Browsing by Author "Al Garni, S. E."

Now showing 1 - 20 of 20

Citation - WoS: 9
Absorption and Optical Conduction in Inse/Znse Thin Film Transistors
(World Scientific Publ Co Pte Ltd, 2016) Al Garni, S. E.; Qasrawi, A. F.
In this work, (n)InSe/(p)ZnSe and (n)InSe/(p)ZnSe/(n)InSe heterojunction thin film transistor (TFT) devices are produced by the thermal evaporation technique. They are characterized by means of X-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersion X-ray spectroscopy and optical spectroscopy techniques. While the InSe films are found to be amorphous, the ZnSe and InSe/ZnSe films exhibited polycrystalline nature of crystallization. The optical analysis has shown that these devices exhibit a conduction band offsets of 0.47 and valence band offsets of 0.67 and 0.74 eV, respectively. In addition, while the dielectric spectra of the InSe and ZnSe displayed resonance peaks at 416 and 528 THz, the dielectric spectra of InSe/ZnSe and InSe/ZnSe/InSe layers indicated two additional peaks at 305 and 350 THz, respectively. On the other hand, the optical conductivity analysis and modeling in the light of free carrier absorption theory reflected low values of drift mobilities associated with incident alternating electric fields at terahertz frequencies. The drift mobility of the charge carrier particles at femtoseconds scattering times increased as a result of the ZnSe sandwiching between two InSe layers. The valence band offsets, the dielectric resonance at 305 and 350 THz and the optical conductivity values nominate TFT devices for use in optoelectronics.
Citation - WoS: 4
Citation - Scopus: 4
Characterization of Bi₂o_{3< Heterojunctions Designed for Visible Light Communications}
(Iop Publishing Ltd, 2019) Al Garni, S. E.; Qasrawi, A. F.
In the current work, the structural, morphological and optical properties of the Bi2O3/ZnS heterojunctions as visible light communication (VLC) technology element are explored. Bismuth oxide layers of thicknesses of 200 nm are used as substrate to evaporate ZnS films of thicknesses of 500 nm by the thermal evaporation technique under vacuum pressure of 10(-5) mbar. The heterojunction devices are studied by the x-ray diffraction, scanning electron microscopy, optical spectrophotometry and microwave spectroscopy techniques. The Bi2O3/ZnS heterojunctions are found to form a highly strained structure with extremely large lattice mismatches. By the strained structure and with the valence and conduction band offsets that exhibit values of 1.04 and 0.41 eV, respectively, it was possible to enhance the light absorbability of ZnS by 459 times at 3.10 eV. In addition, the dielectric constant spectra of the device display a linear and nonlinear optical properties below and above 1.94 eV, respectively. Moreover, the optical conductivity parameters including the drift mobility and plasmon frequency and the cutoff frequency spectra of an area of 0.50 cm(2) of Bi2O3/ZnS interfaces have shown the ability of using these heterojunction devices as light signal receivers that attenuate signals at terahertz frequencies in the range of 0.27-1.00 THz. As an additional demonstration, the Bi2O3/ZnS heterojunction devices were subjected to a microwave signal propagation in the frequency domain of 0.01-2.90 GHz. The device performed as band filters at gigahertz frequencies.
Citation - WoS: 6
Citation - Scopus: 6
Design and characterization of (Al, C)/p-Ge/p-BN/C isotype resonant electronic devices
(Wiley-v C H verlag Gmbh, 2015) Al Garni, S. E.; Qasrawi, A. F.
In this work, a Ge/BN isotype electronic device that works as a selective microwave bandstop filter is designed and characterized. The interface is designed using a 50-m thick p-type BN on a 0.2-m thick p-type germanium thin film. The modeling of current-voltage characteristics of the Al/Ge/BN/C channel of the device revealed that the current is dominated by thermionic emission and by the tunneling of charged particles through energy barriers. The evaluation of the conduction parameters reflected a resonant circuit with a peak-to-valley current ratio of (PVCR) of 63 at a peak (V-p) and valley (V-v) voltages of 1.84 and 2.30V, respectively. The ac signal analysis of the Al/Ge/BN/C channel that was carried out in the frequency range of 1.0-3.0GHz displayed a bandstop filter properties with notch frequency (f(n)) of 2.04GHz and quality factor (Q) of 102. The replacement of the Al electrode by C through the C/Ge/BN/C channel caused the disappearance of the PVCR and shifted f(n) and Q to 2.70GHz and 100, respectively. The features of the Ge/BN device are promising as they indicate the applicability of these sensors in communication technology.
