Qasrawı, Atef Fayez Hasan

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Qasrawı, Atef Fayez Hasan

Name Variants

Qasrawi, Atef Fayez
Atef Fayez Hasan, Qasrawı
Qasrawı,A.F.H.
Qasrawi,A.F.H.
Q., Atef Fayez Hasan
Q.,Atef Fayez Hasan
Atef Fayez Hasan, Qasrawi
Qasrawi, Atef Fayez Hasan
A.F.H.Qasrawı
A.F.H.Qasrawi
A., Qasrawi
A.,Qasrawı
Qasrawı, Atef Fayez Hasan
Qasrawi, A. F.
Qasrawi,A.F.
Qasrawi, AF
Qasrawi, Atef F.
Qasrawi, Atef A.
Qasrawi, Atef Fayez
Qasrawi, Atef F.
Qasrawi, Atef A.
Qasrawi, Atef

Job Title

Doçent Doktor

Email Address

atef.qasrawi@atilim.edu.tr

Main Affiliation

Department of Electrical & Electronics Engineering

Status

Former Staff

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Scholarly Output

222

Articles

218

Citation Count

1740

Supervised Theses

0 Scholarly Output Search Results

Now showing 1 - 10 of 222

Citation - WoS: 6
Citation - Scopus: 8
Temperature and Magnetic Field Effects on the Carrier Density and Hall Mobility of Boron-Doped Tl-Ba Superconductor
(Elsevier Science Sa, 2005) Kayed, TS; Qasrawi, AF; Department of Electrical & Electronics Engineering
Boron-doped T1-based superconductor was prepared by adding an amount of 1 wt.% B to the Tl1.8Ba2Ca2.2Cu3Ox, compound. The usual solid-state reaction method has been applied under optimum conditions. The X-ray data of the sample show a tetragonal structure with a high ratio of T1-2223 superconducting phase. The sample showed a transition at 125 K and the zero resistance was observed at 120 K. The magnetic field and temperature effects on the normal state electrical resistivity, carrier density, and Hall mobility have been investigated. Both temperature and magnetic field significantly affect the resistivity behavior. The zero field resistivity was found to vary exponentially with temperature with a slope revealing activation energy of 27.5 meV. When the magnetic field is applied, the resistivity varied up-normally in the temperature region of 160-240 K. The temperature dependent carrier concentration calculated from the Hall coefficient data varied linearly with the applied magnetic field. This effect was attributed to the increase in the hole effective mass upon field increment. The temperature-dependent carrier concentration data at several applied fields were analyzed by the single donor-single acceptor model to obtain the values of effective masses. The temperature and magnetic field dependent normal state Hall mobility was found to be limited by the scattering of acoustic phonons. (c) 2005 Elsevier B.V. All rights reserved.
Citation - WoS: 8
Citation - Scopus: 8
Indium Slabs Induced Structural Phase Transitions and Their Effects on the Electrical and Optical Properties of Stacked Layers of the Thermally Annealed Cu₂o Thin Films
(Elsevier, 2020) AlGarni, Sabah E.; Qasrawi, A. F.; Department of Electrical & Electronics Engineering
In this work, the effects of the structural evolutions caused by the insertion of indium slabs (100 nm) between layers of cupric oxide on the electrical and optical properties are investigated. The stacked layers of Cu2O/Cu2O (CC) which are thermally annealed at 500 degrees C in a vacuum media is observed to comprise both of the CuO (45.9%) and Cu2O (54.1%) phases in its structure. The major structural phase of CuO and Cu2O are monoclinic and orthorhombic, respectively. Insertion of indium slabs which is followed by thermal annealing reduced the content of CuO to 29.2% and enriched the content of Cu2O to 70.8%. The CC samples exhibited structural phase transitions from monoclinic CuO to hexagonal Cu2O in the presence of indium and under thermal annealing. The insertion of indium slabs in the samples increased the crystallite size and enhanced the optical transmittance. It also decreased the microstrain, the defect density and the electrical resistivity. The donor states are shifted deeper below the conduction band edge. The nature of optical transitions also changed from direct allowed to direct forbidden with a decrease in the energy band gap values from 2.05 to 0.85 eV upon indium slabs insertion followed by annealing process.
