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Article Citation - WoS: 5Citation - Scopus: 5Structural and Optical Properties of Thermally Evaporated (gase)0.75-(gas)0.25 Thin Films(Elsevier Gmbh, 2021) Isik, M.; Işık, Mehmet; Emir, C.; Gasanly, N. M.; Işık, Mehmet; Department of Electrical & Electronics Engineering; Department of Electrical & Electronics EngineeringGaSe and GaS binary semiconducting compounds are layered structured and have been an attractive research interest in two-dimensional material research area. The present paper aims at growing (GaSe)0.75 - (GaS)0.25 (or simply GaSe0.75S0.25) thin film and investigating its structural and optical properties. Thin films were prepared by thermal evaporation technique using evaporation source of its single crystal grown by Bridgman method. The structural properties were revealed using x-ray diffraction (XRD), energy dispersive spectroscopy (EDS), scanning electron microscopy (SEM) and atomic force microscopy (AFM) techniques. XRD pattern and EDS analyses indicated that thin films annealed at 300 ?C were successfully deposited and its structural characteristics are well-consistent with its single crystal form. Surface morphology was studied by means of SEM and AFM measurements. Optical properties were investigated by transmission and Raman spectroscopy techniques. Raman spectrum exhibited three peaks around 172, 242 and 342 cm-1. Analyses of transmission spectrum revealed the direct band gap energy as 2.34 eV. The mixed compounds of GaSe0.75S0.25 were prepared for the first time in a thin film form and the results of the present paper would provide valuable information to research area in which layered compounds have been studied in detail.Article Citation - WoS: 1Citation - Scopus: 2Spectroscopic Ellipsometry Studies of Optical Properties of Tlin(s0.25se0.75< Crystal(Springer Heidelberg, 2023) Guler, I.; Isik, M.; Gasanly, N.The optical properties of TlIn(S0.25Se0.75)(2) crystals were studied by ellipsometry measurements. X-ray diffraction pattern presented well-defined peaks associated with monoclinic structure. Energy dependent graphs of various linear optical parameters of the crystal were presented in the 1.25-4.50 eV range. The band gap and Urbach energies of the compound were found as 1.96 and 0.68 eV, respectively, from the analyses of the absorption coefficient. Refractive index spectrum was analyzed considering the single-effective-oscillator model to get oscillator and dispersion energies, zero and high frequency dielectric constants, plasma frequency. Moreover, the nonlinear refractive index, first-order and third-order nonlinear susceptibilities of TlIn(S0.25Se0.75)(2) crystal were revealed in the present paper.Article Citation - WoS: 5Citation - Scopus: 5Identification of Shallow Trap Centers in Inse Single Crystals and Investigation of Their Distribution: a Thermally Stimulated Current Spectroscopy(Elsevier, 2024) Isik, M.; Gasanly, N. M.Identification of trap centers in semiconductors takes great importance for improving the performance of electronic and optoelectronic devices. In the present study, we employed the thermally stimulated current (TSC) method within a temperature range of 10-280 K to explore trap centers in InSe crystal-a material with promising applications in next-generation devices. Our findings revealed the existence of two distinct hole trap centers within the InSe crystal lattice located at 0.06 and 0.14 eV. Through the leveraging the T-stop method, we offered trap distribution parameters of revealed centers. The results obtained from the experimental methodology employed to investigate the distribution of trap centers indicated that one of the peaks extended between 0.06 and 0.13 eV, while the other spanned from 0.14 to 0.31 eV. Notably, our research uncovers a remarkable variation in trap density, spanning one order of magnitude, for every 10 and 88 meV of energy variation. The results of our research present the characteristics of shallow trap centers in InSe, providing important information for the design and optimization of InSe-based optoelectronic devices.Article Citation - WoS: 5Citation - Scopus: 6Thermoluminescence Properties and Trapping Parameters of Tlgas2 Single Crystals(Elsevier, 2022) Delice, S.; Isik, M.; Gasanly, N. M.TlGaS2 layered single crystals have been an attractive research interest due to their convertible characteristics into 2D structure. In the present paper, structural, optical and thermoluminescence properties of TlGaS2 single crystals were investigated. XRD pattern of the crystal presented five well-defined peaks associated with monoclinic unit cell. Band gap and Urbach energies were found to be 2.57 and 0.25 eV, respectively, from the analyses of transmittance spectrum. Thermoluminescence measurements were carried out above room temperature up to 660 K at various heating rates. One TL peak with peak maximum temperature of 573 K was obtained in the TL spectrum at 1.0 K/s. Curve fitting, initial rise and variable heating rate methods were used for analyses. All of those resulted in presence of a deep trapping level with activation energy around 0.92 eV. Heating rate dependence of the TL peak was also studied and it was indicated that peak maximum temperature shifted to higher temperatures besides decreasing TL intensity as the higher heating rates were employed.Article Citation - WoS: 8Citation - Scopus: 8Study of the Structural and Optical Properties of Thallium Gallium Disulfide (tlgas2) Thin Films Grown Via Thermal Evaporation(Iop Publishing Ltd, 2022) Isik, M.; Karatay, A.; Ech-Chergui, A. N.; Gasanly, N. M.Thallium gallium disulfide (TlGaS2) belonging to layered structured semiconducting family has been a significant compound due to its outstanding characteristics. Its layered characteristics take attention for two-dimensional (2D) material research area and thus TlGaS2 is known as promising layered compound to develop 2D materials for optoelectronic devices. To the best of our knowledge, the present work is the first one investigating TlGaS2 thin films grown by thermal evaporation method. The current study focused into the structural, morphological, and optical characteristics of thermally evaporated TlGaS2 thin films. X-ray diffraction pattern of the films exhibited one peak around 36.10 degrees which was associated with (-422) plane of the monoclinic crystalline structure. The atomic compositional ratio of Tl:Ga:S was found to be suitable for the chemical formula of TlGaS2. Scanning electron microscopy images showed uniformly and narrowly deposited nanoparticles with sizes varying between 100 and 200 nm. Room temperature transmission measurements were recorded to obtain the bandgap energy of the evaporated thin films. Tauc analyses indicated direct band gap energy of 2.60 eV. Finally, Urbach energy was obtained as 95 meV. The results of the present paper would provide valuable insight to 2D material technology to understand the potential device applications of the TlGaS2.
