RW-9: A Family of Random Walk Tests

dc.contributor.author Uguz, Muhiddin
dc.contributor.author Sulak, Fatih
dc.contributor.author Doganaksoy, Ali
dc.contributor.author Kocak, Onur
dc.date.accessioned 2026-02-05T19:58:15Z
dc.date.available 2026-02-05T19:58:15Z
dc.date.issued 2025
dc.description.abstract In this work, we define a family of nine statistical randomness tests for collections of short binary strings, by making use of random walk statistics. For a binary sequence of length \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\varvec{n}$$\end{document}, we consider the probability of intersecting the line \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\varvec{y=t}$$\end{document} exactly at \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\varvec{k}$$\end{document} distinct points. Although there are some explicit formulas for these probability values in the literature, those applicable to short sequences are not feasible for computations involving sequences of length \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\varvec{256}$$\end{document} bits or more. On the other hand, approximation techniques, or asymptotic approaches, that should be used only when testing long sequences, are not useful for testing sequences of length between \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\varvec{256}$$\end{document} and \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\varvec{4096}$$\end{document}. The recursive formulas, derived in this paper, made it possible to obtain exact values of the corresponding probability distribution functions. Using these formulas, we provide the necessary figures for testing collections of strings of length \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\varvec{2}<^>{\varvec{7}}, \ \varvec{2}<^>{\varvec{8}}, \ \varvec{2}<^>{\varvec{10}}$$\end{document} and \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\varvec{2}<^>{\varvec{12}}$$\end{document} bits. Finally, we apply these nine tests to various collections of strings obtained from different pseudorandom number generators as well as to biased sequences to assess whether the proposed tests can effectively detect non-random data. en_US
dc.identifier.doi 10.1007/s12095-025-00854-y
dc.identifier.issn 1936-2447
dc.identifier.issn 1936-2455
dc.identifier.scopus 2-s2.0-105026288103
dc.identifier.uri https://doi.org/10.1007/s12095-025-00854-y
dc.identifier.uri https://hdl.handle.net/20.500.14411/11107
dc.language.iso en en_US
dc.publisher Springer en_US
dc.relation.ispartof Cryptography and Communications-Discrete Boolean Functions and Sequences en_US
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.subject Cryptography en_US
dc.subject Random Walk en_US
dc.subject Statistical Randomness Testing en_US
dc.subject NIST Test Suite en_US
dc.subject 94A60
dc.subject 94A55
dc.title RW-9: A Family of Random Walk Tests en_US
dc.type Article en_US
dspace.entity.type Publication
gdc.author.scopusid 57193885672
gdc.author.scopusid 36624418400
gdc.author.scopusid 19933556500
gdc.author.scopusid 36165068500
gdc.author.wosid Koçak, Onur/Aaf-5065-2019
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gdc.description.department Atılım University en_US
gdc.description.departmenttemp [Uguz, Muhiddin; Doganaksoy, Ali] Middle East Tech Univ, Dept Math, TR-06800 Ankara, Turkiye; [Sulak, Fatih] Atilim Univ, Dept Math, TR-06830 Ankara, Turkiye; [Kocak, Onur] TUBITAK BILGEM UEAKE, TR-41400 Kocaeli, Turkiye en_US
gdc.description.endpage 230
gdc.description.issue 1
gdc.description.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı en_US
gdc.description.scopusquality Q3
gdc.description.startpage 213
gdc.description.volume 18
gdc.description.woscitationindex Science Citation Index Expanded
gdc.description.wosquality Q2
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gdc.virtual.author Sulak, Fatih
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