2 results
Search Results
Now showing 1 - 2 of 2
Book Part Discrete Scan Statistics Generated by Dependent Trials and Their Applications in Reliability(Springer New York, 2024) Eryilmaz,S.; Yalcin,F.The chapter is concerned with discrete scan statistic based on a sequence of dependent binary trials. In particular, the existing results are reviewed for the distribution of the discrete scan statistic based on a sequence of exchangeable binary trials. The results are discussed in the context of the reliability of the linear consecutive-k-within-m-out-of-n:F system, and a new exact formula for the reliability of the linear consecutive-2-within-m-out-of-n:F system that consists of arbitrarily dependent components is presented. © Springer Science+Business Media, LLC, part of Springer Nature 2024.Book Part Shocks, Scans, and Reliability Systems(Springer New York, 2024) Eryilmaz,S.This chapter summarizes the close connection between one of the widely studied shock models known as δ-shock model and runs/scans. Under discrete time setting, i.e., when the shocks occur according to a binomial process, the linkage between the lifetime of the system under the shock model and the waiting time for the first scan is presented. Such a useful connection may create a new perspective to study the reliability properties of the system under the δ-shock model. © Springer Science+Business Media, LLC, part of Springer Nature 2024.
