Start-up demonstration tests under Markov dependence

dc.contributor.author Eryilmaz,S.
dc.contributor.other Industrial Engineering
dc.contributor.other 06. School Of Engineering
dc.contributor.other 01. Atılım University
dc.date.accessioned 2024-10-06T11:14:04Z
dc.date.available 2024-10-06T11:14:04Z
dc.date.issued 2010
dc.description.abstract A start-up demonstration test is a mechanism that can be used to demonstrate the reliability of an equipment to the customer. In this paper, we study CSTF (consecutive successes total failures) and TSTF (total successes total failures) procedures assuming that the individual start-ups follow a first order Markov dependence structure. Explicit (nonrecursive) expressions for the distributions of the test lengths are provided. Maximum likelihood and moments estimators of the expected test length are obtained and some numerical results are presented for an illustration. © 2010 Pakistan Journal of Statistics. en_US
dc.identifier.issn 1012-9367
dc.identifier.scopus 2-s2.0-78650188864
dc.identifier.uri https://hdl.handle.net/20.500.14411/9241
dc.language.iso en en_US
dc.relation.ispartof Pakistan Journal of Statistics en_US
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.subject Markov chain en_US
dc.subject Maximum likelihood estimator en_US
dc.subject Start-up demonstration test en_US
dc.title Start-up demonstration tests under Markov dependence en_US
dc.type Article en_US
dspace.entity.type Publication
gdc.author.institutional Eryılmaz, Serkan
gdc.author.scopusid 8203625300
gdc.coar.access metadata only access
gdc.coar.type text::journal::journal article
gdc.description.department Atılım University en_US
gdc.description.departmenttemp Eryilmaz S., Department of Industrial Engineering, Atilim University, Incek, Ankara, Turkey en_US
gdc.description.endpage 647 en_US
gdc.description.issue 4 en_US
gdc.description.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı en_US
gdc.description.scopusquality Q3
gdc.description.startpage 637 en_US
gdc.description.volume 26 en_US
gdc.scopus.citedcount 11
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