Residual Lifetime of Consecutive <i>k</i>-out-of-<i>n</i> Systems Under Double Monitoring

dc.authoridKAVLAK, KONUL BAYRAMOGLU/0000-0003-2756-6920
dc.authoridBayramoglu Kavlak, Konul/0000-0003-2756-6920
dc.authoridEryilmaz, Serkan/0000-0002-2108-1781
dc.authorscopusid8203625300
dc.authorscopusid57188964680
dc.authorwosidKAVLAK, KONUL BAYRAMOGLU/HRA-1791-2023
dc.authorwosidEryilmaz, Serkan/AAF-9349-2019
dc.authorwosidBayramoglu Kavlak, Konul/AAW-2317-2020
dc.contributor.authorEryilmaz, Serkan
dc.contributor.authorEryılmaz, Serkan
dc.contributor.authorBayramoglu, Konul
dc.contributor.otherIndustrial Engineering
dc.date.accessioned2024-07-05T14:27:57Z
dc.date.available2024-07-05T14:27:57Z
dc.date.issued2012
dc.departmentAtılım Universityen_US
dc.department-temp[Eryilmaz, Serkan] Atilim Univ, Dept Ind Engn, Ankara, Turkey; [Bayramoglu, Konul] Middle E Tech Univ, Dept Stat, TR-06531 Ankara, Turkeyen_US
dc.descriptionKAVLAK, KONUL BAYRAMOGLU/0000-0003-2756-6920; Bayramoglu Kavlak, Konul/0000-0003-2756-6920; Eryilmaz, Serkan/0000-0002-2108-1781en_US
dc.description.abstractThe consecutive k-out-of-n systems are important structures in reliability engineering due to their applications in various real life situations. In this paper, we study the residual lifetime of these systems under the condition that the total number of failed components at time is, and at time t(2) (t(2) > t(1)) the system is still working. We obtain explicit expressions for the survival function of the corresponding residual life when the components are exchangeably dependent. We also obtain a signature-based mixture representation for a coherent system satisfying a certain property.en_US
dc.identifier.citation15
dc.identifier.doi10.1109/TR.2012.2206272
dc.identifier.endpage797en_US
dc.identifier.issn0018-9529
dc.identifier.issue3en_US
dc.identifier.scopus2-s2.0-84865745780
dc.identifier.startpage792en_US
dc.identifier.urihttps://doi.org/10.1109/TR.2012.2206272
dc.identifier.urihttps://hdl.handle.net/20.500.14411/330
dc.identifier.volume61en_US
dc.identifier.wosWOS:000308424000019
dc.identifier.wosqualityQ1
dc.language.isoenen_US
dc.publisherIeee-inst Electrical Electronics Engineers incen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectConsecutive k-out-of-n systemsen_US
dc.subjectexchangeabilityen_US
dc.subjectmean residual lifetimeen_US
dc.subjectsignatureen_US
dc.titleResidual Lifetime of Consecutive <i>k</i>-out-of-<i>n</i> Systems Under Double Monitoringen_US
dc.typeArticleen_US
dspace.entity.typePublication
relation.isAuthorOfPublication37862217-5541-47e3-9406-e21aa38e7fdf
relation.isAuthorOfPublication.latestForDiscovery37862217-5541-47e3-9406-e21aa38e7fdf
relation.isOrgUnitOfPublication12c9377e-b7fe-4600-8326-f3613a05653d
relation.isOrgUnitOfPublication.latestForDiscovery12c9377e-b7fe-4600-8326-f3613a05653d

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