Time Complexity Comparison of Stopping at First Failure and Completely Running the Test

No Thumbnail Available

Date

2020

Journal Title

Journal ISSN

Volume Title

Publisher

Springer

Open Access Color

Green Open Access

No

OpenAIRE Downloads

OpenAIRE Views

Publicly Funded

No
Impulse
Average
Influence
Average
Popularity
Average

Research Projects

Journal Issue

Abstract

For a given test set, we compare two test application techniques, "stopping at first failure" and "complete run", respectively. The former stops the test whenever a failure is encountered. The latter however, carries on till the end. Our comparison concludes that although the first technique is generally faster, there is no strong evidence to support a complete rejection of the second technique for it provides statistics useful in test planning. Results support an interchangeable application of both techniques with more frequent use of stopping at first failure. Even though there are numerous studies to decide how to prioritize and select test cases (TC), or to examine dependencies of TCs and codes, the presented comparison of the two test application techniques for a given "test set" has the potential to reduce the total run time of the test.

Description

Yucesan, Ongun/0000-0003-2263-6803

Keywords

High-volume testing, VLSI test application, Test application time, Stopping on first failure, Running all tests, Test planning

Turkish CoHE Thesis Center URL

Fields of Science

0202 electrical engineering, electronic engineering, information engineering, 02 engineering and technology

Citation

WoS Q

Q4

Scopus Q

Q3
OpenCitations Logo
OpenCitations Citation Count
N/A

Source

Journal of Electronic Testing

Volume

36

Issue

3

Start Page

409

End Page

417

Collections

PlumX Metrics
Citations

Scopus : 0

Google Scholar Logo
Google Scholar™
OpenAlex Logo
OpenAlex FWCI
0.0

Sustainable Development Goals

SDG data is not available