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Article Citation - WoS: 2Citation - Scopus: 2Trap Distribution in Agin5s8< Single Crystals: Thermoluminescence Study(Pergamon-elsevier Science Ltd, 2018) Delice, S.; Işık, Mehmet; Isik, M.; Gasanly, N. M.; Işık, Mehmet; Department of Electrical & Electronics Engineering; Department of Electrical & Electronics EngineeringDistribution of shallow trap levels in AgIn5S8 crystals has been investigated by thermoluminescence (TL) measurements performed below room temperature (10-300 K). One broad TL peak centered at 33 K was observed as constant heating rate of 0.2 K/s was employed for measurement. The peak shape analysis showed that the TL curve could consist of several individual overlapping TL peaks or existence of quasi-continuous distributed traps. Therefore, TL experiments were repeated for different stopping temperatures (T-stop) between 10 and 34 K with constant heating rate of 0.2 K/s to separate the overlapping TL peaks. The E-t vs T-stop indicated that crystal has quasi-continuously distributed traps having activation energies increasing from 13 to 41 meV. Heating rate effect on trapped charge carriers was also investigated by carrying out the TL. experiments with various heating rates between 0.2 and 0.6 K/s for better comprehension of characteristics of existed trap levels. Analyses indicated that the trap levels exhibited the properties of anomalous heating rate behavior which means the TL intensity and area under the TL peak increase with increasing heating rate.Article Citation - WoS: 5Citation - Scopus: 5Structural and Optical Properties of Thermally Evaporated (gase)0.75-(gas)0.25 Thin Films(Elsevier Gmbh, 2021) Isik, M.; Işık, Mehmet; Emir, C.; Gasanly, N. M.; Işık, Mehmet; Department of Electrical & Electronics Engineering; Department of Electrical & Electronics EngineeringGaSe and GaS binary semiconducting compounds are layered structured and have been an attractive research interest in two-dimensional material research area. The present paper aims at growing (GaSe)0.75 - (GaS)0.25 (or simply GaSe0.75S0.25) thin film and investigating its structural and optical properties. Thin films were prepared by thermal evaporation technique using evaporation source of its single crystal grown by Bridgman method. The structural properties were revealed using x-ray diffraction (XRD), energy dispersive spectroscopy (EDS), scanning electron microscopy (SEM) and atomic force microscopy (AFM) techniques. XRD pattern and EDS analyses indicated that thin films annealed at 300 ?C were successfully deposited and its structural characteristics are well-consistent with its single crystal form. Surface morphology was studied by means of SEM and AFM measurements. Optical properties were investigated by transmission and Raman spectroscopy techniques. Raman spectrum exhibited three peaks around 172, 242 and 342 cm-1. Analyses of transmission spectrum revealed the direct band gap energy as 2.34 eV. The mixed compounds of GaSe0.75S0.25 were prepared for the first time in a thin film form and the results of the present paper would provide valuable information to research area in which layered compounds have been studied in detail.
