Shocks, Scans, and Reliability Systems
| dc.contributor.author | Eryilmaz,S. | |
| dc.date.accessioned | 2024-11-05T20:20:02Z | |
| dc.date.available | 2024-11-05T20:20:02Z | |
| dc.date.issued | 2024 | |
| dc.description.abstract | This chapter summarizes the close connection between one of the widely studied shock models known as δ-shock model and runs/scans. Under discrete time setting, i.e., when the shocks occur according to a binomial process, the linkage between the lifetime of the system under the shock model and the waiting time for the first scan is presented. Such a useful connection may create a new perspective to study the reliability properties of the system under the δ-shock model. © Springer Science+Business Media, LLC, part of Springer Nature 2024. | en_US |
| dc.identifier.doi | 10.1007/978-1-4614-8033-4_66 | |
| dc.identifier.isbn | 978-146148033-4 | |
| dc.identifier.isbn | 978-146148032-7 | |
| dc.identifier.scopus | 2-s2.0-85207216202 | |
| dc.identifier.uri | https://doi.org/10.1007/978-1-4614-8033-4_66 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14411/10261 | |
| dc.language.iso | en | en_US |
| dc.publisher | Springer New York | en_US |
| dc.relation.ispartof | Handbook of Scan Statistics | en_US |
| dc.rights | info:eu-repo/semantics/closedAccess | en_US |
| dc.subject | Reliability | en_US |
| dc.subject | Runs | en_US |
| dc.subject | Scans | en_US |
| dc.subject | Shock model | en_US |
| dc.title | Shocks, Scans, and Reliability Systems | en_US |
| dc.type | Book Part | en_US |
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| gdc.author.institutional | Eryilmaz,S. | |
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| gdc.description.department | Atılım University | en_US |
| gdc.description.departmenttemp | Eryilmaz S., Department of Industrial Engineering, Atilim University, Incek, Ankara, Turkey | en_US |
| gdc.description.endpage | 574 | en_US |
| gdc.description.publicationcategory | Kitap Bölümü - Uluslararası | en_US |
| gdc.description.startpage | 569 | en_US |
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| gdc.virtual.author | Eryılmaz, Serkan | |
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