Carrier scattering mechanisms in GaS<sub>0.5</sub>Se<sub>0.5</sub> layered crystals
dc.authorid | Gasanly, Nizami/0000-0002-3199-6686 | |
dc.authorid | Gasanly, Nizami/0000-0002-3199-6686 | |
dc.authorid | Qasrawi, Atef Fayez/0000-0001-8193-6975 | |
dc.authorscopusid | 6603962677 | |
dc.authorscopusid | 35580905900 | |
dc.authorwosid | Gasanly, Nizami/ABA-2249-2020 | |
dc.authorwosid | Gasanly, Nizami/HRE-1447-2023 | |
dc.authorwosid | Qasrawi, Atef Fayez/R-4409-2019 | |
dc.contributor.author | Qasrawi, AF | |
dc.contributor.author | Gasanly, NM | |
dc.contributor.other | Department of Electrical & Electronics Engineering | |
dc.date.accessioned | 2024-07-05T15:08:54Z | |
dc.date.available | 2024-07-05T15:08:54Z | |
dc.date.issued | 2002 | |
dc.department | Atılım University | en_US |
dc.department-temp | Atilim Univ, Fac Engn, TR-06836 Ankara, Turkey; Middle E Tech Univ, Dept Phys, TR-06531 Ankara, Turkey | en_US |
dc.description | Gasanly, Nizami/0000-0002-3199-6686; Gasanly, Nizami/0000-0002-3199-6686; Qasrawi, Atef Fayez/0000-0001-8193-6975 | en_US |
dc.description.abstract | Systematic dark electrical resistivity and Hall mobility measurements have been carried out in the temperature range 150-400 K on n-type GaS0.5Se0.5 layered crystals. The analysis of temperature dependent electrical resistivity and carrier concentration reveals the extrinsic type of conduction with a donor impurity level located at 0.44 eV, donor and acceptor concentrations of 3.4x10(17) and 4.1x10(17) cm(-1), respectively, and an electron effective mass of 0.41 m(o). The Hall mobility is limited by the electron-phonon short-range interactions scattering at high temperatures combined with the ionized impurity scattering at low temperatures. The electron-phonon short-range interactions scattering mobility analysis reveals an electron-phonon coupling constant of 0.25 and conduction band deformation potential of 5.57 eV/Angstrom. | en_US |
dc.identifier.citation | 9 | |
dc.identifier.doi | 10.1002/1521-4079(200206)37:6<587 | |
dc.identifier.endpage | 594 | en_US |
dc.identifier.issn | 0232-1300 | |
dc.identifier.issue | 6 | en_US |
dc.identifier.scopus | 2-s2.0-0036307274 | |
dc.identifier.startpage | 587 | en_US |
dc.identifier.uri | https://doi.org/10.1002/1521-4079(200206)37:6<587 | |
dc.identifier.uri | https://hdl.handle.net/20.500.14411/1119 | |
dc.identifier.volume | 37 | en_US |
dc.identifier.wos | WOS:000176200200007 | |
dc.identifier.wosquality | Q3 | |
dc.institutionauthor | Qasrawı, Atef Fayez Hasan | |
dc.language.iso | en | en_US |
dc.publisher | Wiley-v C H verlag Gmbh | en_US |
dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | en_US |
dc.rights | info:eu-repo/semantics/closedAccess | en_US |
dc.subject | GaS0.5Se0.5 crystals | en_US |
dc.subject | resistivity | en_US |
dc.subject | Hall mobility | en_US |
dc.subject | scattering mechanisms | en_US |
dc.title | Carrier scattering mechanisms in GaS<sub>0.5</sub>Se<sub>0.5</sub> layered crystals | en_US |
dc.type | Article | en_US |
dspace.entity.type | Publication | |
relation.isAuthorOfPublication | 1138e68c-e06a-4ee2-a5ec-1dd89a3ecc2c | |
relation.isAuthorOfPublication.latestForDiscovery | 1138e68c-e06a-4ee2-a5ec-1dd89a3ecc2c | |
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