Ellipsometric Study of Optical Properties of Gas<sub>x</Sub>se<sub>1-x< Layered Mixed Crystals
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Date
2016
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier Science Bv
Open Access Color
Green Open Access
No
OpenAIRE Downloads
OpenAIRE Views
Publicly Funded
No
Abstract
Spectroscopic ellipsometry measurements were performed on GaSxSe1-x mixed crystals (0 <= x <= 1) in the 1.2-6.2 eV range. Spectral dependence of optical parameters; real and imaginary components of pseudodielectric function, pseudorefractive index and pseudoextinction coefficient were reported in the present work. Critical point (CP) analyses on second-energy derivative spectra of the pseudodielectric function were accomplished to find the interband transition energies. The revealed energy values were associated with each other taking into account the fact that band gap energy of mixed crystals rises with increase in sulfur content. The variation of CP energies with composition (x) was also plotted. Peaks in the spectra of studied optical parameters and CP energy values were observed to be shifted to higher energy values as sulfur concentration is increased in the mixed crystals. (C) 2016 Elsevier B.V. All rights reserved.
Description
Gasanly, Nizami/0000-0002-3199-6686; Gasanly, Nizami/0000-0002-3199-6686
Keywords
Semiconductors, Ellipsometry, Optical parameters
Fields of Science
0103 physical sciences, 02 engineering and technology, 0210 nano-technology, 01 natural sciences
Citation
WoS Q
Q1
Scopus Q

OpenCitations Citation Count
9
Source
Optical Materials
Volume
54
Issue
Start Page
155
End Page
159
PlumX Metrics
Citations
CrossRef : 4
Scopus : 10
Captures
Mendeley Readers : 8
SCOPUS™ Citations
10
checked on May 04, 2026
Web of Science™ Citations
10
checked on May 04, 2026
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