Discrete Scan Statistics Generated by Dependent Trials and Their Applications in Reliability

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2024

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Springer New York

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Industrial Engineering
(1998)
Industrial Engineering is a field of engineering that develops and applies methods and techniques to design, implement, develop and improve systems comprising of humans, materials, machines, energy and funding. Our department was founded in 1998, and since then, has graduated hundreds of individuals who may compete nationally and internationally into professional life. Accredited by MÜDEK in 2014, our student-centered education continues. In addition to acquiring the knowledge necessary for every Industrial engineer, our students are able to gain professional experience in their desired fields of expertise with a wide array of elective courses, such as E-commerce and ERP, Reliability, Tabulation, or Industrial Engineering Applications in the Energy Sector. With dissertation projects fictionalized on solving real problems at real companies, our students gain experience in the sector, and a wide network of contacts. Our education is supported with ERASMUS programs. With the scientific studies of our competent academic staff published in internationally-renowned magazines, our department ranks with the bests among other universities. IESC, one of the most active student networks at our university, continues to organize extensive, and productive events every year.

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Abstract

The chapter is concerned with discrete scan statistic based on a sequence of dependent binary trials. In particular, the existing results are reviewed for the distribution of the discrete scan statistic based on a sequence of exchangeable binary trials. The results are discussed in the context of the reliability of the linear consecutive-k-within-m-out-of-n:F system, and a new exact formula for the reliability of the linear consecutive-2-within-m-out-of-n:F system that consists of arbitrarily dependent components is presented. © Springer Science+Business Media, LLC, part of Springer Nature 2024.

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Dependence, Discrete scan statistics, Exchangeable random variables, Reliability

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Handbook of Scan Statistics

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197

End Page

204

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https://doi.org/10.1007/978-1-4614-8033-4_49
 https://hdl.handle.net/20.500.14411/10265

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