Shocks, Scans, and Reliability Systems
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Date
2024
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Springer New York
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Abstract
This chapter summarizes the close connection between one of the widely studied shock models known as δ-shock model and runs/scans. Under discrete time setting, i.e., when the shocks occur according to a binomial process, the linkage between the lifetime of the system under the shock model and the waiting time for the first scan is presented. Such a useful connection may create a new perspective to study the reliability properties of the system under the δ-shock model. © Springer Science+Business Media, LLC, part of Springer Nature 2024.
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Keywords
Reliability, Runs, Scans, Shock model
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Source
Handbook of Scan Statistics
Volume
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Start Page
569
End Page
574