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Article Robust Divergence-Based Tests of Hypotheses for Simple Step-Stress Accelerated Life-Testing Under Gamma Lifetime Distributions(Elsevier, 2026) Balakrishnan, Narayanaswamy; Jaenada, Maria; Pardo, LeandroMany modern devices are highly reliable, with long lifetimes before their failure. Conducting reliability tests under actual use conditions may require therefore impractically long experimental times to gather sufficient data for developing accurate inference. To address this, Accelerated Life Tests (ALTs) are often used in industrial experiments to induce product degradation and eventual failure more quickly by increasing certain environmental stress factors. Data collected under such increased stress conditions are analyzed, and results are then extrapolated to normal operating conditions. These tests typically involve a small number of devices and so pose significant challenges, such as interval-censoring. As a result, the outcomes are particularly sensitive to outliers in the data. Additionally, a comprehensive analysis requires more than just point estimation; inferential methods such as confidence intervals and hypothesis testing are essential to fully assess the reliability behaviour of the product. This paper presents robust statistical methods based on minimum divergence estimators for analyzing ALT data of highly reliable devices under step-stress conditions and Gamma lifetime distributions. Robust test statistics generalizing the Rao test and divergence-based tests for testing linear null hypothesis are then developed. These hypotheses include in particular tests for the significance of the identified stress factors and for the validity of the assumption of exponential lifetimes.Article Linear Two-Dimensional Consecutive K-Type Systems in Multi-State Case(Elsevier Sci Ltd, 2026) Yi, He; Balakrishnan, Narayanaswamy; Li, XiangIn the context of consecutive k-type systems, multi-state system models are only considered in the onedimensional case and not in the two-dimensional case due to the complexity involved. In this paper, we consider several linear two-dimensional consecutive k-type systems in the multi-state case for the first time, as generalization of consecutive k-out-of-n systems and l-consecutive-k-out-of-n systems without/with overlapping. These systems include multi-state linear connected-(k, r)-out-of-(m, n): G systems, multi-state linear connected-(k, r)-or-(r, k)-out-of-(m, n): G systems, multi-state linear 1-connected-(k, r)-out-of-(m, n): G systems without/with overlapping, and multi-state linear 1-connected-(k, r)-or-(r, k)-out-of-(m, n): G systems without/with overlapping. We then derive their reliability functions by using the finite Markov chain imbedding approach (FMCIA) in a new way. We also present several examples to illustrate all the results developed here.Article Nonparametric Tests for Comparing Reliabilities of Coherent Systems at Specific Mission Time(IEEE-Inst Electrical Electronics Engineers Inc, 2026) Xu, Xuan; Zhu, Xiaojun; Balakrishnan, Narayanaswamy; Ng, Hon Keung TonyReliability analysis of coherent systems is critical for evaluating the performance of systems whose functionality depends on the reliability of their components. Traditional parametric methods for comparing reliabilities of coherent systems assume a specific probability distribution for component lifetimes, which may result in inaccurate results when these model assumptions are violated. This article introduces nonparametric procedures using system-level data with known signatures to compare the reliabilities of systems. The proposed methodology avoids parametric distributional assumptions for component lifetimes while relying on the standard assumption in signature-based reliability analysis. Specifically, a two-sample likelihood ratio test procedure is proposed to demonstrate a component or system with superior reliability. Monte Carlo simulations are performed to evaluate the performance of the proposed methods. Furthermore, we examine the effect of system structure on test power and determine favourable structures to enhance the power performance of the test. Practical examples are used to illustrate the proposed test procedures.
