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Article Citation - WoS: 5Citation - Scopus: 5Identification of Shallow Trap Centers in Inse Single Crystals and Investigation of Their Distribution: a Thermally Stimulated Current Spectroscopy(Elsevier, 2024) Isik, M.; Gasanly, N. M.Identification of trap centers in semiconductors takes great importance for improving the performance of electronic and optoelectronic devices. In the present study, we employed the thermally stimulated current (TSC) method within a temperature range of 10-280 K to explore trap centers in InSe crystal-a material with promising applications in next-generation devices. Our findings revealed the existence of two distinct hole trap centers within the InSe crystal lattice located at 0.06 and 0.14 eV. Through the leveraging the T-stop method, we offered trap distribution parameters of revealed centers. The results obtained from the experimental methodology employed to investigate the distribution of trap centers indicated that one of the peaks extended between 0.06 and 0.13 eV, while the other spanned from 0.14 to 0.31 eV. Notably, our research uncovers a remarkable variation in trap density, spanning one order of magnitude, for every 10 and 88 meV of energy variation. The results of our research present the characteristics of shallow trap centers in InSe, providing important information for the design and optimization of InSe-based optoelectronic devices.Article Citation - WoS: 6Citation - Scopus: 6Gold and Ytterbium Interfacing Effects on the Properties of the Cdse/Yb Nanosandwiched Structures(Elsevier Science Bv, 2018) Alharbi, S. R.; Qasrawi, A. F.Owing to the performance of the CdSe as an optoelectronic material used for the production of quantum dots, photosensors and wave traps we here, in this article, report the enhancements in structural and electrical properties that arises from the nanosandwiching of a 40 nm thick Yb film between two films of CdSe (CYbC-40). The CdSe films which were deposited onto glass, Yb and Au substrates are characterized by X-ray diffraction, temperature dependent electrical conductivity and impedance spectroscopy measurements in the frequency range of 10-1800 MHz. The analysis of the XRD patterns have shown that the glass/CdSe/Yb/CdSe films exhibit larger grain size and lower strain, defect density and lower stacking faults compared to the not sandwiched CdSe. In addition, it was observed that the Yb shifts the donor states of the n-type CdSe from 0.44 to 0.29 eV leading to a modification in the built in voltage of the material. On the other hand, the design of the energy band diagram has shown the ability of the formation of the Au/CYbC-40/Yb as Schottky (SB) and the Au/CYbC-40/Au as back to back Schottky barriers (BBSB). While the SB device show low band pass filter characteristics, the BBSB device performed as band stop filters. The BBSB device exhibited negative capacitance effects with filtering features that reveal a return loss of 42 dB at similar to 1440 MHz.Article Citation - WoS: 1Citation - Scopus: 1Shallow Trapping Centers in Bi12geo20 Single Crystals by Thermally Stimulated Current Measurements(Elsevier, 2022) Delice, S.; Isik, M.; Gasanly, N. M.Bi12GeO20 single crystals were investigated by thermally stimulated current (TSC) experiments performed in the temperature range of 10-290 K. Recorded TSC glow curve exhibited six distinctive peaks with maxima at around 90, 105, 166, 209, 246, 275 K. The analyses of the obtained glow curve were accomplished by curve fitting and initial rise methods. The analysis results were in good agreement that the TSC peaks appeared in the glow curve due to existence of trapping levels with activation energies of 0.10, 0.18, 0.23, 0.53, 0.68 and 0.73 eV. These trapping levels were estimated to be hole traps above valence band. The heating rate dependent TSC glow curves were also obtained for various rates between 0.30 and 0.45 K/s. The changes of TSC intensity, peak maximum temperature and full-widths-half-maximum values with heating rates were studied in detail. TSC intensity decreased and peak maximum temperature increased with increasing heating rate. Determination of defects and trapping/stimulation mechanism of those are significant for technological applications since local states in these materials take critical role for device performance.Article Citation - WoS: 14Citation - Scopus: 18Traps distribution in sol-gel synthesized ZnO nanoparticles(Elsevier, 2019) Delice, S.; Isik, M.; Gasanly, N. M.The distribution of shallow traps within the sol-gel synthesized ZnO nanoparticles was investigated using thermoluminescence (TL) experiments in the 10-300 K temperature range. TL measurements presented two overlapped peaks around 110 and 155 K. The experimental technique based on radiating the nanoparticles at different temperatures (T-exc.) between 60 and 125 K was carried out to understand the trap distribution characteristics of peaks. It was observed that peak maximum temperature shifted to higher values and activation energy (E-t) increased as irradiating temperature was increased. The E-t vs. T-exc. presented that ZnO nanoparticles have quasi-continuously distributed traps possessing activation energies increasing from 80 to 171 meV. (C) 2019 Elsevier B.V. All rights reserved.