Citation - WoS: 21
Citation - Scopus: 21
Design and Characterization of Moo₃ Heterojunctions
(Elsevier Science Bv, 2019) Al Garni, S. E.; Qasrawi, A. F.
In this work, the morphological, compositional, structural, optical and dielectric properties of CdSe which are deposited onto glass and onto MoO3 thin film substrates are investigated. The use of MoO3 as substrate for the growth of CdSe is observed to increase the lattice parameters of the hexagonal unit cell of CdSe and decreases the values of grain size and strain. It also forms band tails of width of 0.20 eV in the band gap of CdSe. The optical analysis has shown that the MoO3/CdSe interfacing results in blue shift in the energy band gap of CdSe and also result in large conduction and valence band of sets of values of 2.12 and 0.94 eV, respectively. The dielectric spectral analysis with the help of Prude-Lorentz approaches for optical conduction, revealed an enhancement in the drift mobility of charge carriers from 15.69 to 39.30 cm(2)/V as a response to the incident electromagnetic field. The free carrier density of the MoO3/CdSe being of the order of 10(17) cm(-3) with the large valence and conduction band offsets and the sufficiently large drift mobility nominates the MoO3/CdSe heterojunctions as an effective component of optoelectronic technology including thin film transistors.
Citation - WoS: 16
Citation - Scopus: 15
Design and Characterization of the Ge/Ga_{2< Heterojunction}
(Springer, 2017) Al Garni, S. E.; Qasrawi, A. F.
In this work, the formation and properties of Ga2S3 thin films deposited onto polycrystalline Ge substrates are studied by means of scanning electron microscopy, energy dispersive x-ray analyzer, Raman spectroscopy, x-ray diffraction techniques, ultraviolet-visible light spectrophotometry in the range of 300-1100 nm and by ac signal power spectroscopy in the range of 0.2-3.0 GHz. The first four techniques allowed the determining of the stoichiometry, the vibrational frequencies, the lattice parameters, the plane orientations, the strain and the defect density for the interface. In addition, it was observed that the Ge/Ga2S3 interface exhibited conduction and valence band offsets of 0.83 eV and 0.82 eV, respectively, and the real part of the dielectric spectra experimentally exhibited four resonance peaks centered at frequencies above 357 THz. Moreover, the computational analysis of the imaginary part of the dielectric constant via the Drude-Lorentz model has shown that the interface wave filtering properties are controlled by the electron-plasmon coupling with plasma frequencies in the range of 1.33-2.30 GHz. The drift mobility of electrons in this range was found to be 15.61 cm(2)/Vs. The real ability of the interface to control wave propagation was confirmed with ac signals propagating tests. The plasmonic features of the interface nominate it for use in microwave cavities and as wireless terahertz receivers.
Citation - WoS: 8
Citation - Scopus: 8
Design and performance of Yb/ZnS/C Schottky barriers
(Elsevier Science Bv, 2017) Khusayfan, Najla M.; Al Garni, S. E.; Qasrawi, A. F.
In this work, ZnS thin films are deposited onto glass and transparent ytterbium substrates under vacuum pressure of 10(-5) mbar. The effects of the Yb substrate on the structural, mechanical, optical, dielectric and electrical performance of the ZnS are explored by means of the energy dispersion X-ray analyzer, X-ray diffraction, UVeVIS spectroscopy, current-voltage characteristics and impedance spectroscopy techniques. The techniques allowed determining the lattice parameters, the grain size, the degree of orientation, the microstrain, the dislocation density, the optical and the excitonic gaps, the energy band offsets and the dielectric resonance and dispersion. The (111) oriented planes of glass/ZnS and Yb/ZnS exhibited 2.06% lattice mismatch between Yb and ZnS and degree of orientation values of 63% and 51.6%, respectively. The interfacing of the ZnS with Yb shrunk the energy band gap of ZnS by 0.50 eV. On the other hand, the electrical analysis on the Yb/ZnS/C Schottky device has revealed a rectification ratio of 3.48 x 10(4) at a biasing voltage of 0.30 V. The barrier height and ideality factor was also determined. Moreover, the impedance spectroscopy analysis have shown that the Yb/ZnS/C device is very attractive for use as varactor devices of wide tunability. The device could also be employed as microwave resonator above 1337 MHz. (C) 2016 Elsevier B. V. All rights reserved.
