3 results
Search Results
Now showing 1 - 3 of 3
Article Citation - WoS: 11Citation - Scopus: 12Effect of Au Nanosandwiching on the Structural, Optical and Dielectric Properties of the as Grown and Annealed Inse Thin Films(Elsevier Science Bv, 2017) Omareya, Olfat A.; Qasrawi, A. F.; Al Garni, S. E.In the current work, the structural, optical and dielectric properties of the InSe/Au/InSe nanosandwiched structures are investigated by means of X-ray diffraction and UV-visible light spectrophotometry techniques. The insertion of a 20 and 100 nm thick Au metal slabs between two InSe layers did not alter the amorphous nature of the as grown InSe films but decreased the energy band gap and the free carrier density. It also increased; the absorption ratio and the values of dielectric constant by similar to 3 times. The insertion of 100 nm Au layers as a nanosandwich enhanced the drift mobility (31.3 cm(2)/V s) and plasmon frequency (1.53 GHz) of the InSe films. On the other hand, upon annealing, a metal induced crystallization process is observed for the InSe/Au (100 nm)/InSe sandwiches. Particularly, while the samples sandwiched with a layer of 20 nm thickness hardly revealed hexagonal gamma -In2Se3 when annealed at 300 degrees C, those sandwiched with 100 nm Au slab, displayed well crystalline phase of hexagonal gamma -In2Se3 at annealing temperature of 200 degrees C. The further annealing at 300 degrees C, forced the appearing of the orthorhombic In4Se3 phase. Optically, the annealing of the InSe/Au(100 nm)/InSe at 200 degrees C improved the absorption ratio by similar to 9 times and decreased the energy band gap. The nanosandwiching technique of InSe seems to be promising for the engineering of the optical properties of the InSe photovoltaic material.Article Citation - WoS: 9Citation - Scopus: 10Growth and Characterization of Inse/Ge Interfaces(Elsevier Gmbh, Urban & Fischer verlag, 2017) Al Garni, S. E.; Omareye, Olfat A.; Qasrawi, A. F.In the current study, we report the effect of insertion of a 200 nm thick Ge film between two layers of InSe. The Ge sandwiched InSe films are studied by means of X-ray diffraction technique, energy dispersion X-ray spectroscopy attached to a scanning electron microscope, optical spectrophotometry and light power dependent photoconductivity. It was observed that, The InSe prefers the growth of InSe monophase when deposited onto glass and the growth of gamma-In2Se3 when deposited onto InSe/Ge substrate. The three layers interface (InSe/Ge/gamma-In2Se3) exhibits a Ge induced crystallization process at annealing temperature of 200 degrees C. The optical analysis has shown that the InSe films exhibit a redshift upon Ge sandwiching. In addition, the conduction and valence bands offsets at the first interface (InSe/Ge) and at the second (Ge/gamma-In2Se3) interface are found to be 0.55 eV and 1.0 eV, and 0.40eVand 1.38 eV, respectively. Moreover, the photocurrent of the Ge sandwiched InSe exhibited higher photocurrent values as compared to those of InSe. On the other hand, the dielectric spectral analysis and modeling which lead to the identifying of the optical conduction parameters presented by the plasmon frequency, electron scattering time, free electron density and drift mobility have shown that the Ge sandwiching increased the drift mobility values from 10 cm(2)/Vs to 42 cm(2)/Vs. The main plasmon frequency also increased from 1.08 to 1.68 GHz. (C) 2017 Elsevier GmbH. All rights reserved.Article Citation - WoS: 9Citation - Scopus: 8Plasmon Interactions at the (ag, Al)/Inse Thin-Film Interfaces Designed for Dual Terahertz/Gigahertz Applications(Springer, 2017) Al Garni, S. E.; Omar, A.; Qasrawi, A. F.In this article, we investigate the plasmon-dielectric spectral interaction in the Ag/InSe and Al/InSe thin-film interfaces. The mechanism is explored by means of optical absorbance and reflectance at terahertz frequencies and by the impedance spectroscopy at gigahertz frequencies. It was observed that the interfacing of the InSe with Ag and Al metals with a film thickness of 250 nm causes an energy band gap shift that suits the production of thin-film optoelectronic devices. The reflectance and dielectric constant and optical conductivity spectral analysis of these devices displayed the properties of wireless band stop filters at 390 THz. The physical parameters which are computed from the conductivity spectra revealed higher mobility of charge carriers at the Al/InSe interface over that of Ag/InSe. The respective electron-bounded plasmon frequencies are found to be 2.61 and 2.13 GHz. On the other hand, the impedance spectral analysis displayed a microwave resonator feature with series resonance peak position at 1.68 GHz for the Al/InSe/Ag interface. In addition, the temperature-dependent impedance spectra, which were recorded in the temperature range of 300-420 K, revealed no significant effect of temperature on the wave trapping properties of the Al/InSe/Ag interface. The sensitivity of the interfaces to terahertz and gigahertz frequencies nominates it as laser light/microwave traps, which are used in fibers and communications.
