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Conference Object Citation - WoS: 15Citation - Scopus: 15Refractive Index, Static Dielectric Constant, Energy Band Gap and Oscillator Parameters of Ga2ses Single Crystals(Wiley-v C H verlag Gmbh, 2007) Qasrawi, A. F.; Gasanly, N. M.The optical properties of Bridgman method grown Ga2SeS crystals have been investigated by means of room-temperature transmittance and reflectance spectral analysis. The optical data have revealed direct and indirect allowed transition band gaps of 2.49 and 2.10 eV, respectively. The room-temperature refractive index, which was calculated from the reflectance and transmittance data, allowed the identification of the dispersion and oscillator energies, static dielectric constant and static refractive index as 20.93 eV and 4.01 eV, 6.21 and 2.49, respectively.Article Citation - WoS: 8Citation - Scopus: 8Spectroscopic ellipsometry study of Bi12TiO20 single crystals(Springer, 2021) Isik, M.; Gasanly, N. M.; Darvishov, N. H.; Bagiev, V. E.Bi12XO20 (X: Si, Ge, Ti, etc.) ternary compounds have attracted attention especially due to their fascinating photorefractive characteristics. The present paper introduces the structural and optical characteristics of Bi12TiO20 single crystals grown by Czochralski method. X-ray diffraction pattern of the compound exhibited sharp and intensive peaks corresponding to parallel planes of cubic crystalline structure. The lattice constant of the cubic structure was determined as a = 1.0118 nm using a diffraction pattern indexing program. The optical characterization of the Bi12TiO20 single crystals was carried through spectroscopic ellipsometry experiments performed in the 1.2-5.0 eV spectral range. The spectral dependencies of refractive index, extinction coefficient, and complex dielectric function were revealed analyzing experimental ellipsometric data under the light of sample-air optical model. The band gap energy of the compound was determined as 3.34 eV from the analyses of absorption coefficient. Three critical points at 3.51, 4.10, and 4.71 eV were obtained from the analyses of components of dielectric function using their second-energy derivative spectra.Article Citation - WoS: 14Citation - Scopus: 18Traps distribution in sol-gel synthesized ZnO nanoparticles(Elsevier, 2019) Delice, S.; Isik, M.; Gasanly, N. M.The distribution of shallow traps within the sol-gel synthesized ZnO nanoparticles was investigated using thermoluminescence (TL) experiments in the 10-300 K temperature range. TL measurements presented two overlapped peaks around 110 and 155 K. The experimental technique based on radiating the nanoparticles at different temperatures (T-exc.) between 60 and 125 K was carried out to understand the trap distribution characteristics of peaks. It was observed that peak maximum temperature shifted to higher values and activation energy (E-t) increased as irradiating temperature was increased. The E-t vs. T-exc. presented that ZnO nanoparticles have quasi-continuously distributed traps possessing activation energies increasing from 80 to 171 meV. (C) 2019 Elsevier B.V. All rights reserved.Article Citation - WoS: 8Citation - Scopus: 8Defect Characterization in Bi12geo20< Single Crystals by Thermoluminescence(Elsevier, 2021) Delice, S.; Isik, M.; Sarigul, N.; Gasanly, N. M.Bi12GeO20 single crystal grown by Czochralski method was investigated in terms of thermoluminescence (TL) properties. TL experiments were performed for various heating rates between 1 and 6 K/s in the temperature region of 300-675 K. One TL peak with peak maximum temperature of 557 K was observed in the TL spectrum as constant heating rate of 1 K/s was employed. Curve fitting, initial rise and variable heating rate methods were applied to calculate the activation energy of trap level corresponding to this TL peak. Analyses resulted in a presence of one trap center having mean activation energy of 0.78 eV. Heating rate characteristics of revealed trap center was also explored and theoretically well-known behavior that TL intensity decreases and peak maximum temperature increases with heating rates was observed for the trap level. Distribution of trapping levels was studied by thermally cleaning process for different T-stop between 425 and 525 K. Quasi-continuously distributed trapping levels were revealed with mean activation energies ranging from 0.78 to 1.26 eV. Moreover, absorption analysis revealed an optical transition taking place between a defect level and conduction band with an energy difference of 2.51 eV. These results are in good agreement for the presence of intrinsic defects above valence band in Bi12GeO20 crystals.Article Citation - WoS: 4Citation - Scopus: 5Thermoluminescence characteristics of GaSe and Ga2Se3 single crystals(Elsevier, 2022) Isik, M.; Sarigul, N.; Gasanly, N. M.GaSe and Ga2Se3 are semiconducting compounds formed from same constituent elements. These compounds have been attractive due to their optoelectronic and photovoltaic applications. Defects take remarkable attention since they affect quality of semiconductor devices. In the present paper, deep defect centers in GaSe and Ga2Se3 single crystals grown by Bridgman method were reported from the analyses of thermoluminescence measurements performed in the 350-675 K range. Experimental TL curves of GaSe and Ga2Se3 single crystals presented one and two overlapped peaks, respectively. The applied curve fitting and initial rise techniques were in good agreement about trap activation energies of 0.83 eV for GaSe, 0.96 and 1.24 eV for Ga2Se3 crystals. Crystalline structural properties of the grown single crystals were also investigated by x-ray diffraction measurements. The peaks observed in XRD patterns of the GaSe and Ga2Se3 crystals were well-consistent with hexagonal and zinc blende structures, respectively.Article Citation - WoS: 17Citation - Scopus: 18Investigation of Band Gap Energy Versus Temperature for Sns 2 Thin Films Grown by Rf-Magnetron Sputtering(Elsevier, 2020) Isik, M.; Gullu, H. H.; Terlemezoglu, M.; Surucu, O. Bayrakli; Parlak, M.; Gasanly, N. M.