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Article Citation - WoS: 2Citation - Scopus: 2Effects of Laser Excitation and Temperature on Ag/Gase0.5< Microwave Filters(Springer, 2014) Qasrawi, A. F.; Khanfar, H. K.The effects of temperature, illumination, and microwave signals on Ag/GaS0.5S0.5/C Schottky-type microwave filters have been investigated. The devices, which were produced from thin layers of GaSe0.5S0.5 single crystal, had room temperature barrier height and ideality factor of 0.65 eV and 3.28, respectively. Barrier height increased uniformly with increasing temperature, at 2.12 x 10(-2) eV/K, and the ideality factor approached ideality. The devices can even function at 95A degrees C. A current switching phenomenon from low to high injection ("On/Off") was also observed; this current switching appears at a particular voltage, V (s), that shifts toward lower values as the temperature is increased. When the devices were reverse-biased and illuminated with a laser beam of wavelength 406 nm, a readily distinguishable V (s) was observed that shifted with increasing laser power. When the devices were run in passive mode and excited with an ac signal of power 0.0-20.0 dBm and frequency 0.05-3.0 GHz they behaved as band filters that reject signals at 1.69 GHz. Device resistance was more sensitive to signal amplitude at low frequencies (50 MHz) than at high frequencies. The features of these Ag/GaS0.5S0.5/C Schottky devices imply that they may be used as optical switches, as self standing, low band-pass, band reject filters, and as high band-pass microwave filters.Conference Object Citation - WoS: 15Citation - Scopus: 15Refractive Index, Static Dielectric Constant, Energy Band Gap and Oscillator Parameters of Ga2ses Single Crystals(Wiley-v C H verlag Gmbh, 2007) Qasrawi, A. F.; Gasanly, N. M.The optical properties of Bridgman method grown Ga2SeS crystals have been investigated by means of room-temperature transmittance and reflectance spectral analysis. The optical data have revealed direct and indirect allowed transition band gaps of 2.49 and 2.10 eV, respectively. The room-temperature refractive index, which was calculated from the reflectance and transmittance data, allowed the identification of the dispersion and oscillator energies, static dielectric constant and static refractive index as 20.93 eV and 4.01 eV, 6.21 and 2.49, respectively.Article Citation - WoS: 4Citation - Scopus: 4Physical Properties of Neodymium Tin Oxide Pyrochlore Ceramics(de Gruyter Poland Sp Zoo, 2017) Saleh, Adli A.; Qasrawi, A. F.; Yumusak, G.; Mergen, A.In this work, physical properties of neodymium tin oxide pyrochlore ceramics prepared by solid state reaction technique are investigated by means of X-ray diffraction, scanning electron microscopy, ultraviolet-visible light (UV-Vis) spectrophotometry and temperature dependent electrical resistivity measurements. The pyrochlore is observed to have a cubic FCC crystal lattice with lattice parameter of 10.578 angstrom. The planes of the cubic cell are best oriented in the [2 2 2] direction. From the X-ray, the UV-Vis spectrophotometry and the electrical resistivity data analysis, the grain size, strain, dislocation density, optical and thermal energy band gaps, localized energy band tail states and resistivity activation energies are determined and discussed. The pyrochlore is observed to have an optical energy band gap of similar to 3.40 eV. This value corresponds to 365 nm UV light spectra which nominates the neodymium tin oxide pyrochlore ceramics for the use as UV sensors.Article Citation - WoS: 4Citation - Scopus: 4Optical Dynamics at the Au/Znpc Interfaces(Univ Fed Sao Carlos, dept Engenharia Materials, 2020) Qasrawi, A. F.; Zyoud, Hadeel M.In this work, the optical dynamics and the structural properties of the zinc phthalocyanine which are coated onto 150 nm thick Au substrates are studied by the X-ray diffraction and optical spectrophotometry techniques. The Au/ZnPc interfaces appears to be strongly affected by the large lattice mismatches at the interface. It is observed that the coating ZnPc onto Au substrates increases the light absorbability by 4.7 and 128.2 times in the visible and infrared regions of light, respectively. Au substrates activated the free carrier absorption mechanism in the ZnPc thin films in the infrared range of light. In addition, the transparent Au substrates forced narrowing the energy band gap in both of the Q and B bands. It also increased the dielectric constant value by similar to 3.5 times in the IR range. The enhancements in the optical properties of ZnPc that resulted from the thin Au substrates make the ZnPc more suitable for optoelectronic, nonlinear optical applications and for electromagnetic energy storage in the infrared range of light.Article