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  • Article
    Citation - WoS: 5
    Citation - Scopus: 5
    Absorption Edge and Optical Constants of Tl2ga2< Crystals From Reflection and Transmission, and Ellipsometric Measurements
    (Elsevier, 2012) Isik, M.; Gasanly, N. M.
    The optical properties of Tl2Ga2S3Se layered crystalline semiconductors were investigated from transmission, reflection and ellipsometric measurements. The experimental results of the room temperature transmission and reflection measurements performed in the wavelength range of 400-1100 nm showed the presence of both indirect and direct transitions in the band structure of the crystals with 2.38 and 2.62 eV band gap energies. Spectroscopic ellipsometry measurements on Tl2Ga2S3Se crystals were carried out on the layer-plane (0 0 1) surfaces with light polarization E perpendicular to c* in the 1.20-4.70 eV spectral range at room temperature. The real and imaginary parts of the dielectric function as well as refractive and absorption indices were found as a result of analysis of ellipsometric data. The Wemple-DiDomenico single-effective-oscillator model was used to study the dispersion of the refractive index in the below band gap energy range. The structures of critical points have been characterized from the second derivative spectra of the dielectric function. The analysis revealed four interband transition structures with 3.14, 3.40, 3.86 and 4.50 eV critical point energies. (C) 2012 Elsevier B.V. All rights reserved.
  • Article
    Citation - WoS: 2
    Citation - Scopus: 2
    Optical constants and interband transitions of anisotropic layered structured Tl2GaInS4 crystals by spectroscopic ellipsometry
    (Elsevier Science Sa, 2013) Isik, M.; Gasanly, N. M.; Turan, R.
    Spectroscopic ellipsometry measurements were carried out on Tl2GaInS4 layered crystals for orientations of electric field vector, parallel (E//c*) and perpendicular (E perpendicular to c*) to optical axis c*. The measurements were performed in the 1.2-6.2 eV spectral range at room temperature. The real and imaginary components of the pseudodielectric function, pseudorefractive index and pseudoextinction coefficient were calculated from the analysis of ellipsometric data. The energies of interband transitions (critical points) have been found from the least-square fitting of the second derivative spectra of the pseudodielectric function. The results indicated five each interband transition structures for E//c* and E perpendicular to c* configurations. The obtained critical point energies were assigned tentatively to interband transitions using the available electronic energy band structure given in literature. (C) 2012 Elsevier B.V. All rights reserved.