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Işık, Mehmet
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Mehmet, Işık
M.,Işık
Isik, Mehmet
Mehmet, Isik
I., Mehmet
I.,Mehmet
Işık,M.
Isik,M.
I.,Mehmet
M.,Isik
Işık, Mehmet
M., Isik
Isik, M.
M.,Işık
Isik, Mehmet
Mehmet, Isik
I., Mehmet
I.,Mehmet
Işık,M.
Isik,M.
I.,Mehmet
M.,Isik
Işık, Mehmet
M., Isik
Isik, M.
Job Title
Profesör Doktor
Email Address
mehmet.isik@atilim.edu.tr
Main Affiliation
Department of Electrical & Electronics Engineering
Status
Former Staff
Website
ORCID ID
Scopus Author ID
Turkish CoHE Profile ID
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WoS Researcher ID
Sustainable Development Goals
2
ZERO HUNGER
0
Research Products
11
SUSTAINABLE CITIES AND COMMUNITIES
0
Research Products
14
LIFE BELOW WATER
1
Research Products
6
CLEAN WATER AND SANITATION
0
Research Products
1
NO POVERTY
0
Research Products
5
GENDER EQUALITY
0
Research Products
9
INDUSTRY, INNOVATION AND INFRASTRUCTURE
0
Research Products
16
PEACE, JUSTICE AND STRONG INSTITUTIONS
0
Research Products
17
PARTNERSHIPS FOR THE GOALS
0
Research Products
15
LIFE ON LAND
1
Research Products
10
REDUCED INEQUALITIES
0
Research Products
7
AFFORDABLE AND CLEAN ENERGY
11
Research Products
8
DECENT WORK AND ECONOMIC GROWTH
0
Research Products
4
QUALITY EDUCATION
0
Research Products
12
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0
Research Products
3
GOOD HEALTH AND WELL-BEING
1
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13
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0
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This researcher does not have a Scopus ID.
This researcher does not have a WoS ID.
Scholarly Output
173
Articles
169
Views / Downloads
442/792
Supervised MSc Theses
3
Supervised PhD Theses
0
WoS Citation Count
1802
Scopus Citation Count
1861
WoS h-index
20
Scopus h-index
20
Patents
0
Projects
0
WoS Citations per Publication
10.42
Scopus Citations per Publication
10.76
Open Access Source
11
Supervised Theses
3
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| Journal | Count |
|---|---|
| Optical Materials | 17 |
| Physica B: Condensed Matter | 16 |
| Journal of Luminescence | 15 |
| Materials Science in Semiconductor Processing | 14 |
| Journal of Materials Science: Materials in Electronics | 12 |
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24 results
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Now showing 1 - 10 of 24
Article Citation - WoS: 23Citation - Scopus: 25Investigation of Optical Properties of Bi12geo20< Sillenite Crystals by Spectroscopic Ellipsometry and Raman Spectroscopy(Elsevier Sci Ltd, 2020) Isik, M.; Delice, S.; Gasanly, N. M.; Darvishov, N. H.; Bagiev, V. E.Bi12GeO20 (BGO) compound is one of the fascinating members of sillenites group due to its outstanding photorefractive and photocatalytic characteristics. The present paper aims at investigating optical properties of BGO crystals by means of spectroscopic ellipsometry and Raman spectroscopy measurements. Bi12GeO20 single crystals grown by Czochralski method were structurally characterized by X-ray diffraction (XRD) experiments and the analyses showed that studied crystals have cubic crystalline structure. Raman spectrum exhibited 15 peaks associated with A, E and F modes. Spectroscopic ellipsometry measurement data achieved in the energy region between 1.2 and 6.2 eV were used in the air/sample optical model to get knowledge about complex pseudodielectric constant, pseudorefractive index, pseudoextinction and absorption coefficients of the crystals. Spectral change of real and imaginary part of complex pseudodielectric constant were discussed in detail. Band gap energy of Bi12GeO20 single crystals was calculated to be 3.18 eV using absorption coefficient dependency on photon energy. Critical point energies at which photons are strongly absorbed were determined by utilizing the second energy derivative spectra of components of complex pseudodielectric function. Fitting of both spectra resulted in the presence of four interband transitions with energies of 3.49, 4.11, 4.67 and 5.51 eV.Article Citation - WoS: 9Citation - Scopus: 10Spectroscopic Ellipsometry Investigation of Optical Properties of Β-ga2s3< Single Crystals(Elsevier Science Bv, 2018) Isik, M.; Gasanly, N. M.; Gasanova, L.Ga2S3 single crystals were studied by x-ray diffraction (XRD), energy dispersive spectroscopy and spectroscopic ellipsometry measurements. XRD pattern of the sample is well-matched with reported hexagonal structure of beta-Ga2S3 . The spectra of real and imaginary parts of complex dielectric function (epsilon = epsilon(1) + epsilon(2)) and refractive index (N = n + ik) were plotted in the 1.2-6.2 eV range according to results of ellipsometric data. The e 2 -spectrum and analyses of absorption coefficient pointed out that studied sample has band gap energy of 2.48 eV which is consistent with that of beta-Ga(2)S(3)2. Critical point energies of beta-Ga2S3 were