Trapping Center Parameters in In<sub>6</Sub>s<sub>7< Crystals
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Date
2011
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier Science Bv
Open Access Color
Green Open Access
No
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Publicly Funded
No
Abstract
Thermally stimulated current measurements were carried out on In6S7 single crystals in the temperature range of 10-225 K with a constant heating rate of 0.8 K/s. The study of trapping centers was accomplished by the measurements of current flowing along the c-axis of crystals. The analysis of the glow curve according to various methods, such as curve fitting, initial rise and peak shape methods, gives results in good agreement with each other and revealed two trapping centers in In6S7 with activation energies of 157 and 290 meV. Their capture cross sections have been determined as 7.5 x 10(-23) and 7.1 x 10(-20) cm(2),respectively. The good agreement between the experimental results and the theoretical predictions of the model that assumes slow retrapping has confirmed that retrapping is negligible in these centers. (C) 2011 Elsevier B.V. All rights reserved.
Description
Gasanly, Nizami/0000-0002-3199-6686; Gasanly, Nizami/0000-0002-3199-6686; Isik, Mehmet/0000-0003-2119-8266
Keywords
Semiconductors, Chalcogenides, Defects, Electrical properties
Turkish CoHE Thesis Center URL
Fields of Science
02 engineering and technology, 0210 nano-technology, 01 natural sciences, 0104 chemical sciences
Citation
WoS Q
Q2
Scopus Q

OpenCitations Citation Count
1
Source
Physica B: Condensed Matter
Volume
406
Issue
13
Start Page
2650
End Page
2653
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CrossRef : 1
Scopus : 2
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Mendeley Readers : 5
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2
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Web of Science™ Citations
2
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1
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