Low-Temperature Thermoluminescence in Tlgas<sub>2</Sub> Layered Single Crystals

dc.authorid Gasanly, Nizami/0000-0002-3199-6686
dc.authorid Gasanly, Nizami/0000-0002-3199-6686
dc.authorid Bulur, Enver/0000-0002-4000-7966
dc.authorscopusid 23766993100
dc.authorscopusid 7003860352
dc.authorscopusid 35580905900
dc.authorwosid Gasanly, Nizami/HRE-1447-2023
dc.authorwosid Isik, Mehmet/KMY-5305-2024
dc.authorwosid Gasanly, Nizami/ABA-2249-2020
dc.authorwosid Bulur, Enver/J-6320-2013
dc.contributor.author Isik, M.
dc.contributor.author Bulur, E.
dc.contributor.author Gasanly, N. M.
dc.contributor.other Department of Electrical & Electronics Engineering
dc.date.accessioned 2024-07-05T14:29:08Z
dc.date.available 2024-07-05T14:29:08Z
dc.date.issued 2013
dc.department Atılım University en_US
dc.department-temp [Isik, M.] Atilim Univ, Dept Elect & Elect Engn, TR-06836 Ankara, Turkey; [Bulur, E.; Gasanly, N. M.] Middle E Tech Univ, Dept Phys, TR-06800 Ankara, Turkey en_US
dc.description Gasanly, Nizami/0000-0002-3199-6686; Gasanly, Nizami/0000-0002-3199-6686; Bulur, Enver/0000-0002-4000-7966 en_US
dc.description.abstract Thermoluminescence (TL) measurements have been carried out on TlGaS2 layered single crystals in the temperature range of 10-300 K. After illuminating with blue light (similar to 470 nm) at 10 K, TL glow curves exhibited peaks around 23, 36, 58, 75 and 120 K when measured with a heating rate of 0.8 K/s. The observed peaks were analyzed using curve fitting, initial rise, and peak shape methods to determine the activation energies of the associated defect centers. Analyses have revealed the presence of five defect centers with activation energies of 13, 27, 87, 94 and 291 meV. The results of all methods were found to be in good agreement with each other. The consistency between the theoretical predictions for slow retrapping and experimental results showed that the retrapping process for the observed centers was negligible. The independence of peak position from concentration of carriers trapped in defect levels was also another indication of negligible retrapping. The dependence of TL glow curves on heating rate and distribution of traps was also studied. (C) 2012 Elsevier B.V. All rights reserved. en_US
dc.identifier.citationcount 12
dc.identifier.doi 10.1016/j.jlumin.2012.10.025
dc.identifier.endpage 65 en_US
dc.identifier.issn 0022-2313
dc.identifier.issn 1872-7883
dc.identifier.scopus 2-s2.0-84869130920
dc.identifier.startpage 60 en_US
dc.identifier.uri https://doi.org/10.1016/j.jlumin.2012.10.025
dc.identifier.uri https://hdl.handle.net/20.500.14411/454
dc.identifier.volume 135 en_US
dc.identifier.wos WOS:000316238400012
dc.identifier.wosquality Q2
dc.institutionauthor Işık, Mehmet
dc.language.iso en en_US
dc.publisher Elsevier en_US
dc.relation.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı en_US
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.scopus.citedbyCount 12
dc.subject Semiconductors en_US
dc.subject Thermoluminescence en_US
dc.subject Defects en_US
dc.title Low-Temperature Thermoluminescence in Tlgas<sub>2</Sub> Layered Single Crystals en_US
dc.type Article en_US
dc.wos.citedbyCount 12
dspace.entity.type Publication
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