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Article Citation - WoS: 4Citation - Scopus: 4Thermally Controlled Band Gap Tuning in Cuo Nano Thin Films for Optoelectronic Applications(indian Assoc Cultivation Science, 2024) Delice, S.; Isik, M.; Gasanly, N. M.Temperature dependency of band gap in CuO nano thin films has been investigated by virtue of transmission experiments at different temperatures. Structural and morphological characterization were achieved using X-ray diffraction (XRD) and scanning electron microscopy (SEM) measurements. Analysis on the XRD diffractogram revealed the presence of monoclinic structure for the CuO. Average crystallite size was determined as 17.8 nm. Absorption characteristics in between 10 and 300 K were presented in the wavelength range of 360-1100 nm. The band gap of the CuO was found to be similar to 2.17 eV at 300 K using Tauc and spectral derivative methods. This value increased to similar to 2.24 eV at 10 K. Both methods showed that the band gap extended with decreasing temperature. Temperature dependency of the band gap was studied using Varshni relation. The band gap at absolute temperature, variation of the band gap with temperature and Debye temperature were calculated as 2.242 +/- 0.002 eV, - 5.4 +/- 0.2 x 10(-4) eV/K and 394 +/- 95 K, respectively.Article Citation - WoS: 1Citation - Scopus: 1Temperature-Dependent Current-Voltage Characteristics of p-gase0.75< Heterojunction(Springer Heidelberg, 2023) Isik, M.; Surucu, O.; Gasanly, N. M.GaSe0.75S0.25 having layered structure is a potential semiconductor compound for optoelectronics and two-dimensional materials technologies. Optical and structural measurements of the GaSe0.75S0.25 thin film grown on the glass substrate showed that the compound has hexagonal structure and band energy of 2.34 eV. GaSe0.75S0.25 thin film was also grown on the silicon wafer and p-GaSe0.75S0.25/n-Si heterojunction was obtained. To make the electrical characterization of this diode, temperature-dependent current-voltage (I-V) measurements were carried out between 240 and 360 K. Room temperature ideality factor and barrier height of the device were determined from the analyses of I-V plot as 1.90 and 0.87 eV, respectively. Temperature-dependent plots of these electrical parameters showed that the ideality factor decreases from 2.19 to 1.77, while barrier height increases to 0.94 from 0.71 eV when the temperature was increased from 240 to 360 K. The conduction mechanism in the heterojunction was studied considering the Gaussian distribution due to presence of inhomogeneity in barrier height. The analyses presented the mean zero-bias barrier height, zero-bias standard deviation, and Richardson constant.
