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Article Citation - WoS: 6Citation - Scopus: 7Construction of Self-Assembled Vertical Nanoflakes on Cztsse Thin Films(Iop Publishing Ltd, 2019) Terlemezoglu, M.; Surucu, O. Bayrakli; Colakoglu, T.; Abak, M. K.; Gullu, H. H.; Ercelebi, C.; Parlak, M.Cu2ZnSn(S, Se)(4) (CZTSSe) is a promising alternative absorber material to achieve high power conversion efficiencies, besides its property of involving low-cost and earth-abundant elements when compared to Cu(In, Ga) Se-2 (CIGS) and cadmium telluride (CdTe), to be used in solar cell technology. In this study, a novel fabrication technique was developed by utilizing RF sputtering deposition of CZTSSe thin films having a surface decorated with self-assembled nanoflakes. The formation of nanoflakes was investigated by detailed spectroscopic method of analysis in the effect of each stacked layer deposition in an optimized sequence and the size of nanoflakes by an accurate control of sputtering process including film thickness. Moreover, the effects of substrate temperature on the formation of nanoflakes on the film surface were discussed at a fixed deposition route. One of the main advantages arising from the film surface with self-assembled nanoflakes is the efficient light trapping which decreases the surface reflectance. As a result of the detailed production and characterization studies, it was observed that there was a possibility of repeatable and controllable fabrication sequence for the preparation of CZTSSe thin films with self-textured surfaces yielding low surface reflectance.Article Citation - WoS: 8Citation - Scopus: 8Study of the Structural and Optical Properties of Thallium Gallium Disulfide (tlgas2) Thin Films Grown Via Thermal Evaporation(Iop Publishing Ltd, 2022) Isik, M.; Karatay, A.; Ech-Chergui, A. N.; Gasanly, N. M.Thallium gallium disulfide (TlGaS2) belonging to layered structured semiconducting family has been a significant compound due to its outstanding characteristics. Its layered characteristics take attention for two-dimensional (2D) material research area and thus TlGaS2 is known as promising layered compound to develop 2D materials for optoelectronic devices. To the best of our knowledge, the present work is the first one investigating TlGaS2 thin films grown by thermal evaporation method. The current study focused into the structural, morphological, and optical characteristics of thermally evaporated TlGaS2 thin films. X-ray diffraction pattern of the films exhibited one peak around 36.10 degrees which was associated with (-422) plane of the monoclinic crystalline structure. The atomic compositional ratio of Tl:Ga:S was found to be suitable for the chemical formula of TlGaS2. Scanning electron microscopy images showed uniformly and narrowly deposited nanoparticles with sizes varying between 100 and 200 nm. Room temperature transmission measurements were recorded to obtain the bandgap energy of the evaporated thin films. Tauc analyses indicated direct band gap energy of 2.60 eV. Finally, Urbach energy was obtained as 95 meV. The results of the present paper would provide valuable insight to 2D material technology to understand the potential device applications of the TlGaS2.Article Citation - WoS: 5Citation - Scopus: 6Influence of Temperature on Optical Properties of Electron-Beam Znse Thin Film(Iop Publishing Ltd, 2020) Gullu, H. H.; Isik, M.; Gasanly, N. M.; Parlak, M.Structural and optical properties of ZnSe thin films grown by electron-beam evaporation technique were reported in the present paper. X-ray diffraction pattern exhibited a single peak around 27 degrees which is well-suited with cubic phase of the films. Energy dispersive X-ray spectroscopy analyses resulted in atomic composition ratio of Zn/Se nearly 1.0 which corresponds to the chemical formula of ZnSe. Transmission experiments were performed at various temperatures in between 10 and 300 K. The analyses of the transmission data showed that direct band gap energy of the ZnSe thin films increases from 2.72 to 2.83 eV as temperature was reduced to 10 K from room temperature. The Varshni and O'Donnell-Chen models giving the temperature-band gap energy relation were used to get various optical parameters of the evaporated thin films. Analyses resulted in absolute zero temperature band gap energy as 2.83 eV, temperature coefficient as -5.8 x 10(-4) eV K-1 and average phonon energy as 16 meV. Urbach tail state energies were also calculated using absorption coefficient in the low photon energy region as increasing from 173 meV (300 K) to 181 meV (10 K) with decreasing ambient temperature.