Citation - WoS: 11
Citation - Scopus: 12
Effect of Au Nanosandwiching on the Structural, Optical and Dielectric Properties of the as Grown and Annealed Inse Thin Films
(Elsevier Science Bv, 2017) Omareya, Olfat A.; Qasrawi, A. F.; Al Garni, S. E.
In the current work, the structural, optical and dielectric properties of the InSe/Au/InSe nanosandwiched structures are investigated by means of X-ray diffraction and UV-visible light spectrophotometry techniques. The insertion of a 20 and 100 nm thick Au metal slabs between two InSe layers did not alter the amorphous nature of the as grown InSe films but decreased the energy band gap and the free carrier density. It also increased; the absorption ratio and the values of dielectric constant by similar to 3 times. The insertion of 100 nm Au layers as a nanosandwich enhanced the drift mobility (31.3 cm(2)/V s) and plasmon frequency (1.53 GHz) of the InSe films. On the other hand, upon annealing, a metal induced crystallization process is observed for the InSe/Au (100 nm)/InSe sandwiches. Particularly, while the samples sandwiched with a layer of 20 nm thickness hardly revealed hexagonal gamma -In2Se3 when annealed at 300 degrees C, those sandwiched with 100 nm Au slab, displayed well crystalline phase of hexagonal gamma -In2Se3 at annealing temperature of 200 degrees C. The further annealing at 300 degrees C, forced the appearing of the orthorhombic In4Se3 phase. Optically, the annealing of the InSe/Au(100 nm)/InSe at 200 degrees C improved the absorption ratio by similar to 9 times and decreased the energy band gap. The nanosandwiching technique of InSe seems to be promising for the engineering of the optical properties of the InSe photovoltaic material.
Citation - WoS: 19
Citation - Scopus: 19
Effect of Indium Nano-Sandwiching on the Structural and Optical Performance of Znse Films
(Elsevier Science Bv, 2017) Al Garni, S. E.; Qasrawi, A. F.
In the current study, we attempted to explore the effects of the Indium nanosandwiching on the mechanical and optical properties of the physically evaporated ZnSe thin films by means of X-ray diffractions and ultraviolet spectrophotometry techniques. While the thickness of each layer of ZnSe was fixed at 1.0 mu m, the thickness of the nanosandwiched Indium thin films was varied in the range of 25- 100 nm. It was observed that the as grown ZnSe films exhibits cubic and hexagonal nature of crystallization as those of the ZnSe powders before the film deposition. The cubic phases weighs similar to 70% of the structure. The analysis of this phases revealed that there is a systematic variation process presented by the decreasing of; the lattice constant, compressing strain, stress, stacking faults and dislocation intensity and increasing grain size resulted from increasing the Indium layer thickness in the range of 50-100 nm. In addition, the nanosandwiching of Indium between two layers of ZnSe is observed to enhance the absorbability of the ZnSe. Particularly, at incident photon energy of 2.38 eV the absorbability of the ZnSe films which are sandwiched with 100 nm Indium is increased by 13.8 times. Moreover, increasing the thickness of the Indium layer shrinks the optical energy band gap. These systematic variations in mechanical and optical properties are assigned to the better recrystallization process that is associated with Indium insertion which in turn allows total internal energy redistribution in the ZnSe films through the enlargement of grains. (C) 2017 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY license.
Citation - WoS: 8
Citation - Scopus: 8
Effect of Lithium Nanosandwiching on the Structural, Optical and Dielectric Performance of Moo₃
(Elsevier, 2019) Al Garni, S. E.; Qasrawi, A. F.
In this article, we discuss the effects of lithium nanosheets on the structural, optical, dielectric and optical conductivity parameters of the MoO3 films. The nanosandwiching of Li layers between two layers of MoO3 of thicknesses larger than 20 nm induced the crystallization process of the amorphous MoO3. Namely, MoO3 thin films that are nanosandwiched with Li sheets of thicknesses larger than 50 nm, exhibit structural phase transitions from hexagonal to monoclinic and reveals larger crystallite sizes. The possible formation of Li2O at the MoO3/Li/MoO3 interfaces is simulated and discussed. Optically, the Li nanosandwiching is observed to enhance the light absorbability by 11.0 times at 2.0 eV and successfully engineered the energy bands gap in the range of 3.05-0.45 eV. It also enhances the dielectric performance. In addition, relatively thick layers of lithium (200 nm) succeeds in converting the conductivity type from n-to p-type. The modeling of the dielectric spectra in accordance with the Drude- Lorentz approach have shown that the presence of Li in the structure of MoO(3 )significantly increases the drift mobility values of electrons from 5.86 to 11.40 cm(2)/V. The plasmon frequency range for this system varies in the frequency domain of 0.32-5.94 GHz. The features of MoO3/Li/MoO3 interfaces make them attractive for thin film transistor technology as optical receivers being promising for use in optical communications.
