Trapping Center Parameters in In<sub>6</Sub>s<sub>7< Crystals

dc.authoridGasanly, Nizami/0000-0002-3199-6686
dc.authoridGasanly, Nizami/0000-0002-3199-6686
dc.authoridIsik, Mehmet/0000-0003-2119-8266
dc.authorscopusid23766993100
dc.authorscopusid35580905900
dc.authorwosidGasanly, Nizami/HRE-1447-2023
dc.authorwosidGasanly, Nizami/ABA-2249-2020
dc.contributor.authorIsik, M.
dc.contributor.authorGasanly, N. M.
dc.contributor.otherDepartment of Electrical & Electronics Engineering
dc.date.accessioned2024-07-05T15:10:54Z
dc.date.available2024-07-05T15:10:54Z
dc.date.issued2011
dc.departmentAtılım Universityen_US
dc.department-temp[Isik, M.] Atilim Univ, Dept Elect & Elect Engn, TR-06836 Ankara, Turkey; [Gasanly, N. M.] Middle E Tech Univ, Dept Phys, TR-06531 Ankara, Turkeyen_US
dc.descriptionGasanly, Nizami/0000-0002-3199-6686; Gasanly, Nizami/0000-0002-3199-6686; Isik, Mehmet/0000-0003-2119-8266en_US
dc.description.abstractThermally stimulated current measurements were carried out on In6S7 single crystals in the temperature range of 10-225 K with a constant heating rate of 0.8 K/s. The study of trapping centers was accomplished by the measurements of current flowing along the c-axis of crystals. The analysis of the glow curve according to various methods, such as curve fitting, initial rise and peak shape methods, gives results in good agreement with each other and revealed two trapping centers in In6S7 with activation energies of 157 and 290 meV. Their capture cross sections have been determined as 7.5 x 10(-23) and 7.1 x 10(-20) cm(2),respectively. The good agreement between the experimental results and the theoretical predictions of the model that assumes slow retrapping has confirmed that retrapping is negligible in these centers. (C) 2011 Elsevier B.V. All rights reserved.en_US
dc.identifier.citationcount2
dc.identifier.doi10.1016/j.physb.2011.04.008
dc.identifier.endpage2653en_US
dc.identifier.issn0921-4526
dc.identifier.issue13en_US
dc.identifier.scopus2-s2.0-79957608362
dc.identifier.startpage2650en_US
dc.identifier.urihttps://doi.org/10.1016/j.physb.2011.04.008
dc.identifier.urihttps://hdl.handle.net/20.500.14411/1355
dc.identifier.volume406en_US
dc.identifier.wosWOS:000291973000031
dc.institutionauthorIşık, Mehmet
dc.language.isoenen_US
dc.publisherElsevier Science Bven_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.scopus.citedbyCount2
dc.subjectSemiconductorsen_US
dc.subjectChalcogenidesen_US
dc.subjectDefectsen_US
dc.subjectElectrical propertiesen_US
dc.titleTrapping Center Parameters in In<sub>6</Sub>s<sub>7< Crystalsen_US
dc.typeArticleen_US
dc.wos.citedbyCount2
dspace.entity.typePublication
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