Citation - WoS: 2
Citation - Scopus: 2
Temperature-Dependent Capacitance-Voltage Biasing of the Highly Tunable Tlgate₂ Crystals
(Elsevier Science Bv, 2012) Qasrawi, A. F.; Gasanly, N. M.; Department of Electrical & Electronics Engineering
The temperature effects on the capacitance-voltage characteristics as well as the room temperature capacitance-frequency characteristics of TlGaTe2 crystals are investigated. A very wide range of linearly varying tunable capacitance from 6.0 mu F to 60 pF was recorded. The capacitance-voltage characteristics, being recorded in the temperature range of 290-380 K, revealed a linear increase in the build in voltage associated with exponential decrease in the density of non-compensated ionized carriers with increasing temperature. The high temperature (up to 380 K) biasing ability, the linear tunability and the high dielectric constant values ( similar to 10(3)) make the TlGaTe2 crystals applicable in microelectronic components. (C) 2012 Elsevier B.V. All rights reserved.
Citation - WoS: 3
Citation - Scopus: 3
Transport and Recombination Kinetics in Tlgate₂ Crystals
(Wiley-blackwell, 2009) Qasrawi, A. F.; Gasanly, N. M.; Department of Electrical & Electronics Engineering
In this work, the transport and recombination mechanisms as well as the average hole-relaxation time in TlGaTe2 have been investigated by means of temperature-dependent dark electrical conductivity, photoexcitation intensity-dependent photoconductivity, and Hall effect measurements, respectively. The experimental data analysis revealed the existence of a critical temperature of 150 K. At this temperature, the transport mechanism is disturbed. The dark conductivity data analysis allowed the determination of an energy state of 258 meV The hole-relaxation time that was determined from the Hall mobility data was observed to increase with decreasing temperature. The behavior was attributed to the hole-thermal lattice scattering interactions. At fixed photoexcitation intensity, the photocurrent I-ph decreases with decreasing temperature down to 150 K. Below this temperature it changes direction. The latter data allowed the determination of the recombination center energy as 1 10 meV On the other hand, at fixed temperature and variable illumination intensity, the photocurrent follows the relation I-ph alpha F-n (the value of the exponent, it, decreases with decreasing temperature). (C) 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Citation - WoS: 5
Citation - Scopus: 5
Structural and Electrical Characterizations of the as Grown and Annealed Au/Mοo_{3< Bandpass Filters}
(Wiley, 2019) Khanfar, Hazem K.; Qasrawi, Atef; Daraghmeh, Masa; Abusaa, Muayad; Department of Electrical & Electronics Engineering
In this work, the structural, morphology, and electrical properties of two 500 nm thick molybdenum trioxide layers that are sandwiched with indium slab of thickness of 200 nm (MoO3/In/MoO3 [MIM]) to form a bandpass filter are investigated by X-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDX), and impedance spectroscopy techniques, respectively. The MIM films which coated onto Au thin film substrates by the thermal evaporation technique under vacuum pressure of 10(-5) mbar was post annealed at 250 degrees C in air atmosphere. While the XRD analysis revealed polycrystalline hexagonal lattice structure of the Au/MLM samples, the SEM and EDS analysis displayed grains of sizes of 350 nm and stoichiometric structure of MoO3. Electrically, indium layer which caused n-type conduction with donor level of 299 meV, forced the material to exhibit negative capacitance (NC) effect at high frequencies (above 1.1 GHz). The impedance spectroscopy which was recorded in the frequency domain of 0.01 to 1.80 GHz, also revealed low pass and high pass filters characteristics in the low and high frequency domains, respectively. The annealing of the Au/MIM samples, decreased the crystallite and grain sizes and increased the microstrain, the defect density and the stacking faults. Small amount of excess oxygen and some indium deficiency are observed upon annealing. In addition, the annealing shifted the donor level closer to the bottom of the conduction band and inverted the NC effect from high to low frequency regions. The study indicates the applicability of the Au/MIM/C structures as microwave cavities and parasitic capacitance cancellers in electronic circuits.