Citation - WoS: 5Citation - Scopus: 6Photoelectronic and Electrical Properties of Tl2ingas4< Layered Crystals(Pergamon-elsevier Science Ltd, 2007) Qasrawi, A. F.; Gasanly, N. M.Tl2InGaS4 layered crystals are studied through the dark electrical conductivity, space charge limited current and illumination- and temperature-dependent photoconductivity measurements in the temperature regions of 220-350 K, 300-400 K and 200-350 K, respectively. The space charge limited current measurements revealed the existence of a single discrete trapping level located at 0.44 eV. The dark electrical conductivity showed the existence of two energy levels of 0.32 eV and 0.60 eV being dominant above and below 300 K, respectively. The photoconductivity measurements reflected the existence of two other energy levels located at 0.28 eV and 0.19 eV at high and low temperatures, respectively. The photocurrent is observed to increase with increasing temperature up to a maximum temperature of 330 K. The illumination dependence of photoconductivity is found to exhibit supralinear recombination in all the studied temperature ranges. The change in recombination mechanism is attributed to exchange in the behavior of sensitizing and recombination centers. (C) 2006 Elsevier Ltd. All rights reserved.Article Citation - WoS: 3Citation - Scopus: 4Effects of Ge Substrate on the Structural and Optical Conductivity Parameters of Bi2o3< Thin Films(Elsevier Gmbh, 2019) Alharbi, S. R.; Qasrawi, A. F.In this article the structural, optical and dielectric properties of a 200 nm thick Bi2O3 thin films which are deposited onto amorphous germanium substrate are reported. Both of the Ge and Bi2O3 thin films are prepared by the thermal evaporation technique under vacuum pressure of 10 s mbar. Bi2O3 thin films are found to prefer the monoclinic nature of structure with larger values of microstrain, dislocation density, stacking faults and smaller grain sizes upon replacement of the glass substrate by germanium. Optically, significant redshift in the energy band gap is observed when the films are grown onto Ge. The Ge/Bi2O3 heterojunctions exhibit a conduction and valence band offsets of value of 0.81 and 1.38 eV, respectively. In addition to the enhancement in the dielectric constant near the IR region, the Drude-Lorentz modeling of the Ge/Bi2O3 heterojunctions has shown remarkable effect of the Ge substrate on the optical conductivity parameters of Bi2O3. Particularly, the drift mobility increased by about one order of magnitude, the free hole density decreased by (similar to)24 times and the plasmon frequency ranges extended from 5.21 to 11.0 GHz to 2.59-12.80 GHz when germanium substrate is used. The optical features of the heterojunction nominate it for visible light communication technology.Article Citation - WoS: 11Citation - Scopus: 13Structural, optical, electrical and dielectric properties of Bi1.5Zn0.92Nb1.5-xNixO6.92-3x/2 solid solution(Taylor & Francis Ltd, 2012) Qasrawi, A. F.; Nazzal, E. M.; Mergen, A.The effects of Ni content on the structural, optical, dielectric and electrical properties of Bi1.5Zn0.92Nb1.5O6.92 pyrochlore ceramics have been investigated. Nickel atoms were inserted into pure samples in accordance to the composition Bi1.5Zn0.92Nb1.5-xNixO6.92-3x/2, with x varying from 0.07 to 0.40. The structural analysis revealed that a single phase of the pyrochlore compound can be obtained for x values of 0.07 and 0.10 only. Further increase in Ni caused the appearance of multiple phases. The optical energy band gaps are determined as 3.30, 3.35 and 3.52 eV for Ni content of 0.00, 0.07 and 0.10 respectively. The temperature dependent electrical resistivity and the frequency dependent capacitance are observed to increase with increasing Ni content. The resonance frequency, which was determined from the capacitance-frequency dependence, was observed to shift from 12.14 to 10.47 kHz as the x values increase from 0.00 to 0.10 respectively.Article Citation - WoS: 7Citation - Scopus: 6Temperature-Dependent Structural Transition, Electronic Properties and Impedance Spectroscopy Analysis of Tl2ingas4< Crystals Grown by the Bridgman Method(Elsevier Sci Ltd, 2018) Qasrawi, A. F.; Alkarem, Qotaibah A.; Gasanly, N. M.In this work, we report the temporary structural modifications associated with the in situ heating of the Tl2InGaS4 crystals in the temperature range of 300-420 K. The analysis of the X-ray diffraction patterns revealed the temperature-independent possible phase transformations between the monoclinic and triclinic phases. The temperature analysis of the lattice parameters, crystallite size, strain, dislocation density and stacking faults has shown a temporary enhancement in the crystallinity of this compound above 375 K. Significant increase in the grain size