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Conference Object Citation - WoS: 15Citation - Scopus: 15Refractive Index, Static Dielectric Constant, Energy Band Gap and Oscillator Parameters of Ga2ses Single Crystals(Wiley-v C H verlag Gmbh, 2007) Qasrawi, A. F.; Gasanly, N. M.The optical properties of Bridgman method grown Ga2SeS crystals have been investigated by means of room-temperature transmittance and reflectance spectral analysis. The optical data have revealed direct and indirect allowed transition band gaps of 2.49 and 2.10 eV, respectively. The room-temperature refractive index, which was calculated from the reflectance and transmittance data, allowed the identification of the dispersion and oscillator energies, static dielectric constant and static refractive index as 20.93 eV and 4.01 eV, 6.21 and 2.49, respectively.Article Citation - WoS: 8Citation - Scopus: 8Spectroscopic ellipsometry study of Bi12TiO20 single crystals(Springer, 2021) Isik, M.; Gasanly, N. M.; Darvishov, N. H.; Bagiev, V. E.Bi12XO20 (X: Si, Ge, Ti, etc.) ternary compounds have attracted attention especially due to their fascinating photorefractive characteristics. The present paper introduces the structural and optical characteristics of Bi12TiO20 single crystals grown by Czochralski method. X-ray diffraction pattern of the compound exhibited sharp and intensive peaks corresponding to parallel planes of cubic crystalline structure. The lattice constant of the cubic structure was determined as a = 1.0118 nm using a diffraction pattern indexing program. The optical characterization of the Bi12TiO20 single crystals was carried through spectroscopic ellipsometry experiments performed in the 1.2-5.0 eV spectral range. The spectral dependencies of refractive index, extinction coefficient, and complex dielectric function were revealed analyzing experimental ellipsometric data under the light of sample-air optical model. The band gap energy of the compound was determined as 3.34 eV from the analyses of absorption coefficient. Three critical points at 3.51, 4.10, and 4.71 eV were obtained from the analyses of components of dielectric function using their second-energy derivative spectra.Article Citation - WoS: 14Citation - Scopus: 18Traps distribution in sol-gel synthesized ZnO nanoparticles(Elsevier, 2019) Delice, S.; Isik, M.; Gasanly, N. M.The distribution of shallow traps within the sol-gel synthesized ZnO nanoparticles was investigated using thermoluminescence (TL) experiments in the 10-300 K temperature range. TL measurements presented two overlapped peaks around 110 and 155 K. The experimental technique based on radiating the nanoparticles at different temperatures (T-exc.) between 60 and 125 K was carried out to understand the trap distribution characteristics of peaks. It was observed that peak maximum temperature shifted to higher values and activation energy (E-t) increased as irradiating temperature was increased. The E-t vs. T-exc. presented that ZnO nanoparticles have quasi-continuously distributed traps possessing activation energies increasing from 80 to 171 meV. (C) 2019 Elsevier B.V. All rights reserved.Article Citation - WoS: 8Citation - Scopus: 8Defect Characterization in Bi12geo20< Single Crystals by Thermoluminescence(Elsevier, 2021) Delice, S.; Isik, M.; Sarigul, N.; Gasanly, N. M.Bi12GeO20 single crystal grown by Czochralski method was investigated in terms of thermoluminescence (TL) properties. TL experiments were performed for various heating rates between 1 and 6 K/s in the temperature region of 300-675 K. One TL peak with peak maximum temperature of 557 K was observed in the TL spectrum as constant heating rate of 1 K/s was employed. Curve fitting, initial rise and variable heating rate methods were applied to calculate the activation energy of trap level corresponding to this TL peak. Analyses resulted in a presence of one trap center having mean activation energy of 0.78 eV. Heating rate characteristics of revealed trap center was also explored and theoretically well-known behavior that TL intensity decreases and peak maximum temperature increases with heating rates was observed for the trap level. Distribution of trapping levels was studied by thermally cleaning process for different T-stop between 425 and 525 K. Quasi-continuously distributed trapping levels were revealed with mean activation energies ranging from 0.78 to 1.26 eV. Moreover, absorption analysis revealed an optical transition taking place between a defect level and conduction band with an energy difference of 2.51 eV. These results are in good agreement for the presence of intrinsic defects above valence band in Bi12GeO20 crystals.Article Citation - WoS: 4Citation - Scopus: 5Thermoluminescence characteristics of GaSe and Ga2Se3 single crystals(Elsevier, 2022) Isik, M.; Sarigul, N.; Gasanly, N. M.GaSe and Ga2Se3 are semiconducting compounds formed from same constituent elements. These compounds have been attractive due to their optoelectronic and photovoltaic applications. Defects take remarkable attention since they affect quality of semiconductor devices. In the present paper, deep defect centers in GaSe and Ga2Se3 single crystals grown by Bridgman method were reported from the analyses of thermoluminescence measurements performed in the 350-675 K range. Experimental TL curves of GaSe and Ga2Se3 single crystals presented one and two overlapped peaks, respectively. The applied curve fitting and initial rise techniques were in good agreement about trap activation energies of 0.83 eV for GaSe, 0.96 and 1.24 eV for Ga2Se3 crystals. Crystalline structural properties of the grown single crystals were also investigated by x-ray diffraction measurements. The peaks observed in XRD patterns of the GaSe and Ga2Se3 crystals were well-consistent with hexagonal and zinc blende structures, respectively.Article Citation - WoS: 15Citation - Scopus: 16Investigation of Band Gap Energy Versus Temperature for Sns 2 Thin Films Grown by Rf-Magnetron Sputtering(Elsevier, 2020) Isik, M.; Gullu, H. H.; Terlemezoglu, M.; Surucu, O. Bayrakli; Parlak, M.; Gasanly, N. M.