Citation - WoS: 4
Citation - Scopus: 4
Crystal Data and Indirect Optical Transitions in Tl₂ingase_{4< Crystals}
(Pergamon-elsevier Science Ltd, 2008) Qasrawi, A. F.; Gasanly, N. M.; Department of Electrical & Electronics Engineering
The room temperature crystal data and the optical properties of the Bridgman method grown Tl2InGaSe4 crystals are reported and discussed. The X-ray diffraction technique has revealed that Tl2InGaSe4 is a single phase crystal of monoclinic structure. The unit cell lattice parameters, which were recalculated from the X-ray data, are found to be a = 0.77244 nm, b = 0.64945 nm, c = 0.92205 nm and beta = 95.03 degrees. The temperature dependence of the optical band gap of Tl2InGaSe4 single crystal in the temperature region of 290-500 K has also been investigated. The absorption coefficient was calculated from the transmittance and reflectance data in the incident photon energy range of 1.60-2.10 eV. The absorption edge is observed to shift toward lower energy values as temperature increases. The fundamental absorption edge corresponds to indirect allowed transition energy gap of 1.86 eV that exhibited a temperature coefficient gamma = -3.53 x 10(-4) eV/K. (C) 2007 Elsevier Ltd. All rights reserved.
Citation - WoS: 3
Citation - Scopus: 3
In situ observations of the permanent structural modifications, phase transformations and band gap narrowing upon heating of Cu₂Se/Yb/Cu₂Se films
(Elsevier Science Sa, 2019) Qasrawi, A. F.; Omareya, Olfat A.; Department of Electrical & Electronics Engineering
In this study, we have investigated the temperature dependent structural, optical and dielectric properties of Cu2Se thin films that are nanosandwiched with 50 nm thick ytterbium slab (CYC). The X-ray diffraction monitoring of the films during the heating process in the temperature range of 293-473 K has shown that the CYC films which contain both of the cubic and orthorhombic phases in its structure exhibits lattice expansion that increases the grain size and decreases the defect density, stacking faults and microstrain by 12.5% and by 28.9%, 12.8% and 11.3%, respectively. The CYC films show enhanced permanent crystallinity presented by high degree of orientation with reduction of the weight of the orthorhombic phase after cooling. On the other hand, a red shift in the energy band gap value is observed during the heating process. The analysis of the temperature dependent optical properties has shown a good correlation between the lattice expansion and energy band gap narrowing. In additions, the CYC samples are observed to exhibit negative capacitance effect that nominates the material for use in electronic circuits. The negativity of the capacitance decreased with increasing temperature due to the reduction in the defect density. (C) 2019 Elsevier B.V. All rights reserved.
Citation - WoS: 6
Citation - Scopus: 6
Al/Cdse Resonant Tunneling Thin Film Transistors
(Elsevier Science Bv, 2017) Qasrawi, A. F.; Kayed, T. S.; Elsayed, Khaled A.; Department of Electrical & Electronics Engineering
