched in the temperature range of 290-770 K. U glow curve exhibited two peaks with maximum temperatures of similar to 373 and 478 K. Curve fitting, initial rise and peak shape methods were used to determine the activation energies of the trapping centers associated with these peaks. Applied methods were in good agreement with the energies of 780 and 950 meV. Capture cross sections and attempt-to-escape frequencies of the trapping centers were reported. An energy level diagram showing transitions in the band gap of the crystal was plotted under the light of the results of the present work and previously reported papers on photoluminescence, thermoluminescence and thermally stimulated current measurements carried out below room temperature. (C) 2015 Elsevier Ltd. All rights reserved.
Citation - WoS: 7
Citation - Scopus: 7
Trapping Centers and Their Distribution in Tl₂ga_{2< Layered Single Crystals}
(Pergamon-elsevier Science Ltd, 2009) Isik, M.; Gasanly, N. M.
Thermally stimulated current (TSC) measurements with current flowing perpendicular to the layers were carried out on Tl2Ga2Se3S layered single crystals in the temperature range of 10-260K. The experimental data were analyzed by using different methods, such as curve fitting, initial rise and isothermal decay methods. The analysis revealed that there were three trapping centers with activation energies of 12, 76 and 177 meV. It was concluded that retrapping in these centers was negligible, which was confirmed by the good agreement between the experimental results and the theoretical predictions of the model that assumes slow retrapping. The capture cross section and the concentration of the traps have been also determined. An exponential distribution of electron traps was revealed from the analysis of the TSC data obtained at different light illumination temperatures. This experimental technique provided values of 10 and 88 meV/decade for the traps distribution related to two different trapping centers. (C) 2009 Elsevier Ltd. All rights reserved.
Citation - WoS: 14
Citation - Scopus: 14
Low Temperature Thermoluminescence Behaviour of Y₂o_{3< Nanoparticles}
(Elsevier, 2019) Delice, S.; Isik, M.; Gasanly, N. M.
Y2O3 nanoparticles were investigated using low temperature thermoluminescence (TL) experiments. TL glow curve recorded at constant heating rate of 0.4 K/s exhibits seven peaks around 19, 62, 91, 115, 162, 196 and 215 K. Activation energies and characteristics of traps responsible for observed curves were revealed under the light of results of initial rise analyses and T-max-T-stop experimental methods. Analyses of TL curves obtained at different stopping temperatures resulted in presence of one quasi-continuously distributed trap with activation energies increasing from 18 to 24 meV and six single trapping centers at 49, 117, 315, 409, 651 and 740 meV. Activation energies of all revealed centers were reported in the present paper. Structural characterization of Y2O3 nanoparticles was accomplished using X-ray diffraction and scanning electron microscopy measurements. (C) 2019 Chinese Society of Rare Earths. Published by Elsevier B.V. All rights reserved.
Citation - WoS: 5
Citation - Scopus: 5
Identification of Shallow Trap Centers in Inse Single Crystals and Investigation of Their Distribution: a Thermally Stimulated Current Spectroscopy
(Elsevier, 2024) Isik, M.; Gasanly, N. M.
Identification of trap centers in semiconductors takes great importance for improving the performance of electronic and optoelectronic devices. In the present study, we employed the thermally stimulated current (TSC) method within a temperature range of 10-280 K to explore trap centers in InSe crystal-a material with promising applications in next-generation devices. Our findings revealed the existence of two distinct hole trap centers within the InSe crystal lattice located at 0.06 and 0.14 eV. Through the leveraging the T-stop method, we offered trap distribution parameters of revealed centers. The results obtained from the experimental methodology employed to investigate the distribution of trap centers indicated that one of the peaks extended between 0.06 and 0.13 eV, while the other spanned from 0.14 to 0.31 eV. Notably, our research uncovers a remarkable variation in trap density, spanning one order of magnitude, for every 10 and 88 meV of energy variation. The results of our research present the characteristics of shallow trap centers in InSe, providing important information for the design and optimization of InSe-based optoelectronic devices.
Citation - WoS: 9
Citation - Scopus: 9
Thermally Stimulated Current Measurements in Undoped Ga₃inse_{4< Single Crystals}
(Pergamon-elsevier Science Ltd, 2011) Isik, M.; Işık, Mehmet; Gasanly, N. M.; Işık, Mehmet; Department of Electrical & Electronics Engineering; Department of Electrical & Electronics Engineering
The trap levels in nominally undoped Ga3InSe4 crystals were investigated in the temperature range of 10-300 K using the thermally stimulated currents technique. The study of trap levels was accomplished by the measurements of current flowing along the c-axis of the crystal. During the experiments we utilized a constant heating rate of 0.8 K/s. Experimental evidence is found for one hole trapping center in the crystal with activation energy of 62 meV. The analysis of the experimental TSC curve gave reasonable results under the model that assumes slow retrapping. The capture cross-section of the trap was determined as 1.0 x 10(-25) cm(2) with concentration of 1.4 x 10(17) cm(-3). (C) 2011 Elsevier Ltd. All rights reserved.
