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Article Citation - WoS: 6Citation - Scopus: 7Construction of Self-Assembled Vertical Nanoflakes on Cztsse Thin Films(Iop Publishing Ltd, 2019) Terlemezoglu, M.; Surucu, O. Bayrakli; Colakoglu, T.; Abak, M. K.; Gullu, H. H.; Ercelebi, C.; Parlak, M.Cu2ZnSn(S, Se)(4) (CZTSSe) is a promising alternative absorber material to achieve high power conversion efficiencies, besides its property of involving low-cost and earth-abundant elements when compared to Cu(In, Ga) Se-2 (CIGS) and cadmium telluride (CdTe), to be used in solar cell technology. In this study, a novel fabrication technique was developed by utilizing RF sputtering deposition of CZTSSe thin films having a surface decorated with self-assembled nanoflakes. The formation of nanoflakes was investigated by detailed spectroscopic method of analysis in the effect of each stacked layer deposition in an optimized sequence and the size of nanoflakes by an accurate control of sputtering process including film thickness. Moreover, the effects of substrate temperature on the formation of nanoflakes on the film surface were discussed at a fixed deposition route. One of the main advantages arising from the film surface with self-assembled nanoflakes is the efficient light trapping which decreases the surface reflectance. As a result of the detailed production and characterization studies, it was observed that there was a possibility of repeatable and controllable fabrication sequence for the preparation of CZTSSe thin films with self-textured surfaces yielding low surface reflectance.Article Citation - WoS: 29Citation - Scopus: 28Optoelectronical Properties of Polycrystalline Β-Gase Thin Films(Wiley-v C H verlag Gmbh, 2006) Qasrawi, AF; Ahmad, MMSPolycrystalline beta-GaSe thin films were obtained by the thermal evaporation of GaSe crystals onto glass substrates kept at 300 degrees C under a pressure of 10(-5) Torr. The transmittance and reflectance of these films was measured in the incident photon energy range of 1.1-3.70 eV. The absorption coefficient spectral analysis in the sharp absorption region revealed a direct allowed transitions band gap of 1.83 eV. The data analysis allowed the identification of the dispersive optical parameters by calculating the refractive index in the wavelength region of 620-1100 nm. In addition, the photocurrent of the samples was studied as function of incident illumination-intensity and temperature. The photocurrent is found to exhibit sublinear and supralinear character above and below 270 K, respectively. The temperature dependent photocurrent data analysis allowed the calculation of photocurrent activation energies as 603, 119 and 45 meV being dominant in the temperature regions of 250-300 K, 180-240 K and 80-160 K, respectively. (c) 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.Article Citation - WoS: 8Citation - Scopus: 8Study of the Structural and Optical Properties of Thallium Gallium Disulfide (tlgas2) Thin Films Grown Via Thermal Evaporation(Iop Publishing Ltd, 2022) Isik, M.; Karatay, A.; Ech-Chergui, A. N.; Gasanly, N. M.Thallium gallium disulfide (TlGaS2) belonging to layered structured semiconducting family has been a significant compound due to its outstanding characteristics. Its layered characteristics take attention for two-dimensional (2D) material research area and thus TlGaS2 is known as promising layered compound to develop 2D materials for optoelectronic devices. To the best of our knowledge, the present work is the first one investigating TlGaS2 thin films grown by thermal evaporation method. The current study focused into the structural, morphological, and optical characteristics of thermally evaporated TlGaS2 thin films. X-ray diffraction pattern of the films exhibited one peak around 36.10 degrees which was associated with (-422) plane of the monoclinic crystalline structure. The atomic compositional ratio of Tl:Ga:S was found to be suitable for the chemical formula of TlGaS2. Scanning electron microscopy images showed uniformly and narrowly deposited nanoparticles with sizes varying between 100 and 200 nm. Room temperature transmission measurements were recorded to obtain the bandgap energy of the evaporated thin films. Tauc analyses indicated direct band gap energy of 2.60 eV. Finally, Urbach energy was obtained as 95 meV. The results of the present paper would provide valuable insight to 2D material technology to understand the potential device applications of the TlGaS2.Article Citation - WoS: 26Citation - Scopus: 26Fabrication and Some Physical Properties of Agin5s8< Thin Films(Elsevier Science Sa, 2004) Qasrawi, AF; Kayed, TS; Ercan, IAgIn5S8 thin films are deposited on glass substrates, kept at 300 K, by thermal evaporation of AgIn5S8 single crystals under the pressure of 10-5 Torr. The X-ray fluorescence analysis revealed that the films have a weight percentage of similar to11.5% Ag, 61.17% In, and 27.33% S which corresponds to 1:5:8 stoichiometric composition. X-ray analysis of the films reveals the polycrystalline nature of the films. The lattice parameter (a) of the films was calculated to be 10.784(5) Angstrom. The dark n-type electrical conductivity of the films was measured in the temperature range of 30-350 K. The conductivity data analysis shows that the thermionic emission of the charge carriers having activation energies of 147 and 224 meV in the temperature ranges of 130-230 and 240-350 K, respectively, are the dominant transport mechanism in the films. The variable range hopping transport mechanism is dominant below 130 K. The room temperature photocurrent-photon energy dependency predicts a band gap of 1.91 eV of the films. The illumination intensity-photocurrent dependency measured in the