Citation - WoS: 9
Citation - Scopus: 8
Exploring the Optical Dynamics in the Ito/As_{2< Interfaces}
(Springer, 2019) Al Garni, S. E.; Qasrawi, A. F.
In this work, the effects of indium tin oxide (ITO) substrates on the structural, compositional, optical dielectric and optical conduction properties of arsenic selenide thin films are investigated. The As2Se3 films which are prepared by the thermal deposition technique under vacuum pressure of 10(-5) mbar exhibit an induced crystallization process, improved stoichiometry, increased optical transmittance in the visible range of light and increased dielectric response in the infrared range of light upon replacement of glass substrates by ITO. The ITO/As2Se3 interfaces exhibit conduction and valence band offset values of 0.46 eV and 0.91 eV, respectively. The experimental optical conductivity spectra are theoretically reproduced with the help of the Drude-Lorentz approach for optical conduction. In accordance with this approach, owing to the improved crystallinity of the arsenic selenide, the deposition of As2Se3 onto ITO substrates increases the drift mobility value from similar to 17.6 cm(2)/Vs to 34.6 cm(2)/Vs. It also reduces the density of free carriers by one order of magnitude. The ITO/As2Se3/C heterojunction devices which are tested as band filters which may operate in the frequency domain of 0.01-3.0 GHz revealed low pass filter characteristics below 0.35 GHz and band pass filter characteristics in the remaining spectral range.
Citation - WoS: 10
Citation - Scopus: 10
Fabrication and Characterization of Yb/Moo_{3< Devices}
(Elsevier Science Bv, 2019) Al Garni, S. E.; Qasrawi, A. F.
In this study we have explored some of the properties of Yb/MoO3/(C, Yb) thin films as a multifunctional optoelectronic device. While the MoO3 films which are deposited onto glass substrate are found to be of amorphous nature, the Yb metal induced the growth of orthorhombic phase of MoO3. The films are high transparent and exhibit energy band gap value of 3.0 eV which make it sensitive to light signals in the near ultraviolet range of light. In addition, the frequency dependent capacitance-voltage characteristics of Yb/MoO3/(C,Yb) structure display pronounced accumulation, depletion and inversion regions that nominate it for use as tunable metal-oxide-semiconductor MOS device. The physical parameters including the built in voltage, barrier height, flat band and threshold voltages of the MOS capacitors are also determined. Furthermore, the current-voltage characteristics displayed high rectification ratio that could reach 1.26 x 10(4) at biasing voltage of 0.5 V nominating the Yb/MoO3/C device for use as electronic switches. On the other hand, the impedance spectroscopy analysis in the frequency domain of 0.01-1.80 GHz, have shown that the Yb/MoO3/Yb structures are more appropriate for microwave applications than Yb/MoO3/C device. The microwave cutoff frequency for the Yb sandwiched MoO3 exceeds 140 GHz. The return loss for the Yb/MoO3/Yb reaches 26 dB at 1.8 GHz. These values are attractive as they suit microwave low/high pass band fillers.
Citation - WoS: 5
Citation - Scopus: 5
Formation and Negative Capacitance Effect in Au/Bi_{2< Heterojunctions Designed as Microwave Resonators}
(Natl inst R&d Materials Physics, 2018) Al Garni, S. E.; Qasrawi, A. F.; Department of Electrical & Electronics Engineering
In this article, the physical design, energy band diagram, temperature dependent electrical resistivity and the impedance spectroscopy measurements of the Au/Bi2O3/ZnS/Ag isotype heterojunction devices are reported. The devices are prepared by the thermal evaporation technique under vacuum pressure of 10(-5) mbar. Structural, compositional and morphological studies has shown the presence of an expansion in the lattice of Bi2O3 associated with increased strain and dislocation density and decreased grain size as a result of ZnS interfacing. The design of the band diagram indicated that the formed heterojunction exhibit large valence and conduction band offsets that forces charge accumulation at the interface. The Au/Bi2O3/ZnS/Ag device displays negative capacitance (NC) effect in the frequency domain of 0.01-1.50 GHz. The NC effect is interrupted by a resonance-antiresonance phenomenon in the frequency domain of 0.90-1.07 GHz. In addition to the NC effects, the device under study exhibited reflection coefficient and return loss spectra that nominate it for use as microwave cavities or as low pass band filters.
