Filters

2017 - 20192
Reset filters

Settings

Subject: NIST test suiteWoS Q: Q2

Search Results

Now showing 1 - 2 of 2
  • Thumbnail Image
    Article
    Citation - WoS: 8
    Periodic Template Tests: a Family of Statistical Randomness Tests for a Collection of Binary Sequences
    (Elsevier, 2019) Sulak, Fatih; Doganaksoy, Ali; Uguz, Muhiddin; Kocak, Onur
    In this work, we classify all templates according to their periods and for each template we evaluate the exact probabilities using generating functions. Afterwards, we propose a new family of statistical randomness tests, that is periodic template tests, for a collection of binary sequences. We apply these tests to the outputs of AES, SHA-3, SHA-2 family, SHA-1 and MD5 and the binary expansion of pi and root 2 and biased non-random data to test the power of new tests. Moreover, we give the probabilities for all templates for the overlapping template matching test in the NIST test suite. Afterwards, we analyse the power of templates and compare the periodic template tests with NIST overlapping template test. (C) 2019 Elsevier B.V. All rights reserved.
  • Thumbnail Image
    Article
    Citation - WoS: 3
    Citation - Scopus: 3
    New Statistical Randomness Tests: 4-Bit Template Matching Tests
    (Tubitak Scientific & Technological Research Council Turkey, 2017) Sulak, Fatih
    For cryptographic algorithms, secret keys should be generated randomly as the security of the system depends on the key and therefore generation of random sequences is vital. Randomness testing is done by means of statistical randomness tests. In this work, we show that the probabilities for the overlapping template matching test in the NIST test suite are only valid for a specific template and need to be recalculated for the other templates. We calculate the exact distribution for all 4-bit templates and propose new randomness tests, namely template matching tests. The new tests can be applied to any sequence of minimum length 5504 whereas the overlapping template matching test in the NIST test suite can only be applied to sequences of minimum length 10(6). Moreover, we apply the proposed tests to biased nonrandom data and observe that the new tests detect the nonrandom behavior of the generator even for a bias of 0.001, whereas the template matching tests in NIST cannot detect that bias.