Citation - WoS: 1
Citation - Scopus: 1
Shallow Trapping Centers in Bi12geo20 Single Crystals by Thermally Stimulated Current Measurements
(Elsevier, 2022) Delice, S.; Isik, M.; Gasanly, N. M.
Bi12GeO20 single crystals were investigated by thermally stimulated current (TSC) experiments performed in the temperature range of 10-290 K. Recorded TSC glow curve exhibited six distinctive peaks with maxima at around 90, 105, 166, 209, 246, 275 K. The analyses of the obtained glow curve were accomplished by curve fitting and initial rise methods. The analysis results were in good agreement that the TSC peaks appeared in the glow curve due to existence of trapping levels with activation energies of 0.10, 0.18, 0.23, 0.53, 0.68 and 0.73 eV. These trapping levels were estimated to be hole traps above valence band. The heating rate dependent TSC glow curves were also obtained for various rates between 0.30 and 0.45 K/s. The changes of TSC intensity, peak maximum temperature and full-widths-half-maximum values with heating rates were studied in detail. TSC intensity decreased and peak maximum temperature increased with increasing heating rate. Determination of defects and trapping/stimulation mechanism of those are significant for technological applications since local states in these materials take critical role for device performance.
Citation - WoS: 5
Citation - Scopus: 5
Thermoluminescence Properties of Al Doped Zno Nanoparticles
(Elsevier Sci Ltd, 2018) Isik, M.; Gasanly, N. M.
ZnO nanoparticles doped with aluminum (AZO nanoparticles) were investigated using low temperature thermoluminescence (TL) and structural characterization experiments. TL experiments were performed on AZO nanoparticles in the temperature range of 10-300 K. TL curve presented one intensive peak around 123 K and two overlapped peaks to intensive peak around 85 and 150 K for heating rate of 0.1 K/s. Curve fitting and initial rise methods were used to find the activation energies of associated trapping centers. Analyses resulted in the presence of three centers at 0.05, 0.08 and 0.17 eV with peak maximum temperatures (T-m) of 86.2, 121.5 and 147.1 K, respectively. TL experiments were expanded using different heating rates between 0.1 K/s and 0.5 K/s. Behavior of revealed traps was investigated using an experimental technique called as T-m - T-stop method. It was seen that traps are quasi-continuously distributed within the band gap. Structural properties were studied using x-ray diffraction, energy dispersive spectroscopy and scanning electron microscopy experiments.
Citation - WoS: 8
Citation - Scopus: 8
Thermoluminescence Properties of Zno Nanoparticles in the Temperature Range 10-300 K
(Springer, 2016) Isik, M.; Yildirim, T.; Gasanly, N. M.
Low-temperature thermoluminescence (TL) properties of ZnO nanoparticles grown by sol-gel method were investigated in the 10-300 K temperature range. TL glow curve obtained at 0.2 K/s constant heating rate exhibited one broad peak around 83 K. The observed peak was analyzed using curve fitting method to determine the activation energies of trapping center(s) responsible for glow curve. Analyses resulted in the presence of three peaks at 55, 85 and 118 K temperatures with activation energies of 12, 30 and 45 meV, respectively. Thermal cleaning process was applied to separate overlapped peaks and get an opportunity to increase the reliability of results obtained from curve fitting method. Heating rate dependence of glow curve was also studied for rates between 0.2 and 0.7 K/s. The shift of the peak maximum temperatures to higher values and decrease in peak height with heating rate were observed. Moreover, X-ray diffraction and scanning electron microscopy were used for structural characterization.
Low Temperature Thermoluminescence of Quaternary Thallium Sulfide Tl₄inga_3<
(indian Assoc Cultivation Science, 2015) Delice, S.; Isik, M.; Bulur, E.; Gasanly, N. M.
Thermoluminescence measurements have been carried out on Tl4InGa3S8 single crystals in the temperature range of 10-300 K at various heating rates. The observed thermoluminescence spectra have been analyzed applying many methods like curve fitting, initial rise, peak shape and heating rate methods. Thermal cleaning method has been performed on the observed thermoluminescence glow curve to separate the overlapped peaks. Three distinctive trapping centers with activation energies of 13, 44 and 208 meV have been revealed from the results of the analysis. Heating rate dependence and traps distribution investigations have been also undertaken on the most intensive peak. The thermoluminescence mechanisms in the observed traps have been attributed to first order kinetics (slow retrapping) on the strength of the consistency between theoretical assumptions for slow retrapping process and experimental outcomes.

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