Citation - WoS: 9
Citation - Scopus: 10
Growth and Characterization of Inse/Ge Interfaces
(Elsevier Gmbh, Urban & Fischer verlag, 2017) Al Garni, S. E.; Omareye, Olfat A.; Qasrawi, A. F.
In the current study, we report the effect of insertion of a 200 nm thick Ge film between two layers of InSe. The Ge sandwiched InSe films are studied by means of X-ray diffraction technique, energy dispersion X-ray spectroscopy attached to a scanning electron microscope, optical spectrophotometry and light power dependent photoconductivity. It was observed that, The InSe prefers the growth of InSe monophase when deposited onto glass and the growth of gamma-In2Se3 when deposited onto InSe/Ge substrate. The three layers interface (InSe/Ge/gamma-In2Se3) exhibits a Ge induced crystallization process at annealing temperature of 200 degrees C. The optical analysis has shown that the InSe films exhibit a redshift upon Ge sandwiching. In addition, the conduction and valence bands offsets at the first interface (InSe/Ge) and at the second (Ge/gamma-In2Se3) interface are found to be 0.55 eV and 1.0 eV, and 0.40eVand 1.38 eV, respectively. Moreover, the photocurrent of the Ge sandwiched InSe exhibited higher photocurrent values as compared to those of InSe. On the other hand, the dielectric spectral analysis and modeling which lead to the identifying of the optical conduction parameters presented by the plasmon frequency, electron scattering time, free electron density and drift mobility have shown that the Ge sandwiching increased the drift mobility values from 10 cm(2)/Vs to 42 cm(2)/Vs. The main plasmon frequency also increased from 1.08 to 1.68 GHz. (C) 2017 Elsevier GmbH. All rights reserved.
Citation - WoS: 14
Citation - Scopus: 15
Investigation of the Physical Properties of the Yb Nanosandwiched Cds Films
(Elsevier Science Sa, 2018) Abed, Tamara Y.; Qasrawi, A. F.; Al Garni, S. E.
In this study, the effects of the sandwiching of a 70 nm thick ytterbium film between two layers of CdS on the structural, compositional, optical and electrical properties are investigated. The X-ray diffraction, scanning electron microscopy, energy dispersion X-ray, visible light spectroscopy and impedance spectroscopy techniques are employed to achieve these effects. It was observed that, the nanosandwiching of Yb between two 500 nm thick films of CdS enhances the crystalline nature of the films without altering the lattice parameters. Particularly, the grain size is increased by 25%, the strain, the defect density and the stacking faults are reduced by 31.5%, 43.7% and 25%, respectively. Optically, the Yb nanosandwiching is observed to enhance the visible light absorbability by at least 2.7 times of the whole range and by 8 times at 1.64 eV. The enhancement of the absorbability is associated with shrinking in the band gap and more interband states. In addition, an increase in the real part of the dielectric constant by 54% is observed when Yb was nanosandwiched in the CdS structure. The modeling of the imaginary part allowed exploring the electron-plasmon interaction parameters. A remarkable increase in the drift mobility from 281 to 996 cm2/Vs associated with plasmon frequency enhancement from 0.84 to 1.38 GHz was determined upon Yb nanosandwiching. The effectiveness of this modeling was verified from the impedance spectra in the frequency domain of 0.01-1.80 GHz, which revealed wave trapping property of ideal values of return loss at notch frequency of 1.35 GHz. Furthermore, the electrical resistivity measurements on the studied samples have shown that the presence of Yb reduced the electrical resistivity and shifts the donor level closer to the conduction band of CdS. The studies nominate the nanosandwiched CdS for use in optical and microwave technologies as dual devices. (C) 2017 Elsevier B.V. All rights reserved.
Citation - WoS: 3
Citation - Scopus: 3
Optical Analysis of Ge/Mgo and Ge/Bn Thin Layers Designed for Terahertz Applications
(Elsevier Sci Ltd, 2015) Al Garni, S. E.; Qasrawi, A. F.