intensity range of 13-235 W cm(-2) reveals monomolecular recombination (linear) in the films and bimolecular recombination (sublinear) at the film surface corresponding to low and high applied illumination intensities, respectively. The time-dependant photocurrent measured at fixed illumination intensity reveals a response time of 0.85, 2.66 and 10.0 s in the time periods of 0-0.5, 0.5-1.0, and 1.0-10.0 s, respectively. (C) 2004 Elsevier B.V. All rights reserved.Article Citation - WoS: 45Citation - Scopus: 48Refractive Index, Band Gap and Oscillator Parameters of Amorphous Gase Thin Films(Wiley-v C H verlag Gmbh, 2005) Qasrawi, AF; Department of Electrical & Electronics EngineeringGaSe thin films are obtained by evaporating GaSe crystals onto ultrasonically cleaned glass substrates kept at room temperature under a pressure of similar to 10(-5) Torr. The X-ray analysis revealed that these films are of amorphous nature. The reflectance and transmittance of the films are measured in the incident photon energy range of 1.1-3.0 eV. The absorption coefficient spectral analysis revealed the existence of long and wide band tails of the localized states in the low absorption region. The band tails width is calculated to be 0.42 eV. The analysis of the absorption coefficient in the high absorption region revealed an indirect forbidden band gap of 1.93 eV. The transmittance analysis in the incidence photon wavelength range of 500-1100 nm allowed the determination of refractive index as function of wave length. The refractive index-wavelength variation leads to the determination of dispersion and oscillator energies as 31.23 and 3.90 eV, respectively. The static refractive index and static dielectric constant were also calculated as a result of the later data and found to be 9.0 and 3.0, respectively.Article Citation - WoS: 11Cd-Doping Effects on the Properties of Polycrystalline Α-in2se3< Thin Films(Wiley-v C H verlag Gmbh, 2002) Qasrawi, AFThe X-ray diffraction has revealed that the polycrystalline hexagonal structured alpha-In2Se3 thin films grown at substrate temperature of 200degreesC with the unit cell parameters a=4.03degreesA and c=19.23degreesA becomes polycrystalline hexagonal structured InSe with a unit cell parameters of a=4.00degreesA and c=16.63degreesA by Cd-doping. The analysis of the conductivity temperature dependence in the range 300-40 K revealed that the thermionic emission of charged carriers and the variable range hopping are the predominant conduction mechanism above and below 100 K, respectively. Hall measurements revealed that the mobility is limited by the scattering of charged carriers through the grain boundaries above 200 K and 120 K for the undoped and Cd-doped samples, respectively. The photocurrent (I-ph) increases with increasing illumination intensity (T) and decreasing temperature up to a maximum temperature of similar to100 K, below which I-ph is temperature invariant. It is found to have the monomolecular and bimolccular recombination characters at low and high illumination intensities, respectively. The Cd-doping increases the density of trapping states that changes the position of the dark Fermi level leading to the deviation from linearity in the dependence of I-ph on F at low illumination intensities.Article Citation - WoS: 3Citation - Scopus: 3Structural, Compositional and Optical Properties of Gallium Selenide Thin Films Doped With Cadmium(Wiley-v C H verlag Gmbh, 2008) Qasrawi, A. F.; Saleh, A. A.Polycrystalline cadmium doped gallium selenide thin films were obtained by the thermal co-evaporation of GaSe crystals and Cd grains onto glass substrates. The structural, compositional and optical properties of these films have been investigated by means of X-ray diffraction, energy dispersive X-ray analysis and UV-visible spectroscopy techniques, respectively. Particularly, the elemental analysis, the crystalline nature, the energy band gap, the refractive index, the dispersion energy and static dielectric constant have been identified. The absorption coefficient spectral analysis in the sharp absorption region revealed a direct forbidden energy band gap of 1.22 eV. The cadmium doping has caused a significant decrease in the values of the energy band gap and in all the dispersive optical parameters, as well. (C) 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinbeim.Article Citation - WoS: 5Citation - Scopus: 6Influence of Temperature on Optical Properties of Electron-Beam Znse Thin Film(Iop Publishing Ltd, 2020) Gullu, H. H.; Isik, M.; Gasanly, N. M.; Parlak, M.Structural and optical properties of ZnSe thin films grown by electron-beam evaporation technique were reported in the present paper. X-ray diffraction pattern exhibited a single peak around 27 degrees which is well-suited with cubic phase of the films. Energy dispersive X-ray spectroscopy analyses resulted in atomic composition ratio of Zn/Se nearly 1.0 which corresponds to the chemical formula of ZnSe. Transmission experiments were performed at various temperatures in between 10 and 300 K. The analyses of the transmission data showed that direct band gap energy of the ZnSe thin films increases from 2.72 to 2.83 eV as temperature was reduced to 10 K from room temperature. The Varshni and O'Donnell-Chen models giving the temperature-band gap energy relation were used to get various optical parameters of the evaporated thin films. Analyses resulted in absolute zero temperature band gap energy as 2.83 eV, temperature coefficient as -5.8 x 10(-4) eV K-1 and average phonon energy as 16 meV. Urbach tail state energies were also calculated using absorption coefficient in the low photon energy region as increasing from 173 meV (300 K) to 181 meV (10 K) with decreasing ambient temperature.
