Carrier scattering mechanisms in GaS<sub>0.5</sub>Se<sub>0.5</sub> layered crystals

dc.authoridGasanly, Nizami/0000-0002-3199-6686
dc.authoridGasanly, Nizami/0000-0002-3199-6686
dc.authoridQasrawi, Atef Fayez/0000-0001-8193-6975
dc.authorscopusid6603962677
dc.authorscopusid35580905900
dc.authorwosidGasanly, Nizami/ABA-2249-2020
dc.authorwosidGasanly, Nizami/HRE-1447-2023
dc.authorwosidQasrawi, Atef Fayez/R-4409-2019
dc.contributor.authorQasrawı, Atef Fayez Hasan
dc.contributor.authorGasanly, NM
dc.contributor.otherDepartment of Electrical & Electronics Engineering
dc.date.accessioned2024-07-05T15:08:54Z
dc.date.available2024-07-05T15:08:54Z
dc.date.issued2002
dc.departmentAtılım Universityen_US
dc.department-tempAtilim Univ, Fac Engn, TR-06836 Ankara, Turkey; Middle E Tech Univ, Dept Phys, TR-06531 Ankara, Turkeyen_US
dc.descriptionGasanly, Nizami/0000-0002-3199-6686; Gasanly, Nizami/0000-0002-3199-6686; Qasrawi, Atef Fayez/0000-0001-8193-6975en_US
dc.description.abstractSystematic dark electrical resistivity and Hall mobility measurements have been carried out in the temperature range 150-400 K on n-type GaS0.5Se0.5 layered crystals. The analysis of temperature dependent electrical resistivity and carrier concentration reveals the extrinsic type of conduction with a donor impurity level located at 0.44 eV, donor and acceptor concentrations of 3.4x10(17) and 4.1x10(17) cm(-1), respectively, and an electron effective mass of 0.41 m(o). The Hall mobility is limited by the electron-phonon short-range interactions scattering at high temperatures combined with the ionized impurity scattering at low temperatures. The electron-phonon short-range interactions scattering mobility analysis reveals an electron-phonon coupling constant of 0.25 and conduction band deformation potential of 5.57 eV/Angstrom.en_US
dc.identifier.citation9
dc.identifier.doi10.1002/1521-4079(200206)37:6<587
dc.identifier.endpage594en_US
dc.identifier.issn0232-1300
dc.identifier.issue6en_US
dc.identifier.scopus2-s2.0-0036307274
dc.identifier.startpage587en_US
dc.identifier.urihttps://doi.org/10.1002/1521-4079(200206)37:6<587
dc.identifier.urihttps://hdl.handle.net/20.500.14411/1119
dc.identifier.volume37en_US
dc.identifier.wosWOS:000176200200007
dc.identifier.wosqualityQ3
dc.language.isoenen_US
dc.publisherWiley-v C H verlag Gmbhen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectGaS0.5Se0.5 crystalsen_US
dc.subjectresistivityen_US
dc.subjectHall mobilityen_US
dc.subjectscattering mechanismsen_US
dc.titleCarrier scattering mechanisms in GaS<sub>0.5</sub>Se<sub>0.5</sub> layered crystalsen_US
dc.typeArticleen_US
dspace.entity.typePublication
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relation.isAuthorOfPublication.latestForDiscovery1138e68c-e06a-4ee2-a5ec-1dd89a3ecc2c
relation.isOrgUnitOfPublicationc3c9b34a-b165-4cd6-8959-dc25e91e206b
relation.isOrgUnitOfPublication.latestForDiscoveryc3c9b34a-b165-4cd6-8959-dc25e91e206b

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