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Article Citation - Scopus: 1Structural and Electrical Performance of Moo3 Films Designed as Microwave Resonators(inst Materials Physics, 2020) Al Garni, S. E.; Qasrawi, A. F.; Alharbi, S. R.; Department of Electrical & Electronics EngineeringIn this work, the effect of the insertion of lithium slabs of thicknesses of 50 nm between stacked layers of MoO3 is considered. Stacked layers of MoO3 comprising lithium slabs are prepared by the thermal evaporation technique onto Au substrates under vacuum pressure of 10(-5) mbar. The effects of Li slabs are explored by the X-ray diffraction, scanning electron microscopy, current-voltage characteristics and impedance spectroscopy techniques in the frequency domain of 0.01-1.80 GHz. While the presence of Li slabs did not alter the amorphous nature of structure, it forced the growth of rod-like grains of diameters of 100-160 nm and lengths of 1.5 mu m. Electrically, the presence of Li in the samples enhanced the rectifying properties of the devices and force reverse to forward current ratios larger than 60 times. Li slabs also controlled the negative capacitance effect and resonance -antiresonance regions in the Au/MoO3/MoO3/C stacked layers. While the Au/MoO3/MoO3/C devices displayed high conductance and low impedance values in the studied frequency domain, the Au/MoO3/Li/MOO3/C devices exhibited low conductance and high impedance mode in the frequency domain of 0.01-0.59 GHz. It is also found that the presence of Li slabs improved the performance of the devices through driving it to exhibit lower reflection coefficient and high return loss values near 0.80 GHz. The features of the devices nominate them for use as RF-Microwave traps or resonators.Article Citation - WoS: 10Citation - Scopus: 10Effects of Indium Slabs on the Structural and Electrical Properties of Stacked Layers of Cu2o(Natl inst R&d Materials Physics, 2020) Qasrawi, A. F.; Omar, A.; Department of Electrical & Electronics EngineeringIn this work, the structural and electrical properties of stacked layers of Cu2O that comprises indium slabs in its structure are reported. The stacked layers which are coated onto glass and Au substrates under vacuum pressure of 10(-5) mbar are characterized by the X-ray diffraction and impedance spectrometry techniques. While the Cu2O/Cu2O (CC) layers exhibited amorphous nature of growth, those which contained indium slabs (CIC) displayed weak crystallinity The insertion of indium slabs between stacked layers of cuprous oxide highly increased the electrical resistivity and shifted the acceptor level closer to the valance band edge. In addition, the analyses of the conductance and capacitance spectra in the frequency domain of 0.01-1.0 GHz have shown that these two physical parameters are strongly affected by the insertion of indium slabs and by surface deformation effects. The capacitance spectra showed negative capacitance effect (NC) in all the studied frequency domain The NC effects become less pronounced in the CIC samples owing to the changes in the polarization mechanism. The feature of NC effects make both of the CC and CIC samples more appropriate for electronic and telecommunication technology as it can be used in amplifiers to enhance he gain, as parasitic cancellers and as noise reducers.

