Illumination and Voltage Effects on the Forward and Reverse Bias Current-Voltage (i-V) Characteristics in In/In<sub>2< Photodiodes

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Date

2021

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Volume Title

Publisher

Springer

Open Access Color

Green Open Access

No

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Abstract

The illumination and voltage effects on the I-V measurements of the fabricated In/In2S3/p-Si photodiode were investigated in dark and under various illumination intensities (20-100 mW/cm(2)) between +/- 2 V. Two linear regions in the forward-bias ln(I)-V plots were observed. The value of diode ideality factor (n) had an increasing trend with increasing illumination intensity while the barrier height (phi(Bo)) had a decreasing trend due to the increase of photocurrent. The photodiode properties were also investigated, and the value of linear-dynamic value range (LDR) was found to be 20.56 dB. The photoresponse (I-ph/I-dark), the photoresponsivity (R), and specific detectivity (D*) of the photodiode were calculated as a function of the illumination. The open-circuit voltage (V-oc) and short-current (I-sc) were found to be 0.36 V and 2.87 mA under 100 mW.cm(-2) illumination intensity, respectively. The possible conduction mechanisms (CMs) were investigated using the forward ln(I)-V and reverse ln(I)-V-0.5 plots. The energy-dependent surface states (N-ss) profile was extracted from the positive I-V data by considering voltage-dependent barrier height (BH) and ideality factor (n) in dark and illumination at 100 mW/cm(2).

Description

SURUCU, Özge/0000-0002-8478-1267; Yükseltürk, Esra/0000-0002-4527-6401; parlak, mehmet/0000-0001-9542-5121

Keywords

[No Keyword Available], Diode ideality factors, Specific detectivity, Open circuit voltage, I-V measurements, Photocurrents, Photoresponsivity, Conduction Mechanism, Illumination intensity, Indium compounds, Bias voltage, Silicon compounds, Energy dependent, Photodiodes, Ideality factors

Fields of Science

0103 physical sciences, 02 engineering and technology, 0210 nano-technology, 01 natural sciences

Citation

WoS Q

Q2

Scopus Q

Q2
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OpenCitations Citation Count
26

Source

Journal of Materials Science: Materials in Electronics

Volume

32

Issue

17

Start Page

21825

End Page

21836

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Scopus : 40

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Mendeley Readers : 28

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