[No Abstract Available]Article Citation - WoS: 5Citation - Scopus: 5Structural and Optical Properties of Thermally Evaporated (gase)0.75-(gas)0.25 Thin Films(Elsevier Gmbh, 2021) Isik, M.; Işık, Mehmet; Emir, C.; Gasanly, N. M.; Işık, Mehmet; Department of Electrical & Electronics Engineering; Department of Electrical & Electronics EngineeringGaSe and GaS binary semiconducting compounds are layered structured and have been an attractive research interest in two-dimensional material research area. The present paper aims at growing (GaSe)0.75 - (GaS)0.25 (or simply GaSe0.75S0.25) thin film and investigating its structural and optical properties. Thin films were prepared by thermal evaporation technique using evaporation source of its single crystal grown by Bridgman method. The structural properties were revealed using x-ray diffraction (XRD), energy dispersive spectroscopy (EDS), scanning electron microscopy (SEM) and atomic force microscopy (AFM) techniques. XRD pattern and EDS analyses indicated that thin films annealed at 300 ?C were successfully deposited and its structural characteristics are well-consistent with its single crystal form. Surface morphology was studied by means of SEM and AFM measurements. Optical properties were investigated by transmission and Raman spectroscopy techniques. Raman spectrum exhibited three peaks around 172, 242 and 342 cm-1. Analyses of transmission spectrum revealed the direct band gap energy as 2.34 eV. The mixed compounds of GaSe0.75S0.25 were prepared for the first time in a thin film form and the results of the present paper would provide valuable information to research area in which layered compounds have been studied in detail.Article Citation - WoS: 19Citation - Scopus: 19Temperature-Dependent Band Gap Characteristics of Bi12sio20< Single Crystals(Amer inst Physics, 2019) Isik, M.; Delice, S.; Gasanly, N. M.; Darvishov, N. H.; Bagiev, V. E.Bi12SiO20 single crystals have attracted interest due to their remarkable photorefractive characteristics. Since bandgap and refractive index are related theoretically to each other, it takes much attention to investigate temperature dependency of bandgap energy to understand the behavior of photorefractive crystals. The present study aims at investigating structural and optical characteristics of photorefractive Bi12SiO20 single crystals grown by the Czochralski method. The structural characterization methods indicated that atomic composition ratios of constituent elements were well-matched with the chemical compound Bi12SiO20, and grown crystals have a cubic crystalline structure. Optical properties of crystals were investigated by room temperature Raman spectroscopy and temperature-dependent transmission measurements between 10 and 300 K. The analyses of transmittance spectra by absorption coefficient and derivative spectrophotometry techniques resulted in energy bandgaps decreasing from 2.61 to 2.48 eV and 2.64 to 2.53 eV as temperature was increased from 10 to 300 K. The Varshni model was applied to analyze temperature-bandgap energy dependency.Article Citation - WoS: 5Citation - Scopus: 6Photoelectronic and Electrical Properties of Tl2ingas4< Layered Crystals(Pergamon-elsevier Science Ltd, 2007) Qasrawi, A. F.; Gasanly, N. M.Tl2InGaS4 layered crystals are studied through the dark electrical conductivity, space charge limited current and illumination- and temperature-dependent photoconductivity measurements in the temperature regions of 220-350 K, 300-400 K and 200-350 K, respectively. The space charge limited current measurements revealed the existence of a single discrete trapping level located at 0.44 eV. The dark electrical conductivity showed the existence of two energy levels of 0.32 eV and 0.60 eV being dominant above and below 300 K, respectively. The photoconductivity measurements reflected the existence of two other energy levels located at 0.28 eV and 0.19 eV at high and low temperatures, respectively. The photocurrent is observed to increase with increasing temperature up to a maximum temperature of 330 K. The illumination dependence of photoconductivity is found to exhibit supralinear recombination in all the studied temperature ranges. The change in recombination mechanism is attributed to exchange in the behavior of sensitizing and recombination centers. (C) 2006 Elsevier Ltd. All rights reserved.Article Citation - WoS: 5Citation - Scopus: 5Low-Temperature Thermoluminescence in Layered Structured Ga0.75in0.25< Single Crystals(Elsevier Science Sa, 2012) Isik, M.; Bulur, E.; Gasanly, N. M.Defect centers in Ga0.75In0.25Se single crystals have been studied performing the thermoluminescence measurements in the temperature range of 10-300 K. The observed glow curves were analyzed using curve fitting, initial rise, and different heating rate methods to determine the activation energies of the defect centers. Thermal cleaning process has been applied to decompose the overlapped curves. Four defect centers with activation energies of 9, 45,54 and 60 meV have been found as a result of the analysis. The capture cross sections and attempt-to-escape frequencies of the defect centers were also found using the curve fitting method under the light of theoretical predictions. The first order kinetics for the observed glow curve was revealed from the consistency between the theoretical predictions for slow retrapping and experimental results. Another indication of negligible retrapping was the independency of peak position from concentration of carriers trapped in defect levels. (C) 2012 Elsevier B.V. All rights reserved.
