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Article Citation - Scopus: 1Structural and Electrical Performance of Moo3 Films Designed as Microwave Resonators(inst Materials Physics, 2020) Al Garni, S. E.; Qasrawi, A. F.; Alharbi, S. R.; Department of Electrical & Electronics EngineeringIn this work, the effect of the insertion of lithium slabs of thicknesses of 50 nm between stacked layers of MoO3 is considered. Stacked layers of MoO3 comprising lithium slabs are prepared by the thermal evaporation technique onto Au substrates under vacuum pressure of 10(-5) mbar. The effects of Li slabs are explored by the X-ray diffraction, scanning electron microscopy, current-voltage characteristics and impedance spectroscopy techniques in the frequency domain of 0.01-1.80 GHz. While the presence of Li slabs did not alter the amorphous nature of structure, it forced the growth of rod-like grains of diameters of 100-160 nm and lengths of 1.5 mu m. Electrically, the presence of Li in the samples enhanced the rectifying properties of the devices and force reverse to forward current ratios larger than 60 times. Li slabs also controlled the negative capacitance effect and resonance -antiresonance regions in the Au/MoO3/MoO3/C stacked layers. While the Au/MoO3/MoO3/C devices displayed high conductance and low impedance values in the studied frequency domain, the Au/MoO3/Li/MOO3/C devices exhibited low conductance and high impedance mode in the frequency domain of 0.01-0.59 GHz. It is also found that the presence of Li slabs improved the performance of the devices through driving it to exhibit lower reflection coefficient and high return loss values near 0.80 GHz. The features of the devices nominate them for use as RF-Microwave traps or resonators.Article Citation - WoS: 9Absorption and Optical Conduction in Inse/Znse Thin Film Transistors(World Scientific Publ Co Pte Ltd, 2016) Al Garni, S. E.; Qasrawi, A. F.In this work, (n)InSe/(p)ZnSe and (n)InSe/(p)ZnSe/(n)InSe heterojunction thin film transistor (TFT) devices are produced by the thermal evaporation technique. They are characterized by means of X-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersion X-ray spectroscopy and optical spectroscopy techniques. While the InSe films are found to be amorphous, the ZnSe and InSe/ZnSe films exhibited polycrystalline nature of crystallization. The optical analysis has shown that these devices exhibit a conduction band offsets of 0.47 and valence band offsets of 0.67 and 0.74 eV, respectively. In addition, while the dielectric spectra of the InSe and ZnSe displayed resonance peaks at 416 and 528 THz, the dielectric spectra of InSe/ZnSe and InSe/ZnSe/InSe layers indicated two additional peaks at 305 and 350 THz, respectively. On the other hand, the optical conductivity analysis and modeling in the light of free carrier absorption theory reflected low values of drift mobilities associated with incident alternating electric fields at terahertz frequencies. The drift mobility of the charge carrier particles at femtoseconds scattering times increased as a result of the ZnSe sandwiching between two InSe layers. The valence band offsets, the dielectric resonance at 305 and 350 THz and the optical conductivity values nominate TFT devices for use in optoelectronics.Article Citation - WoS: 10Citation - Scopus: 9Tunable Au/Ga2< Varactor Diodes Designed for High Frequency Applications(Natl inst R&d Materials Physics, 2017) Al Garni, S. E.; Qasrawi, A. F.; Department of Electrical & Electronics EngineeringIn this work, the design and characterization of Au/Ga2S3/Yb Schottky barrier is investigated by means of transmittance electron microscopy (TEM), scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDXS), capacitance spectroscopy, capacitance (C)-voltage (V) characteristics and impedance spectroscopy techniques. The design of the energy band diagram of the amorphous Au/Ga2S3 interface revealed a theoretical energy barrier height (q phi(b)) and built in voltage (qV(bi)) of 2.04 and 1.88 eV, respectively. Experimentally, the qV(bi) was observed to be sensitive to the applied signal frequency. In addition, the capacitance spectra which were studied in the range of 10-1800 MHz, revealed resonance and antiresonance biasing dependent signal oscillations associated with negative capacitance values. On the other hand, impedance spectroscopy analysis revealed band pass/reject filtering properties in all the studied frequency range. The device exhibited a return loss, voltage standing wave ratio and power efficiency of 16.7 dB, 1.3 and 98.3% at 1400 MHz, respectively.Article Citation - WoS: 5Citation - Scopus: 5Formation and Negative Capacitance Effect in Au/Bi2< Heterojunctions Designed as Microwave Resonators(Natl inst R&d Materials Physics, 2018) Al Garni, S. E.; Qasrawi, A. F.; Department of Electrical & Electronics EngineeringIn this article, the physical design, energy band diagram, temperature dependent electrical resistivity and the impedance spectroscopy measurements of the Au/Bi2O3/ZnS/Ag isotype heterojunction devices are reported. The devices are prepared by the thermal evaporation technique under vacuum pressure of 10(-5) mbar. Structural, compositional and morphological studies has shown the presence of an expansion in the lattice of Bi2O3 associated with increased strain and dislocation density and decreased grain size as a result of ZnS interfacing. The design of the band diagram indicated that the formed heterojunction exhibit large valence and conduction band offsets that forces charge accumulation at the interface. The Au/Bi2O3/ZnS/Ag device displays negative capacitance (NC) effect in the frequency domain of 0.01-1.50 GHz. The NC effect is interrupted by a resonance-antiresonance phenomenon in the frequency domain of 0.90-1.07 GHz. In addition to the NC effects, the device under study exhibited reflection coefficient and return loss spectra that nominate it for use as microwave cavities or as low pass band filters.
