Residual Lifetime of Consecutive <i>k</i>-out-of-<i>n</i> Systems Under Double Monitoring

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2012

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Ieee-inst Electrical Electronics Engineers inc

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Industrial Engineering
(1998)
Industrial Engineering is a field of engineering that develops and applies methods and techniques to design, implement, develop and improve systems comprising of humans, materials, machines, energy and funding. Our department was founded in 1998, and since then, has graduated hundreds of individuals who may compete nationally and internationally into professional life. Accredited by MÜDEK in 2014, our student-centered education continues. In addition to acquiring the knowledge necessary for every Industrial engineer, our students are able to gain professional experience in their desired fields of expertise with a wide array of elective courses, such as E-commerce and ERP, Reliability, Tabulation, or Industrial Engineering Applications in the Energy Sector. With dissertation projects fictionalized on solving real problems at real companies, our students gain experience in the sector, and a wide network of contacts. Our education is supported with ERASMUS programs. With the scientific studies of our competent academic staff published in internationally-renowned magazines, our department ranks with the bests among other universities. IESC, one of the most active student networks at our university, continues to organize extensive, and productive events every year.

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Abstract

The consecutive k-out-of-n systems are important structures in reliability engineering due to their applications in various real life situations. In this paper, we study the residual lifetime of these systems under the condition that the total number of failed components at time is, and at time t(2) (t(2) > t(1)) the system is still working. We obtain explicit expressions for the survival function of the corresponding residual life when the components are exchangeably dependent. We also obtain a signature-based mixture representation for a coherent system satisfying a certain property.

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KAVLAK, KONUL BAYRAMOGLU/0000-0003-2756-6920; Bayramoglu Kavlak, Konul/0000-0003-2756-6920; Eryilmaz, Serkan/0000-0002-2108-1781
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KAVLAK, KONUL BAYRAMOGLU ORCID logo
Bayramoglu Kavlak, Konul ORCID logo
Eryilmaz, Serkan ORCID logo

Keywords

Consecutive k-out-of-n systems, exchangeability, mean residual lifetime, signature

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15

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Volume

61

Issue

3

Start Page

792

End Page

797

URI

https://doi.org/10.1109/TR.2012.2206272
 https://hdl.handle.net/20.500.14411/330

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