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Citation - WoS: 7
Citation - Scopus: 7
Design of the Zns/Ge pn Interfaces as Plasmonic, Photovoltaic and Microwave Band Stop Filters
(Elsevier Science Bv, 2017) Alharbi, S. R.; Qasrawi, A. F.
In the current work, we report and discuss the features of the design of a ZnS (300 nm)/Ge (300 nm)/GaSe (300 nm) thin film device. The device is characterized by the X-ray diffraction, electron microscopy, energy dispersive X-ray spectroscopy (EDS), optical spectroscopy, microwave power spectroscopy and light power dependent photoconductivity. While the X-ray diffraction technique revealed a polycrystalline ZnS coated with two amorphous layers of Ge and GaSe, the hot probe tests revealed the formation of pn interface. The optical spectra which were employed to reveal the conduction and valence band offsets at the ZnS/Ge and Ge/GaSe interface indicated information about the dielectric dispersion at the interface. The dielectric spectra of the ZnS/Ge/GaSe heterojunction which was modeled assuming the domination of surface plasmon interactions through the films revealed a pronounced increase in the drift mobility of free carriers in the three layers compared to the single and double layers. In the scope of the fitting parameters, a wave trap that exhibit filtering properties at notch frequency of 2.30 GHz was designed and tested. The ac signals power spectrum absorption reached similar to 99%. In addition, the photocurrent analysis on the ZnS/Ge/GaSe interface has shown it is suitability for photovoltaic and photosensing applications. (C) 2017 The Authors. Published by Elsevier B.V. This is an open access article under the CC BY-NC-ND license
Citation - WoS: 5
Citation - Scopus: 4
Thickness and Annealing Effects on the Structural and Optical Conductivity Parameters of Zinc Phthalocyanine Thin Films
(inst Materials Physics, 2020) Alharbi, S. R.; Qasrawi, A. F.; Khusayfan, N. M.; Department of Electrical & Electronics Engineering
In this work, the effects of the thin film thicknesses on the structural, optical absorption, energy band gap, dielectric spectra and optical conductivity parameters of the Zinc phthalocyanine thin films are considered. Thin films of ZnPc of thicknesses of 50-600 nm which are coated onto glass substrates are observed to exhibit amorphous nature of growth. The polycrystalline monoclinic ZnPc phase of the films is obtained via annealing the films at 200 degrees C in a vacuum atmosphere. Increasing the ZnPc films thickness shrunk the energy band gap in the B- and Q- bands and decreased both of the optical conductivities and free holes density in the Q-band. The increase in the film thickness is also observed to decrease the plasmon frequency and the drift mobility of holes in the films. The highest dielectric constant is obtained for films of thicknesses of 100 nm. The annealing process enhanced the optical absorption, redshifts the energy band gap value and the critical energy of the absolute maxima of dielectric constant. In addition, while the heat treatment enhanced both of the scattering times at femtosecond level and the drift mobility, it reduced the free holes density, and the plasmon frequency.
Citation - WoS: 7
Citation - Scopus: 7
Plasmon-Electron Dynamics at the Au/Inse and Y/Inse Interfaces Designed as Dual Gigahertz-Terahertz Filters
(Elsevier Gmbh, Urban & Fischer verlag, 2017) Alharbi, S. R.; Qasrawi, A. F.