In this work, a 200 nm Ge thin film is used as a substrate to design Ge/MgO and Ge/BN layers. The optical dynamics in these devices are investigated by means of the reflectivity and the transmissivity measurements. Particularly, the details of the dielectric spectra and the values of the energy band gaps (E-g) are investigated. Below 350 THz, the construction of Ge/MgO and Ge/BN interfaces decreased the effective dielectric constant of Ge by 39% and by 76%, respectively. It also increased the quality factor of the Ge optical device from 150 to 1400 and to 940 at 300 THz. All the dispersive optical parameters are also evaluated. In addition, the direct/indirect E-g value of Ge which was determined as 1.15/0.72 eV is observed to shift down by a 0.13/0.42 and by a 023/0.54 eV for the Ge/MgO and Ge/BN devices, respectively. The sharp increase in the dielectric constant with decreasing frequency in the range of 353 273 THz, the dispersive optical parameters and the energy band gap attenuations of the optical structures are promising as they indicate the applicability of the Ge, Ge/MgO and Gel BN layers in terahertz sensing. The latter technology has a wide range of applications like medical and telecommunication devices. (C) 2014 Elsevier Ltd. All rights reserved.
Citation - WoS: 6
Citation - Scopus: 6
Physical Properties of the Bi_1.5zn_{0.92-2x< Solid Solutions}
(Elsevier Sci Ltd, 2016) Al Garni, S. E.; Qasrawi, A. F.; Mergen, A.
The Hf doping effect on the structural, compositional, optical, electrical and dielectric properties of the bismuth-zinc-niobium oxide pyrochlore ceramics is explored by means of scanning electron microscopy, energy dispersive X-ray spectroscopy, ultraviolet-visible light spectroscopy in the wavelength range of 200-1100 nm, temperature dependent electrical resistivity measurements in the range of 300-460 K and dielectric spectroscopy in the frequency range of 0.1-1.0 GHz. The optimum solubility limit in the Bi1.5Zn0.92-2xHfxNb1.5O6.92 solid solution is observed for the Hf content of 0.06. Increasing the Hf content from 0.03 to 0.06 decreased the room temperature, lattice constant, strain, dislocation density, optical energy band gap and electrical resistivity. It also increased the crystallite size and the dielectric constant. The energy band gap of the pure BZN (3.30 eV) decreased to 2.21 and reached 2.10 eV as the Hf content increased from 0.03 to 0.06. This behavior of the BZN suggests its suitability for optical applications of the visible region of light like photovoltaic devices. In addition, the remarkable increase in the dielectric constant from 258 to 280 and 456 nominates the Hf doped pyrochlore for passive mode operation devices like microwave capacitors. (C) 2015 Elsevier Ltd and Techna Group S.r.l. All rights reserved.
Citation - WoS: 9
Citation - Scopus: 8
Plasmon Interactions at the (ag, Al)/Inse Thin-Film Interfaces Designed for Dual Terahertz/Gigahertz Applications
(Springer, 2017) Al Garni, S. E.; Omar, A.; Qasrawi, A. F.
In this article, we investigate the plasmon-dielectric spectral interaction in the Ag/InSe and Al/InSe thin-film interfaces. The mechanism is explored by means of optical absorbance and reflectance at terahertz frequencies and by the impedance spectroscopy at gigahertz frequencies. It was observed that the interfacing of the InSe with Ag and Al metals with a film thickness of 250 nm causes an energy band gap shift that suits the production of thin-film optoelectronic devices. The reflectance and dielectric constant and optical conductivity spectral analysis of these devices displayed the properties of wireless band stop filters at 390 THz. The physical parameters which are computed from the conductivity spectra revealed higher mobility of charge carriers at the Al/InSe interface over that of Ag/InSe. The respective electron-bounded plasmon frequencies are found to be 2.61 and 2.13 GHz. On the other hand, the impedance spectral analysis displayed a microwave resonator feature with series resonance peak position at 1.68 GHz for the Al/InSe/Ag interface. In addition, the temperature-dependent impedance spectra, which were recorded in the temperature range of 300-420 K, revealed no significant effect of temperature on the wave trapping properties of the Al/InSe/Ag interface. The sensitivity of the interfaces to terahertz and gigahertz frequencies nominates it as laser light/microwave traps, which are used in fibers and communications.