An Al/CdSe/GaSe/C thin film transistor device was prepared by the physical vapor deposition technique at a vacuum pressure of 10(-5) mbar. The x-ray diffraction measurements demonstrated the polycrystalline nature of the surface of the device. The de current-voltage characteristics recorded for the Al/CdSe/C and Al/CdSe/GaSe/C channels displayed a resonant tunneling diode features during the forward and reverse voltage biasing, respectively. In addition, the switching current ratio of the Al/CdSe/C increased from 18.6 to 9.62x10(3) as a result of the GaSe deposition on the CdSe surface. Moreover, the alternating electrical signal analyses in the frequency range of 1.0 MHz to 1.8 GHz, showed some remarkable properties of negative resistance and negative capacitance spectra of the AVCdSe/GaSe/C thin film transistors. Two distinct resonance-antiresonance phenomena in the resistance spectra and one in the capacitance spectra were observed at 0.53, 1.04 and 1.40 GHz for the Al/CdSe/C channel, respectively. The respective resonating peak positions of the resistance spectra shift to 0.38 and 0.95 GHz when GaSe is interfaced with CdSe. These features of the thin film transistors are promising for use in high quality microwave filtering circuits and also for use as ultrafast switches.
Citation - WoS: 5
Citation - Scopus: 4
Nickel Doping Effects on the Structural and Dielectric Properties of Ba(zn_{1/3< Perovskite Ceramics}
(Springer, 2021) Qasrawi, A. F.; Sahin, Ethem Ilhan; Emek, Mehriban; Department of Electrical & Electronics Engineering
The effects of nickel doping into Ba(Zn1/3Nb2/3)O-3 (acronym: BZN) ceramics is structurally, morphologically and electrically investigated. The nickel substitution in sites of Zn which was carried out by the solid state reaction technique strongly enhanced the structural, morphological and electrical performances of the BZN. Specifically, while the lattice constant and crystallite sizes increased, the microstrain and the defect density decreased. The relative density of the BZN ceramics increased from 95.40% to 98.24% upon doping of Ni with content of x = 0.05. In addition, the Ni doping increased the values of electrical conductivity without significant changes in the dielectric constant values. It is also observed that the doping the BZN ceramics highly altered the temperature dependent variation of the relative dielectric constant. In the temperature range of 293-473 K, the x = 0.05 Ni doped BZN samples were less sensitive to temperature. The dynamics of the temperature dependent dielectric response is dominated by the coupled defects excitation mechanisms. Both of the temperatures and frequency dependent dielectric constant, dielectric loss and electrical conductivity suggests that the Ni doped Ba(Zn1/3Nb2/3)O-3 ceramics is more appropriate for electronic device fabrication than the pure ones.
Citation - WoS: 9
Absorption and Optical Conduction in Inse/Znse Thin Film Transistors
(World Scientific Publ Co Pte Ltd, 2016) Al Garni, S. E.; Qasrawi, A. F.; Department of Electrical & Electronics Engineering
In this work, (n)InSe/(p)ZnSe and (n)InSe/(p)ZnSe/(n)InSe heterojunction thin film transistor (TFT) devices are produced by the thermal evaporation technique. They are characterized by means of X-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersion X-ray spectroscopy and optical spectroscopy techniques. While the InSe films are found to be amorphous, the ZnSe and InSe/ZnSe films exhibited polycrystalline nature of crystallization. The optical analysis has shown that these devices exhibit a conduction band offsets of 0.47 and valence band offsets of 0.67 and 0.74 eV, respectively. In addition, while the dielectric spectra of the InSe and ZnSe displayed resonance peaks at 416 and 528 THz, the dielectric spectra of InSe/ZnSe and InSe/ZnSe/InSe layers indicated two additional peaks at 305 and 350 THz, respectively. On the other hand, the optical conductivity analysis and modeling in the light of free carrier absorption theory reflected low values of drift mobilities associated with incident alternating electric fields at terahertz frequencies. The drift mobility of the charge carrier particles at femtoseconds scattering times increased as a result of the ZnSe sandwiching between two InSe layers. The valence band offsets, the dielectric resonance at 305 and 350 THz and the optical conductivity values nominate TFT devices for use in optoelectronics.

Qasrawı, Atef Fayez Hasan

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222

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218

Citation Count

1740

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