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Article Citation - WoS: 14Citation - Scopus: 15Structural and Optical Properties of Ga2se3< Crystals by Spectroscopic Ellipsometry(Springer, 2019) Guler, I.; Isik, M.; Gasanly, N. M.; Gasanova, L. G.; Babayeva, R. F.Optical and crystalline structure properties of Ga2Se3 crystals were analyzed utilizing ellipsometry and x-ray diffraction (XRD) experiments, respectively. Components of the complex dielectric function (epsilon=epsilon(1)+i epsilon(2)) and refractive index (N=n+ik) of Ga2Se3 crystals were spectrally plotted from ellipsometric measurements conducted from 1.2eV to 6.2eV at 300K. From the analyses of second-energy derivatives of epsilon(1) and epsilon(2), interband transition energies (critical points) were determined. Absorption coefficient-photon energy dependency allowed us to achieve a band gap energy of 2.02eV. Wemple and DiDomenico single effective oscillator and Spitzer-Fan models were accomplished and various optical parameters of the crystal were reported in the present work.Article Citation - WoS: 4Citation - Scopus: 4Optical Characterization of (tlins2)0.5< Crystal by Ellipsometry: Linear and Optical Constants for Optoelectronic Devices(Springer, 2023) Guler, I.; Isik, M.; Gasanly, N.TlInSSe [(TlInS2)(0.5)(TlInSe2)(0.5)] crystals have garnered significant attention as promising candidates for optoelectronic applications due to their exceptional optoelectrical characteristics. This study focused on investigating the linear and nonlinear optical properties of TlInSSe layered single crystals through ellipsometry measurements. The X-ray diffraction analysis revealed the presence of four distinct peaks corresponding to a monoclinic crystalline structure. In-depth analysis was conducted to examine the variations of refractive index, extinction coefficient, and complex dielectric function within the energy range of 1.25-6.15 eV. By employing derivative analysis of the absorption coefficient and utilizing the Tauc relation, the indirect and direct bandgap energies of TlInSSe crystals were determined to be 2.09 and 2.26 eV, respectively. Furthermore, this research paper presents findings on oscillator energy, dispersion energy, Urbach energy, zero and high frequency dielectric constants, plasma frequency, carrier density to effective mass ratio, nonlinear refractive index, and first-order and third-order nonlinear susceptibilities of TlInSSe crystals.Article Citation - WoS: 1Citation - Scopus: 1Growth and Optical Properties of (na0.5bi0.5< (x=0.25) Single Crystal: a Potential Candidate for Optoelectronic Devices(Springer, 2024) Guler, I.; Isik, M.; Gasanly, N.Double tungstates (DT) and double molybdates (DM) have significant importance because of their optoelectronic applications. Regarding the importance of DT and DM, we investigated experimentally structural and optical properties of (Na0.5Bi0.5)(Mo1-xWx)O-4 (x = 0.25) crystal that belongs to the NaBi-DT and DM crystals group. Czochralski method was used to grow the single crystals. The structure of the crystal was identified using X-ray diffraction (XRD) measurements. Two sharp peaks associated with tetragonal crystal structure appeared in the pattern. Vibrational modes of the studied crystal were obtained from the Raman experiments. By the help of the Fourier transform infrared spectrophotometer (FTIR) measurements, infrared transmittance spectrum of the studied compound was recorded. Band gap energy wase found around 3.04 eV using two methods, Tauc and derivative analysis, based on transmission spectrum. Based on the analysis of absorption coefficient, Urbach energy was obtained as 0.22 eV. The revealed structural and optical properties of the crystal indicated that the material may be a candidate for optoelectronic devices in which NaBi(MoO4)(2) and NaBi(WO4)(2) materials are utilized.Article Citation - WoS: 4Citation - Scopus: 6Structural and Optical Properties of (tlins2)0.75< Thin Films Deposited by Thermal Evaporation(Springer, 2023) Guler, I.; Isik, M.; Gasanly, N.Layered semiconductor materials have become a serious research topic in recent years, thanks to their effective optical properties. In this article, the thin-film structure of Tl2In2S3Se [(TlInS2)(0.75)(TlInSe2)(0.25)] material with layered structure was grown by thermal evaporation method. The structural, morphological, and optical properties of the deposited thin films were examined. X-ray diffraction (XRD), energy-dispersive spectroscopy (EDS) and atomic force microscopy (AFM) techniques were used to get information about structural and morphological properties of the thin films. XRD pattern presented well-defined peaks associated with monoclinic crystalline structure. The crystallite size, dislocation density, and lattice strain of the films were also obtained from the analyses of XRD pattern. EDS analysis showed that atomic compositional ratios of the Tl, In, S, and Se elements are consistent with chemical formula of Tl2In2S3Se. The optical characterization of thin film was performed using transmission and Raman spectroscopy techniques. Raman spectrum offered information about the vibrational modes of the thin film. The analyses of the transmission spectrum presented the indirect and direct band gap energies of the Tl2In2S3Se thin film as 2.23 and 2.52 eV, respectively. The further analyses on the absorption coefficient resulted in Urbach energy of 0.58 eV.