In this work, the X-ray diffraction, the Scanning electron microscopy, the energy dispersive X-ray, the Raman, The UV-vis light and the impedance spectral techniques are employed to explore the structural, vibrational, optical and electrical properties of the Au/InSe and Y/InSe thin film interfaces. It was shown that with its amorphous nature of crystallization, the InSe thin films exhibited n-type conductivity due to the 3% excess selenium. For this form of InSe, the only active Raman spectral line is 121 (cm(-1)). In addition to the design of the energy band diagram, the analysis the dielectric spectra and the optical conductivities were possible in the frequency range of 270-1000 THz. The modeling of the optical conductivities of the Au, Y, Au/InSe and Y/InSe with the help of Lorentz approach for optical conduction, assured that the conduction is dominated by the resonant plasmon-electron interactions at the metals and metals/semiconductors interfaces. It also allowed tabulating the necessary parameters for possible applications in terahertz technology: These parameters are the electron effective masses, the free electron densities, the electron bounded plasmon frequencies, the electron scattering times, the reduced resonant frequencies and the drift mobilities. On the other hand, the impedance spectral analysis of the Y/InSe/Au interfaces in the frequency range of 0.01-1.80 GHz, revealed negative capacitance effect associated with band filter features that exhibit maximum transition line at 1.17 GHz. This value nominates the interface as a member of filter classes in the gigahertz technology. (C) 2017 Elsevier GmbH. All rights reserved.
Citation - WoS: 15
Citation - Scopus: 17
Dielectric Dispersion in Ga₂s_{3< Thin Films}
(Springer, 2017) Alharbi, S. R.; Qasrawi, A. F.
In this work, the structural, compositional, optical, and dielectric properties of Ga2S3 thin films are investigated by means of X-ray diffraction, scanning electron microscopy, energy dispersion X-ray analysis, and ultraviolet-visible light spectrophotometry. The Ga2S3 thin films which exhibited amorphous nature in its as grown form are observed to be generally composed of 40.7 % Ga and 59.3 % S atomic content. The direct allowed transitions optical energy bandgap is found to be 2.96 eV. On the other hand, the modeling of the dielectric spectra in the frequency range of 270-1,000 THz, using the modified Drude-Lorentz model for electron-plasmon interactions revealed the electrons scattering time as 1.8 (fs), the electron bounded plasma frequency as similar to 0.76-0.94 (GHz) and the reduced resonant frequency as 2.20-4.60 x10(15) (Hz) in the range of 270-753 THz. The corresponding drift mobility of electrons to the terahertz oscillating incident electric field is found to be 7.91 (cm (2)/Vs). The values are promising as they nominate the Ga2S3 thin films as effective candidates in thin-film transistor and gas sensing technologies.
Citation - WoS: 9
Citation - Scopus: 9
Effect of Ytterbium, Gold and Aluminum Transparent Metallic Substrates on the Performance of the Ga₂s_{3< Thin Film Devices}
(Elsevier Science Bv, 2017) Alharbi, S. R.; Qasrawi, A. F.
In the current work, the structural, optical, dielectric and electrical properties of the Ga2S3 thin films which are deposited onto transparent thin Al, Yb and Au metal substrates are characterized by means of transmittance electron microscopy, X-ray diffraction, ultraviolet visible light spectroscopy and impedance spectroscopy techniques. The effects of the metallic substrates on the crystalline nature, energy band gap and dielectric spectra are also investigated. The modeling of the dielectric spectra allowed determining the effect of the Al, Yb and Au thin layers on the electron scattering time, the plasmon frequency, free electron density and drift mobility. In addition, a Yb/Ga2S3/Au Schottky barrier and All Ga2S3/Au back to back Schottky barrier devices (metal-semiconductor-metal (MSM) device) are fabricated and characterized by means of capacitance-voltage characteristics and capacitance and conductance spectra in the frequency range of 10-1800 MHz. While the Schottky barrier device displayed three distinct positions of resonance-antiresonance phenomena, the MSM device displayed one peak with narrow bandwidth of 10 MHz. The MSM devices exhibited an inversion, depletion and accumulation modes within a voltage range of 0.25 V width at 250 MHz. The study indicates the applicability of these device as smart capacitive switches, as Plasmon devices and as wavetraps. (C) 2017 Elsevier B.V. All rights reserved.