also reported in the present study.Article Citation - WoS: 2Citation - Scopus: 2Optical Characterization of Nabi(moo4)2< Crystal by Spectroscopic Ellipsometry(Springer Heidelberg, 2024) Guler, I.; Isik, M.; Gasanly, N. M.The compound NaBi(MoO4)(2) has garnered significant interest in optoelectronic fields. This study employs spectroscopic ellipsometry to thoroughly examine the linear and nonlinear optical characteristics of NaBi(MoO4)(2) crystals, offering detailed insights into their optical behavior. Our investigation presents a precise method for discerning the crystal's spectral features, revealing the spectral variations of key optical parameters such as refractive index, extinction coefficient, dielectric function, and absorption coefficient within the 1.2-5.0 eV range. Through analysis, we determined optical attributes including bandgap energy, critical point energy, and single oscillator parameters. Additionally, we explored the nonlinear optical properties of NaBi(MoO4)(2), unveiling potential applications such as optoelectronic devices, frequency conversion, and optical sensors. This study enhances comprehension of optical properties of NaBi(MoO4)(2), underscoring its significance in future optical and electronic advancements.Article Citation - WoS: 5Citation - Scopus: 5Absorption Edge and Optical Constants of Tl2ga2< Crystals From Reflection and Transmission, and Ellipsometric Measurements(Elsevier, 2012) Isik, M.; Gasanly, N. M.The optical properties of Tl2Ga2S3Se layered crystalline semiconductors were investigated from transmission, reflection and ellipsometric measurements. The experimental results of the room temperature transmission and reflection measurements performed in the wavelength range of 400-1100 nm showed the presence of both indirect and direct transitions in the band structure of the crystals with 2.38 and 2.62 eV band gap energies. Spectroscopic ellipsometry measurements on Tl2Ga2S3Se crystals were carried out on the layer-plane (0 0 1) surfaces with light polarization E perpendicular to c* in the 1.20-4.70 eV spectral range at room temperature. The real and imaginary parts of the dielectric function as well as refractive and absorption indices were found as a result of analysis of ellipsometric data. The Wemple-DiDomenico single-effective-oscillator model was used to study the dispersion of the refractive index in the below band gap energy range. The structures of critical points have been characterized from the second derivative spectra of the dielectric function. The analysis revealed four interband transition structures with 3.14, 3.40, 3.86 and 4.50 eV critical point energies. (C) 2012 Elsevier B.V. All rights reserved.Article Citation - WoS: 7Citation - Scopus: 7Exploring the Linear and Nonlinear Optical Behavior of (tlins2)0.75(tlinse2)0.25: Insights From Ellipsometry Measurements(Elsevier, 2023) Isik, M.; Guler, I.; Gasanly, N.The search for layered structured new semiconductor materials with remarkable optical properties has become a driving force, especially for materials science. Tl2In2S3Se [(TlInS2)0.75(TlInSe2)0.25], a fascinating compound, holds great promise for advanced photonic and optoelectronic applications. In the present study, the linear and nonlinear optical properties of Tl2In2S3Se layered single crystals were studied by ellipsometry measurements. The variation of refractive index, extinction coefficient, absorption coefficient and skin depth with energy were investigated. Applying the derivative analysis technique to the absorption spectrum, indirect bandgap was found as 2.19 eV. The refractive index data was analyzed considering single-effective-oscillator model. The lattice dielectric constant, plasma frequency, carrier density to the effective mass ratio and zero-frequency refractive index were found. Moreover, the change in optical conductivity with energy yielded to determine the direct bandgap as 2.40 eV. The optical parameters of nonlinear refractive index, first-and third-order nonlinear susceptibilities were also reported.Article Citation - WoS: 1Citation - Scopus: 2Spectroscopic Ellipsometry Studies of Optical Properties of Tlin(s0.25se0.75< Crystal(Springer Heidelberg, 2023) Guler, I.; Isik, M.; Gasanly, N.The optical properties of TlIn(S0.25Se0.75)(2) crystals were studied by ellipsometry measurements. X-ray diffraction pattern presented well-defined peaks associated with monoclinic structure. Energy dependent graphs of various linear optical parameters of the crystal were presented in the 1.25-4.50 eV range. The band gap and Urbach energies of the compound were found as 1.96 and 0.68 eV, respectively, from the analyses of the absorption coefficient. Refractive index spectrum was analyzed considering the single-effective-oscillator model to get oscillator and dispersion energies, zero and high frequency dielectric constants, plasma frequency. Moreover, the nonlinear refractive index, first-order and third-order nonlinear susceptibilities of