Time Complexity Comparison of Stopping at First Failure and Completely Running the Test

dc.contributor.author Yucesan, Ongun
dc.contributor.author Ozkil, Altan
dc.date.accessioned 2024-07-05T15:30:25Z
dc.date.available 2024-07-05T15:30:25Z
dc.date.issued 2020-06
dc.description Yucesan, Ongun/0000-0003-2263-6803 en_US
dc.description.abstract For a given test set, we compare two test application techniques, "stopping at first failure" and "complete run", respectively. The former stops the test whenever a failure is encountered. The latter however, carries on till the end. Our comparison concludes that although the first technique is generally faster, there is no strong evidence to support a complete rejection of the second technique for it provides statistics useful in test planning. Results support an interchangeable application of both techniques with more frequent use of stopping at first failure. Even though there are numerous studies to decide how to prioritize and select test cases (TC), or to examine dependencies of TCs and codes, the presented comparison of the two test application techniques for a given "test set" has the potential to reduce the total run time of the test. en_US
dc.identifier.doi 10.1007/s10836-020-05884-3
dc.identifier.issn 0923-8174
dc.identifier.issn 1573-0727
dc.identifier.scopus 2-s2.0-85086449873
dc.identifier.uri https://doi.org/10.1007/s10836-020-05884-3
dc.identifier.uri https://hdl.handle.net/20.500.14411/3040
dc.language.iso en en_US
dc.publisher Springer en_US
dc.relation.ispartof Journal of Electronic Testing
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.subject High-volume testing en_US
dc.subject VLSI test application en_US
dc.subject Test application time en_US
dc.subject Stopping on first failure en_US
dc.subject Running all tests en_US
dc.subject Test planning en_US
dc.title Time Complexity Comparison of Stopping at First Failure and Completely Running the Test en_US
dc.type Article en_US
dspace.entity.type Publication
gdc.author.id Yucesan, Ongun/0000-0003-2263-6803
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gdc.description.department Atılım University en_US
gdc.description.departmenttemp [Yucesan, Ongun] MODES Atilim Univ, Ankara, Turkey; [Ozkil, Altan] Atilim Univ, Sch Civil Aviat, Ankara, Turkey en_US
gdc.description.endpage 417 en_US
gdc.description.issue 3 en_US
gdc.description.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı en_US
gdc.description.scopusquality Q3
gdc.description.startpage 409 en_US
gdc.description.volume 36 en_US
gdc.description.woscitationindex Science Citation Index Expanded
gdc.description.wosquality Q4
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gdc.oaire.sciencefields 0202 electrical engineering, electronic engineering, information engineering
gdc.oaire.sciencefields 02 engineering and technology
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