accompanied to decrease in the strain, defect density and stacking faults was observed above this temperature. The scanning electron microscopy imaging has shown that the crystals are layer structured with high quality layers of thicknesses of similar to 12 nm. In addition the energy dispersive X-ray analysis has shown that the crystal comprise no detectable impurity. Moreover, the room temperature optical characterizations has shown that the Tl2InGaS4 exhibit an energy band gap of 2.5 eV. The temperature dependent electrical resistivity measurements indicated highly resistive crystal with activation energy values of 0.84 and 0.19 eV above and below 375 K, respectively. On the other hand, room temperature impedance spectroscopy analysis in the frequency domain of 10-1800 MHz has shown that the crystal exhibits negative resistance and negative capacitance effects below and above 1580 MHz. The crystals are observed also to behave as band stop filter with notch frequency of 1711 MHz.Article Citation - WoS: 9Citation - Scopus: 9Design and Characterization of Au/In4< Field Effect Transistors(Elsevier Science Bv, 2018) Khusayfan, Najla M.; Qasrawi, A. F.; Khanfar, Hazem K.In the current work, the structural and electrical properties of the In4Se3/Ga2S3 interfaces are investigated. The X-ray analysis which concern the structural evolutions that is associated with the substrate type has shown that the hexagonal kappa-In2Se3 and the selenium (rhombohedral) rich orthorhombic In4Se3 phases of InSe are grown onto glass and gold substrates, respectively, at substrate of temperature of 300 degrees C in a vacuum media. The coating of the kappa-In2Se3 and of In4Se3 with amorphous layer of Ga2S3 is accompanied with uniform strain. The In4Se3/Ga2S3 interface is found to be of attractive quantum confinement features as it exhibited a conduction and valence band offsets of 0.20 and 1.86 eV, respectively. When the Au/In4Se3/Ga2S3 interface was contacted with carbon metallic point contact, it reveals a back to back Schottky hybrid device that behaves typically as metal-oxidesemiconductor field effect transition (MOSFET). The depletion capacitance analysis of this device revealed built in voltage values of 1.91 and 1.64 V at the Au and C sides, respectively. The designed MOSFET which is characterized in the frequency domain of 0.01-1.80 GHz is observed to exhibit, resonance-anti-resonance phenomena associated with negative capacitance effect in a wide domain of frequency that nominate it for applications in electronic circuits as parasitic capacitance minimizer, bus switching speed enhancer and low pass/high pass filter at microwave frequencies. (C) 2018 The Authors. Published by Elsevier B.V.Article Citation - WoS: 4Citation - Scopus: 4Mixed Conduction and Anisotropic Single Oscillator Parameters in Low Dimensional Tlinse2 Crystals(Elsevier Science Sa, 2013) Qasrawi, A. F.; Gasanly, N. M.Due to the importance of the TlInSe2 crystal as neutron and gamma-ray detectors, its electrical and dispersive optical parameters have been investigated. Particularly, the anisotropic current conduction mechanism in the temperature region of 100-350 K and the room temperature anisotropic dispersive optical properties were studied by means of electrical conductivity and optical reflectance, respectively. It has been shown that the mixed conduction is the most dominant transport mechanism in the TlInSe2 crystals. Particularly, when the electric field is applied perpendicular to the crystal's c-axis, the main dominant current transport mechanism is due to the mixed conduction and the variable range hopping above and below 160 K, respectively. When the electric field is applied parallel to the crystal's c-axis, the electrical conductivity is dominated by the thermionic emission, mixed conduction and variable range hopping at high, moderate and low temperatures, respectively. The optical reflectivity analysis in the wavelength range 210-1500 nm revealed a clear anisotropy effect on the dispersive optical parameters. Particularly, the static refractive index, static dielectric constant, dispersion energy and oscillator energy exhibited values of 2.50, 6.24, 20.72 eV and 3.96 eV, and values of 3.05, 9.33, 39.27 eV and 4.72 eV for light propagation parallel and perpendicular to the crystal's c-axis, respectively. Moreover, the frequency dependence of the dielectric constant, epsilon(omega), reflected strong dielectric anisotropy that exhibit maximum epsilon(omega) value of 38.80 and 11.40 at frequencies of 11.07 x 10(14) Hz for light propagation parallel and perpendicular to the crystal's c-axis, respectively. The anisotropy in the epsilon(omega) makes the TlInSe2 crystals attractive to be used as nonvolatile static memory devices. (C) 2013 Elsevier B.V. All rights reserved.
