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Article Citation - WoS: 5Citation - Scopus: 6Thermoluminescence Properties and Trapping Parameters of Tlgas2 Single Crystals(Elsevier, 2022) Delice, S.; Isik, M.; Gasanly, N. M.TlGaS2 layered single crystals have been an attractive research interest due to their convertible characteristics into 2D structure. In the present paper, structural, optical and thermoluminescence properties of TlGaS2 single crystals were investigated. XRD pattern of the crystal presented five well-defined peaks associated with monoclinic unit cell. Band gap and Urbach energies were found to be 2.57 and 0.25 eV, respectively, from the analyses of transmittance spectrum. Thermoluminescence measurements were carried out above room temperature up to 660 K at various heating rates. One TL peak with peak maximum temperature of 573 K was obtained in the TL spectrum at 1.0 K/s. Curve fitting, initial rise and variable heating rate methods were used for analyses. All of those resulted in presence of a deep trapping level with activation energy around 0.92 eV. Heating rate dependence of the TL peak was also studied and it was indicated that peak maximum temperature shifted to higher temperatures besides decreasing TL intensity as the higher heating rates were employed.Article Citation - WoS: 5Citation - Scopus: 5Identification of Shallow Trap Centers in Inse Single Crystals and Investigation of Their Distribution: a Thermally Stimulated Current Spectroscopy(Elsevier, 2024) Isik, M.; Gasanly, N. M.Identification of trap centers in semiconductors takes great importance for improving the performance of electronic and optoelectronic devices. In the present study, we employed the thermally stimulated current (TSC) method within a temperature range of 10-280 K to explore trap centers in InSe crystal-a material with promising applications in next-generation devices. Our findings revealed the existence of two distinct hole trap centers within the InSe crystal lattice located at 0.06 and 0.14 eV. Through the leveraging the T-stop method, we offered trap distribution parameters of revealed centers. The results obtained from the experimental methodology employed to investigate the distribution of trap centers indicated that one of the peaks extended between 0.06 and 0.13 eV, while the other spanned from 0.14 to 0.31 eV. Notably, our research uncovers a remarkable variation in trap density, spanning one order of magnitude, for every 10 and 88 meV of energy variation. The results of our research present the characteristics of shallow trap centers in InSe, providing important information for the design and optimization of InSe-based optoelectronic devices.
