Effect of Au/Ge substrate on the properties of GaSe

dc.authoridQasrawi, Atef Fayez/0000-0001-8193-6975
dc.authorscopusid6603962677
dc.authorscopusid57201820643
dc.authorwosidQasrawi, Atef Fayez/R-4409-2019
dc.contributor.authorQasrawı, Atef Fayez Hasan
dc.contributor.authorAbdallah, Maisam M. A.
dc.contributor.otherDepartment of Electrical & Electronics Engineering
dc.date.accessioned2024-07-05T15:30:08Z
dc.date.available2024-07-05T15:30:08Z
dc.date.issued2018
dc.departmentAtılım Universityen_US
dc.department-temp[Qasrawi, A. F.; Abdallah, Maisam M. A.] Arab Amer Univ, Dept Phys, Jenin, Palestine; [Qasrawi, A. F.] Atilim Univ, Fac Engn, TR-06836 Ankara, Turkeyen_US
dc.descriptionQasrawi, Atef Fayez/0000-0001-8193-6975en_US
dc.description.abstractIn this work, the effect of glass/Ge and Au/Ge substrate on the structural, optical and electrical properties of the GaSe thin films is investigated by means of X-ray diffraction, ultraviolet-visible light spectrophotometry and impedance spectroscopy techniques, respectively. While the glass/Ge, glass/GaSe and glass/Ge/GaSe are observed to exhibit amorphous nature of structure, the Au/Ge, and Au/Ge/GaSe are of polycrystalline nature. The formation of the Ge/GaSe interface exhibited high conduction band offset of value of 0.90 eV and enhanced the light absorbability of GaSe at 1.47 eV by 80 times. In addition, the modeling of the dielectric spectra for the Ge/GaSe interface revealed optical conductivity parameters presented by scattering time at femtosecond level and improvement of the drift mobility. Moreover, the impedance spectroscopy measurements have shown that with the increasing frequency, the Au/Ge/GaSe/Yb interface exhibit increasing trend of variation in the resistance causing high impedance mode associated with negative capacitance values below 1300 MHz. The effect is completely reversed in the higher range of frequency. These features of the Ge/GaSe interface nominate it as plasmonic interface, microwave cavities and as voltage amplifiers in low power nanoscale devices. (C) 2018 Elsevier GmbH. All rights reserved.en_US
dc.description.sponsorshipDeanship of Scientific Research (DSR), at Arab American University, Jenin, Palestine; DSRen_US
dc.description.sponsorshipThis project was funded by the Deanship of Scientific Research (DSR), at Arab American University, Jenin, Palestine. The authors, therefore, acknowledge with thanking the DSR technical and financial support.en_US
dc.identifier.citation3
dc.identifier.doi10.1016/j.ijleo.2018.04.122
dc.identifier.endpage487en_US
dc.identifier.issn0030-4026
dc.identifier.scopus2-s2.0-85046170020
dc.identifier.startpage481en_US
dc.identifier.urihttps://doi.org/10.1016/j.ijleo.2018.04.122
dc.identifier.urihttps://hdl.handle.net/20.500.14411/3007
dc.identifier.volume168en_US
dc.identifier.wosWOS:000436215800061
dc.identifier.wosqualityQ2
dc.language.isoenen_US
dc.publisherElsevier Gmbhen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectGe substrateen_US
dc.subjectOptical materialsen_US
dc.subjectCoating Dielectric propertiesen_US
dc.subjectDrude-Lorentzen_US
dc.titleEffect of Au/Ge substrate on the properties of GaSeen_US
dc.typeArticleen_US
dspace.entity.typePublication
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relation.isAuthorOfPublication.latestForDiscovery1138e68c-e06a-4ee2-a5ec-1dd89a3ecc2c
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relation.isOrgUnitOfPublication.latestForDiscoveryc3c9b34a-b165-4cd6-8959-dc25e91e206b

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