Citation - WoS: 10
Citation - Scopus: 10
Post Annealing Effects on the Structural, Compositional, Optical and Dielectric Properties of Cd Doped Gase Thin Films
(Elsevier Science Sa, 2015) Al Garni, S. E.; Qasrawi, A. F.
In this work, the heat treatment effects at temperatures (T-a) of 200, 300 and 400 degrees C on the compositional, structural, optical and dielectric properties of Cd doped GaSe are explored by means of energy dispersive X-ray spectroscopy, X-ray diffraction and UV-VIS spectrophotometry. The annealing process of the Cd doped GaSe thin films revealed a highly oriented orthorhombic structure type that exhibit a systematic increase in the grain size. While the strain, degree of orientation and dislocation density of the annealed films are weakly affected by the annealing process. The optical energy band gap of the doped films decreased from 1.23 to 0.90 eV and the exponential energy band tails rose from 0.16 to 0.23 eV when the annealing temperature is raised from 300 to 400 degrees C. In addition, the analysis of the dielectric spectral curves which were studied in the frequency range of 270-1500 THz, allowed to investigate the oscillator and dispersion energies and the static (epsilon(s)) and lattice (epsilon(l)) dielectric constants. The annealing process on the doped samples decreased the dispersion and oscillator energies as well as es. Oppositely, el values increased from 12.52 to 24.45 as a result of larger grain size and less defect density associated with annealing process when T-a is raised from 200 to 400 degrees C, respectively. (C) 2015 Elsevier B.V. All rights reserved.
Citation - Scopus: 1
Structural and Electrical Performance of Moo₃ Films Designed as Microwave Resonators
(inst Materials Physics, 2020) Al Garni, S. E.; Qasrawi, A. F.; Alharbi, S. R.; Department of Electrical & Electronics Engineering
In this work, the effect of the insertion of lithium slabs of thicknesses of 50 nm between stacked layers of MoO3 is considered. Stacked layers of MoO3 comprising lithium slabs are prepared by the thermal evaporation technique onto Au substrates under vacuum pressure of 10(-5) mbar. The effects of Li slabs are explored by the X-ray diffraction, scanning electron microscopy, current-voltage characteristics and impedance spectroscopy techniques in the frequency domain of 0.01-1.80 GHz. While the presence of Li slabs did not alter the amorphous nature of structure, it forced the growth of rod-like grains of diameters of 100-160 nm and lengths of 1.5 mu m. Electrically, the presence of Li in the samples enhanced the rectifying properties of the devices and force reverse to forward current ratios larger than 60 times. Li slabs also controlled the negative capacitance effect and resonance -antiresonance regions in the Au/MoO3/MoO3/C stacked layers. While the Au/MoO3/MoO3/C devices displayed high conductance and low impedance values in the studied frequency domain, the Au/MoO3/Li/MOO3/C devices exhibited low conductance and high impedance mode in the frequency domain of 0.01-0.59 GHz. It is also found that the presence of Li slabs improved the performance of the devices through driving it to exhibit lower reflection coefficient and high return loss values near 0.80 GHz. The features of the devices nominate them for use as RF-Microwave traps or resonators.
Citation - WoS: 10
Citation - Scopus: 9
Tunable Au/Ga_{2< Varactor Diodes Designed for High Frequency Applications}
(Natl inst R&d Materials Physics, 2017) Al Garni, S. E.; Qasrawi, A. F.; Department of Electrical & Electronics Engineering
In this work, the design and characterization of Au/Ga2S3/Yb Schottky barrier is investigated by means of transmittance electron microscopy (TEM), scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDXS), capacitance spectroscopy, capacitance (C)-voltage (V) characteristics and impedance spectroscopy techniques. The design of the energy band diagram of the amorphous Au/Ga2S3 interface revealed a theoretical energy barrier height (q phi(b)) and built in voltage (qV(bi)) of 2.04 and 1.88 eV, respectively. Experimentally, the qV(bi) was observed to be sensitive to the applied signal frequency. In addition, the capacitance spectra which were studied in the range of 10-1800 MHz, revealed resonance and antiresonance biasing dependent signal oscillations associated with negative capacitance values. On the other hand, impedance spectroscopy analysis revealed band pass/reject filtering properties in all the studied frequency range. The device exhibited a return loss, voltage standing wave ratio and power efficiency of 16.7 dB, 1.3 and 98.3% at 1400 MHz, respectively.