Infrared and Raman scattering spectra of layered structured Ga<sub>3</sub>InSe<sub>4</sub> crystals

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dc.authoridGasanly, Nizami/0000-0002-3199-6686
dc.authoridGasanly, Nizami/0000-0002-3199-6686
dc.authoridKorkmaz, Filiz/0000-0003-3512-3521
dc.authorscopusid23766993100
dc.authorscopusid35580905900
dc.authorscopusid8664101000
dc.authorwosidGasanly, Nizami/ABA-2249-2020
dc.authorwosidGasanly, Nizami/HRE-1447-2023
dc.authorwosidKorkmaz, Filiz/GOH-1457-2022
dc.authorwosidIsik, Mehmet/KMY-5305-2024
dc.contributor.authorIşık, Mehmet
dc.contributor.authorGasanly, N. M.
dc.contributor.authorKorkmaz, F.
dc.contributor.otherDepartment of Electrical & Electronics Engineering
dc.date.accessioned2024-07-05T14:29:08Z
dc.date.available2024-07-05T14:29:08Z
dc.date.issued2013
dc.departmentAtılım Universityen_US
dc.department-temp[Isik, M.; Korkmaz, F.] Atilim Univ, Dept Elect & Elect Engn, TR-06836 Ankara, Turkey; [Gasanly, N. M.] Middle E Tech Univ, Dept Phys, TR-06800 Ankara, Turkeyen_US
dc.descriptionGasanly, Nizami/0000-0002-3199-6686; Gasanly, Nizami/0000-0002-3199-6686; Korkmaz, Filiz/0000-0003-3512-3521;en_US
dc.description.abstractThe infrared reflectivity and transmittance and Raman scattering in Ga3InSe4 layered crystals were investigated in the frequency ranges of 100-400, 400-4000 and 25-500 cm(-1). The refractive and absorption indices, the frequencies of transverse and longitudinal optical modes, high- and low-frequency dielectric constants were obtained from the analysis of the IR reflectivity spectra. The bands observed in IR transmittance spectra were interpreted in terms of two-phonon absorption processes. (C) 2012 Elsevier B.V. All rights reserved.en_US
dc.identifier.citation0
dc.identifier.doi10.1016/j.physb.2012.12.017
dc.identifier.endpage63en_US
dc.identifier.issn0921-4526
dc.identifier.scopus2-s2.0-84873346543
dc.identifier.startpage61en_US
dc.identifier.urihttps://doi.org/10.1016/j.physb.2012.12.017
dc.identifier.urihttps://hdl.handle.net/20.500.14411/458
dc.identifier.volume412en_US
dc.identifier.wosWOS:000314764900012
dc.language.isoenen_US
dc.publisherElsevier Science Bven_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectSemiconductorsen_US
dc.subjectChalcogenidesen_US
dc.subjectOptical propertiesen_US
dc.subjectRaman scatteringen_US
dc.titleInfrared and Raman scattering spectra of layered structured Ga<sub>3</sub>InSe<sub>4</sub> crystalsen_US
dc.typeArticleen_US
dspace.entity.typePublication
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relation.isAuthorOfPublication.latestForDiscovery0493a5b0-644f-4893-9f39-87538d8d6709
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relation.isOrgUnitOfPublication.latestForDiscoveryc3c9b34a-b165-4cd6-8959-dc25e91e206b

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