TlIn(S0.25Se0.75)(2) crystal were revealed in the present paper.Article Citation - WoS: 12Citation - Scopus: 12Interband Transitions in Gallium Sulfide Layered Single Crystals by Ellipsometry Measurements(Elsevier, 2013) Isik, M.; Gasanly, N. M.; Turan, R.Spectroscopic ellipsometry measurements on the GaS single crystals are presented in the energy range of 1.2 - 6.2 eV at room temperature. Optical constants; pseudorefractive index, pseudoextinction coefficient, real and imaginary parts of the pseudodielectric function were determined. Analysis of the second derivative of real and imaginary parts of the pseudodielectric constant revealed five transitions with critical point energies of 3.95, 4.22, 4.51, 4.75 and 5.50 eV. These energies were assigned to interband transitions according to theoretical study of GaS band structure available in literature. (C) 2012 Elsevier B.V. All rights reserved.Master Thesis Gas(x)se(1-x) Katmanlı Karışım Kristallerinin Yapısal ve Elipsometrik Özellikleri(2017) Habaibi, Om-alhana; Işık, Mehmet; Özkan, Filiz KorkmazGaSxSe1-x katmanlı karışım kristalleri yapısal ve optiksel karakterizasyon teknikleri kullanılarak incelendi. Bridgman metodu ile büyütülen örneklerin yapısal karakterizasyonu x-ışını kırınımı (XRD), enerji saçılım spektroskopisi (EDS) ve Fourier transform kızılötesi spektroskopisi teknikleri kullanılarak başarıldı. Karışım kristallerinin kompozisyonal bağımlılığı EDS deneyleri ile elde edildi. Ölçümlerin sonuçları, kullanılan örneklerin x değerinin 0.25 aralıklar ile 0 ile 1 arasında olduğu kompozisyona denk geldiğini gösterdi. Örneklerin kristal yapısı XRD ölçümlerinin sonuçlarını ve analiz için bir yazılım programı kullanarak açığa çıkarıldı. FTIR tayfları x=0, 0.25 ve 0.50 kompozisyonlarındaki örneklerin içerisinde çoklu fonon emiliminin var olduğunu gösterdi. XRD ve FTIR deneylerinin sonuçları kullanılan kompozisyonlar arasında ilişkilendirildi. Örneklerin optiksel karakterizasyonu 1.2-6.0 eV spektral aralıpında gerçekleştirilen elipsometri deneyleri ile tamamlandı. Ölçüm sisteminin çıkış datası optiksel parametrelerin spektraş bağımlılığını gösteren dataya çevrildi. Elipsometrik data örneklerin bant boşluğu enerjilerini elde etmek için kullanıldı. Elde edilen bant enerjisi değerleri karışım kristallerinde sülfür kompozisyonu arttıkça bant enerjisinin 2.4 eV'tan (x = 0) 2.57 eV'a (x = 1) arttığını gösterdi. Ortaya çıkarılan bant enerji değerlerine göre bant boşluğu enerjisinin kompozisyona bağlılığını gösteren bir grafik çizildi.Article Citation - WoS: 1Citation - Scopus: 1Optical Parameters of Anisotropic Chain-Structured Tl2ingate4< Crystals by Spectroscopic Ellipsometry(Elsevier Gmbh, 2016) Isik, M.; Gasanly, N. M.Spectroscopic ellipsometry measurements were performed on Tl2InGaTe4 single crystals in the 1.2-6.2 eV range for orientations of electric field, parallel (E//c) and perpendicular (E perpendicular to c) to optic axis c. Spectral dependence of optical parameters; real and imaginary components of the dielectric function, refractive index and extinction coefficient were obtained from the analyses of experimental data using an ambient-substrate optical model. The analysis of the absorption data calculated using the extinction coefficient showed the existence of indirect transitions in the crystal with an energy band gap of similar to 0.72 eV for both orientations. Interband transition (critical point) energies were revealed using second-energy derivative spectra of the dielectric function. The results showed the presence of five each interband transition structures for E//c and E perpendicular to c orientations. (C) 2016 Elsevier GmbH. All rights reserved.Article Citation - WoS: 24Citation - Scopus: 22Spectroscopic Ellipsometry Study of Above-Band Gap Optical Constants of Layered Structured Tlgase2, Tlgas2 and Tlins2 Single Crystals(Elsevier Science Bv, 2012) Isik, M.; Gasanly, N. M.; Turan, R.Spectroscopic ellipsometry measurements on TlGaSe2, TlGaS2 and TlInS2 layered crystals were carried out on the layer-plane (0 0 1) surfaces, which are perpendicular to the optic axis c*, in the 1.2- 6.2 eV spectral range at room temperature. The real and imaginary parts of the pseudodielectric function as well as pseudorefractive index and pseudoextinction coefficient were found as a result of analysis of ellipsometric data. The structures of critical points in the above-band gap energy range have been characterized from the second derivative spectra of the pseudodielectric function. The analysis revealed four, five and three interband transition structures with critical point energies 2.75, 3.13, 3.72 and 4.45 eV (TlGaSe2), 3.03, 3.24, 3.53, 4.20 and 4.83eV (TlGaS2), and 3.50, 3.85 and 4.50 eV (TlInS2). For TlGaSe2 crystals, the determined critical point energies were assigned tentatively to interband transitions using the available electronic energy band structure. (c) 2012 Elsevier B.V. All rights reserved.
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