Residual Lifetime of Consecutive <i>k</I>-out-of-<i>n< Systems Under Double Monitoring

dc.authorid KAVLAK, KONUL BAYRAMOGLU/0000-0003-2756-6920
dc.authorid Bayramoglu Kavlak, Konul/0000-0003-2756-6920
dc.authorid Eryilmaz, Serkan/0000-0002-2108-1781
dc.authorscopusid 8203625300
dc.authorscopusid 57188964680
dc.authorwosid KAVLAK, KONUL BAYRAMOGLU/HRA-1791-2023
dc.authorwosid Eryilmaz, Serkan/AAF-9349-2019
dc.authorwosid Bayramoglu Kavlak, Konul/AAW-2317-2020
dc.contributor.author Eryilmaz, Serkan
dc.contributor.author Bayramoglu, Konul
dc.contributor.other Industrial Engineering
dc.date.accessioned 2024-07-05T14:27:57Z
dc.date.available 2024-07-05T14:27:57Z
dc.date.issued 2012
dc.department Atılım University en_US
dc.department-temp [Eryilmaz, Serkan] Atilim Univ, Dept Ind Engn, Ankara, Turkey; [Bayramoglu, Konul] Middle E Tech Univ, Dept Stat, TR-06531 Ankara, Turkey en_US
dc.description KAVLAK, KONUL BAYRAMOGLU/0000-0003-2756-6920; Bayramoglu Kavlak, Konul/0000-0003-2756-6920; Eryilmaz, Serkan/0000-0002-2108-1781 en_US
dc.description.abstract The consecutive k-out-of-n systems are important structures in reliability engineering due to their applications in various real life situations. In this paper, we study the residual lifetime of these systems under the condition that the total number of failed components at time is, and at time t(2) (t(2) > t(1)) the system is still working. We obtain explicit expressions for the survival function of the corresponding residual life when the components are exchangeably dependent. We also obtain a signature-based mixture representation for a coherent system satisfying a certain property. en_US
dc.identifier.citationcount 15
dc.identifier.doi 10.1109/TR.2012.2206272
dc.identifier.endpage 797 en_US
dc.identifier.issn 0018-9529
dc.identifier.issue 3 en_US
dc.identifier.scopus 2-s2.0-84865745780
dc.identifier.startpage 792 en_US
dc.identifier.uri https://doi.org/10.1109/TR.2012.2206272
dc.identifier.uri https://hdl.handle.net/20.500.14411/330
dc.identifier.volume 61 en_US
dc.identifier.wos WOS:000308424000019
dc.identifier.wosquality Q1
dc.institutionauthor Eryılmaz, Serkan
dc.language.iso en en_US
dc.publisher Ieee-inst Electrical Electronics Engineers inc en_US
dc.relation.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı en_US
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.scopus.citedbyCount 16
dc.subject Consecutive k-out-of-n systems en_US
dc.subject exchangeability en_US
dc.subject mean residual lifetime en_US
dc.subject signature en_US
dc.title Residual Lifetime of Consecutive <i>k</I>-out-of-<i>n< Systems Under Double Monitoring en_US
dc.type Article en_US
dc.wos.citedbyCount 15
dspace.entity.type Publication
relation.isAuthorOfPublication 37862217-5541-47e3-9406-e21aa38e7fdf
relation.isAuthorOfPublication.latestForDiscovery 37862217-5541-47e3-9406-e21aa38e7fdf
relation.isOrgUnitOfPublication 12c9377e-b7fe-4600-8326-f3613a05653d
relation.isOrgUnitOfPublication.latestForDiscovery 12c9377e-b7fe-4600-8326-f3613a05653d

Files

Collections