Citation - Scopus: 1
Structural and Electrical Performance of Moo₃ Films Designed as Microwave Resonators
(inst Materials Physics, 2020) Al Garni, S. E.; Qasrawi, A. F.; Alharbi, S. R.; Department of Electrical & Electronics Engineering
In this work, the effect of the insertion of lithium slabs of thicknesses of 50 nm between stacked layers of MoO3 is considered. Stacked layers of MoO3 comprising lithium slabs are prepared by the thermal evaporation technique onto Au substrates under vacuum pressure of 10(-5) mbar. The effects of Li slabs are explored by the X-ray diffraction, scanning electron microscopy, current-voltage characteristics and impedance spectroscopy techniques in the frequency domain of 0.01-1.80 GHz. While the presence of Li slabs did not alter the amorphous nature of structure, it forced the growth of rod-like grains of diameters of 100-160 nm and lengths of 1.5 mu m. Electrically, the presence of Li in the samples enhanced the rectifying properties of the devices and force reverse to forward current ratios larger than 60 times. Li slabs also controlled the negative capacitance effect and resonance -antiresonance regions in the Au/MoO3/MoO3/C stacked layers. While the Au/MoO3/MoO3/C devices displayed high conductance and low impedance values in the studied frequency domain, the Au/MoO3/Li/MOO3/C devices exhibited low conductance and high impedance mode in the frequency domain of 0.01-0.59 GHz. It is also found that the presence of Li slabs improved the performance of the devices through driving it to exhibit lower reflection coefficient and high return loss values near 0.80 GHz. The features of the devices nominate them for use as RF-Microwave traps or resonators.
Citation - WoS: 9
Citation - Scopus: 9
Optical Dynamics in the Ag/Α-ga_{2< Layer System}
(Elsevier Sci Ltd, 2018) Alharbi, S. R.; Qasrawi, A. F.
In this work, thin films of Ga2S3 are deposited onto 150 nm thick transparent Ag substrate by the physical vapor deposition technique under vacuum pressure of 10(-5) mbar. The films are studied by the X-ray diffraction and optical spectrophotometry techniques. It is found that the Ag substrate induced the formation of the monoclinic alpha-Ga2S3 polycrystals. The transparent Ag substrate also changed the preferred optical transition in Ga2S3 from direct to indirect It also increased the light absorption by 79 and 23 times at incident light energies of 2.01 and 2.48 eV, respectively. In addition, a red shift in all types of optical transitions is observed. Some the extended energy band tails of Ag appears to form interbands in the band gap of Ga2S3. These interbands strongly attenuated the dielectric and optical conduction parameters. Particularly, an enhancement in the dielectric constant values and response to incident electromagnetic field is observed. The Drude-Lorentz modeling of this interface has shown that the free carrier density, drift mobility, plasmon frequency and reduced electron-plasmon frequency in Ga2S3 increases when the Ag substrate replaced the glass or other metals like Yb, Al and Au. The nonlinear optical dynamics of the Ag/Ga2S3 are promising as they indicate the applicability of this interface for optoelectronic applications.
Citation - WoS: 6
Citation - Scopus: 6
Gold and Ytterbium Interfacing Effects on the Properties of the Cdse/Yb Nanosandwiched Structures
(Elsevier Science Bv, 2018) Alharbi, S. R.; Qasrawi, A. F.
Owing to the performance of the CdSe as an optoelectronic material used for the production of quantum dots, photosensors and wave traps we here, in this article, report the enhancements in structural and electrical properties that arises from the nanosandwiching of a 40 nm thick Yb film between two films of CdSe (CYbC-40). The CdSe films which were deposited onto glass, Yb and Au substrates are characterized by X-ray diffraction, temperature dependent electrical conductivity and impedance spectroscopy measurements in the frequency range of 10-1800 MHz. The analysis of the XRD patterns have shown that the glass/CdSe/Yb/CdSe films exhibit larger grain size and lower strain, defect density and lower stacking faults compared to the not sandwiched CdSe. In addition, it was observed that the Yb shifts the donor states of the n-type CdSe from 0.44 to 0.29 eV leading to a modification in the built in voltage of the material. On the other hand, the design of the energy band diagram has shown the ability of the formation of the Au/CYbC-40/Yb as Schottky (SB) and the Au/CYbC-40/Au as back to back Schottky barriers (BBSB). While the SB device show low band pass filter characteristics, the BBSB device performed as band stop filters. The BBSB device exhibited negative capacitance effects with filtering features that reveal a return loss of 42 dB at similar to 1440 MHz.