[No Abstract Available]Article Citation - WoS: 2Citation - Scopus: 2Investigation of Defect Levels in Bi12sio20< Single Crystals by Thermally Stimulated Current Measurements(Iop Publishing Ltd, 2021) Isik, M.; Delice, S.; Gasanly, N. M.Bi12SiO20 (BSO) single crystal belongs to the sillenite semiconducting family known as defective compounds. The present paper investigates the defect centers in BSO grown by Czochralski method by means of thermally stimulated current (TSC) measurements performed in the 10-260 K range. The TSC glow curve obtained at heating rate of beta = 0.1 K s(-1) presented several peaks associated with intrinsic defect centers. The activation energies of defect centers were revealed as 0.09, 0.15, 0.18, 0.22, 0.34, 0.70 and 0.82 eV accomplishing the curve fit analyses method. The peak maximum temperatures and orders of kinetics of each deconvoluted peak were also determined as an outcome of fitting process. TSC experiments were expanded by making the measurements at various heating rates between 0.1 and 0.3 K s(-1) to get information about the heating rate dependent peak parameters.Article Citation - WoS: 3Citation - Scopus: 3Observation of in Situ Enhanced Crystallization, Negative Resistance Effect and Photosensitivity in Tl2ingase4< Crystals(Elsevier Sci Ltd, 2021) Qasrawi, A. F.; Irshaid, Tahani M. A.; Gasanly, N. M.In this work, we report the properties of Tl2InGaSe4 crystals as multifunctional material. Namely, Tl2InGaSe4 crystals are grown by the modified Bridgman method using mixtures of TlInSe2 (50%) and TlGaSe2 (50%) single crystals. The enhanced crystallization and structural stabilities are monitored by the X-ray diffraction technique during the in situ heating and cooling cycles. The structural analyses on the Tl2InGaSe4 crystals revealed domination of both of the monoclinic and tetragonal phases in the crystals. In addition, the produced crystals are used to fabricate Schottky diodes. While the scanning electron microscopy has shown that the crystals are composed of layered nanosheets, the electrical analyses have shown that the crystals exhibit light photosensitivity of 12.7 under tungsten light illumination of 10 kLuxes. The attenuation in the electrical parameters of the Ag/Tl2InGaSe4/C diodes presented by series resistance, barrier height and ideality factor upon light excitations make them promising for applications in optoelectronics as switches and photodetectors. Moreover, the alternating electrical signals analyses on the capacitance spectra displayed resonance -antiresonance oscillations in the frequency domain of 83-100 MHz. The resistance spectra also exhibited negative resistance effect in the range of 55-135 MHz. These features of the device make it suitable for use as microwave resonators and memory devices as well.Article Citation - WoS: 4Citation - Scopus: 4Trapping Centers in Bi12tio20< Single Crystals by Thermally Stimulated Current(Elsevier, 2021) Isik, M.; Delice, S.; Gasanly, N. M.; Darvishov, N. H.; Bagiev, V. E.Sillenite group compounds have been widely utilized in photocatalytic applications. One of the member of this group, Bi12TiO20 single crystal, was grown by Czochralski method. The structural properties were investigated by x-ray diffraction (XRD) and scanning electron microscope (SEM) techniques. XRD pattern presented well-defined intensive peaks associated with cubic crystalline structure. SEM images indicated the crystal surface as almost uniform and smooth. Thermally stimulated current (TSC) experiments were performed in the 10-280 K temperature range to reveal shallow trapping centers in the Bi12TiO20 single crystal. Two peaks around 112 and 179 K were observed in the TSC glow curve. The analyses of these curves considering the curve fitting and peak shape techniques resulted in presence of two hole centers at 0.09 and 0.14 eV. Heating rate dependencies of peak maximum temperature and current were also investigated throughout the paper.Article Citation - WoS: 3Citation - Scopus: 3Temperature and Excitation Intensity Tuned Photoluminescence in Ga0.75in0.25< Crystals(Elsevier Science Bv, 2013) Isik, M.; Guler, I.; Gasanly, N. M.Photoluminescence (PL) spectra of Ga0.75In0.25Se layered single crystals have been studied in the wavelength range of 580-670 nm and temperature range of 7-59 K. Two PL emission bands centered at 613 nm (2.02 eV, A-band) and 623 nm (1.99 eV, B-band) were revealed at T = 7K. The excitation laser intensity dependence of the emission bands have been studied in the 0.06-1.40 W cm(-2) range. Radiative transitions from shallow donor levels located at E-A = 0.11 and E-B = 0.15 eV below the bottom of conduction band to single shallow acceptor level located at 0.01 eV above the valence band are suggested to be responsible for the observed A- and B-bands. A simple model was proposed to interpret the recombination processes in Ga0.75In0.25Se single crystals. (c) 2012 Elsevier B.V. All rights reserved.