Citation - WoS: 3
Citation - Scopus: 4
Effects of Ge Substrate on the Structural and Optical Conductivity Parameters of Bi₂o_{3< Thin Films}
(Elsevier Gmbh, 2019) Alharbi, S. R.; Qasrawi, A. F.
In this article the structural, optical and dielectric properties of a 200 nm thick Bi2O3 thin films which are deposited onto amorphous germanium substrate are reported. Both of the Ge and Bi2O3 thin films are prepared by the thermal evaporation technique under vacuum pressure of 10 s mbar. Bi2O3 thin films are found to prefer the monoclinic nature of structure with larger values of microstrain, dislocation density, stacking faults and smaller grain sizes upon replacement of the glass substrate by germanium. Optically, significant redshift in the energy band gap is observed when the films are grown onto Ge. The Ge/Bi2O3 heterojunctions exhibit a conduction and valence band offsets of value of 0.81 and 1.38 eV, respectively. In addition to the enhancement in the dielectric constant near the IR region, the Drude-Lorentz modeling of the Ge/Bi2O3 heterojunctions has shown remarkable effect of the Ge substrate on the optical conductivity parameters of Bi2O3. Particularly, the drift mobility increased by about one order of magnitude, the free hole density decreased by (similar to)24 times and the plasmon frequency ranges extended from 5.21 to 11.0 GHz to 2.59-12.80 GHz when germanium substrate is used. The optical features of the heterojunction nominate it for visible light communication technology.
Citation - WoS: 1
Citation - Scopus: 1
Structural, Optical and Electrical Properties of Ybinse Thin Films
(Elsevier Science Sa, 2016) Alharbi, S. R.; Qasrawi, A. F.
In this work, the compositional, the structural, the vibrational, the optical and the electrical characterizations of the YbInSe compound are investigated by means of energy dispersion X-ray analysis, scanning electron microscopy and X-ray diffraction, Raman spectroscopy, ultraviolet-visible light spectrophotometry, impedance spectroscopy and temperature dependent electrical conductivity, respectively. The 300 nm thick YbInSe films which were prepared by the co-evaporation of the source materials under a vacuum pressure of 10(-5) mbar, are observed to exhibit nanocrystalline clusters of size of 27 nm regularly distributed among an amorphous structure. The most intensive Raman active lines are observed at 150 and 254 cm(-1). In addition, the optical analysis has shown that the films exhibit a direct forbidden electronic transitions type energy band gap of 1.07 eV. The optical transitions are associated with interband tail states of width of 0.28 eV. Moreover, the real and imaginary parts of dielectric spectra which were analyzed in the frequency range of 270-1000 THz, were analyzed in accordance with the single oscillator and the Lorentz models, respectively. The modeling allowed determining the oscillator and dispersion energies, the terahertz free carrier scattering time, the free holes effective mass, the carrier density, the drift mobility and the reduced resonant frequency for the YbinSe films. In the electronic part of study, the temperature dependent dc electrical conductivity analysis, indicated the domination of the variable range hopping transport mechanism below 335 K, the thermal excitation of charge carriers in the range of 337390 K and the extrinsic-intrinsic transition property at 390 K. The ac conductivity spectra which were recorded in the frequency range of 10-1500 MHz, revealed the domination of the correlated barrier hopping of free carriers between pairs of localized states at the Fermi level. (C) 2016 Elsevier B.V. All rights reserved.

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